JPH0381645U

JPH0381645U -

Info

Publication number: JPH0381645U
Application number: JP14290689U
Authority: JP
Priority date: 1989-12-11
Filing date: 1989-12-11
Publication date: 1991-08-21

Description

[Brief explanation of the drawing]

第１図はこの考案の一実施例によるハイブリツ
ドＩＣ抵抗トリミング試験装置を示す構成図、第
２図はこの考案のハイブリツドＩＣ抵抗トリミン
グ試験装置における処理シーケンスのフローチヤ
ート、第３図は従来のハイブリツドＩＣ抵抗トリ
ミング試験装置を示す構成図、第４図はハイブリ
ツドＩＣ抵抗トリミング試験装置における処理シ
ーケンスのフローチヤートである。図において、１……ハイブリツドＩＣソケツト
部、２……レーザートリミング装置部、３……信
号発生処理部、４……電源部、５……計算機部、
６……計測器部、７……表示部、８……検知器で
ある。なお、図中、同一あるいは相当部分には同
一符号を付して示してある。 Fig. 1 is a block diagram showing a hybrid IC resistance trimming test device according to an embodiment of the present invention, Fig. 2 is a flowchart of the processing sequence in the hybrid IC resistance trimming test device of this invention, and Fig. 3 is a diagram showing a conventional hybrid IC resistance trimming test device. FIG. 4 is a block diagram showing the resistance trimming test device, and is a flowchart of the processing sequence in the hybrid IC resistance trimming test device. In the figure, 1...hybrid IC socket section, 2...laser trimming device section, 3...signal generation processing section, 4...power supply section, 5...computer section,
6... Measuring device section, 7... Display section, 8... Detector. In the drawings, the same or corresponding parts are designated by the same reference numerals.

Claims

[Scope of utility model registration request]

Different types of circuit elements such as analog circuits and digital circuits are mixed on one substrate, and a hybrid IC socket part for setting a single hybrid IC featuring an ultra-compact structure and resistor trimming using a laser are provided. a laser trimming device section; a signal generation processing section that sets and controls input conditions to the hybrid IC socket section and the laser trimming device section;
Measure the output signals of the C socket section, the power supply section that supplies power to the signal generation processing section, the computer section that stores a predetermined program and controls the signal generation processing section, and the hybrid IC socket section. When performing resistance trimming on a device equipped with a measuring instrument section to perform measurement and a display section to display measurement results, a detector is added to detect the noise since noise during laser output can interfere with measurement. A hybrid IC resistance trimming test device characterized in that when noise is detected for a predetermined period of time, the laser beam of the laser trimming device section is automatically stopped and the output signal is measured.