JPH0381646U

JPH0381646U -

Info

Publication number: JPH0381646U
Application number: JP14290989U
Authority: JP
Priority date: 1989-12-11
Filing date: 1989-12-11
Publication date: 1991-08-21

Description

[Brief explanation of drawings]

第１図は、この考案の一実施例によるハイブリ
ツドＩＣ抵抗トリミング試験装置を示す構成図、
第２図は、この考案のハイブリツドＩＣ抵抗トリ
ミング試験装置における処理シーケンスのフロー
チヤート、第３図は、従来のハイブリツドＩＣ抵
抗トリミング試験装置を示す構成図、第４図は、
ハイブリツドＩＣ抵抗トリミング試験装置におけ
る処理シーケンスのフローチヤートである。図において、１……ハイブリツドＩＣソケツト
部、２……レーザートリミング装置部、３……信
号発生処理部、４……電源部、５……計算機部、
６……計測器部、７……表示部、８……検知器で
ある。なお、図中同一あるいは相当部分には同一
符号を付して示してある。 FIG. 1 is a configuration diagram showing a hybrid IC resistance trimming test device according to an embodiment of the invention;
FIG. 2 is a flowchart of the processing sequence in the hybrid IC resistance trimming test device of this invention, FIG. 3 is a block diagram showing the conventional hybrid IC resistance trimming test device, and FIG.
2 is a flowchart of a processing sequence in a hybrid IC resistance trimming test device. In the figure, 1...hybrid IC socket section, 2...laser trimming device section, 3...signal generation processing section, 4...power supply section, 5...computer section,
6... Measuring device section, 7... Display section, 8... Detector. It should be noted that the same or corresponding parts in the drawings are designated by the same reference numerals.

Claims

[Scope of utility model registration request]

Different types of circuit elements such as analog circuits and digital circuits are mixed on one substrate, and a hybrid IC socket part for setting a single hybrid IC featuring an ultra-compact structure and resistor trimming using a laser are used. a laser trimming device section, a signal generation processing section that sets and controls input conditions to the hybrid IC socket section and the laser trimming device section, and the above IC
A power supply section that supplies power to the socket section and the signal generation processing section, a computer section that stores a predetermined program and controls the signal generation processing section, and measures the output signal of the hybrid IC socket section. In a device equipped with a measuring instrument section and a display section that displays measurement results, when performing resistance trimming, noise during laser output can interfere with measurement, so a detector is added to detect the noise. A hybrid IC resistance trimming test device characterized in that, when the rate of change of spike noise exceeds a specified value, a laser beam of a laser trimming device section is automatically stopped and an output signal is measured.