JPH0381611U - - Google Patents

Info

Publication number
JPH0381611U
JPH0381611U JP14291689U JP14291689U JPH0381611U JP H0381611 U JPH0381611 U JP H0381611U JP 14291689 U JP14291689 U JP 14291689U JP 14291689 U JP14291689 U JP 14291689U JP H0381611 U JPH0381611 U JP H0381611U
Authority
JP
Japan
Prior art keywords
section
hybrid
laser
socket
trimming
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP14291689U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP14291689U priority Critical patent/JPH0381611U/ja
Publication of JPH0381611U publication Critical patent/JPH0381611U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Apparatuses And Processes For Manufacturing Resistors (AREA)

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図はこの考案の一実施例によるハイブリツ
ドIC抵抗トリミング試験装置を示す構成図、第
2図はこの考案のハイブリツドIC抵抗トリミン
グ試験装置における処理シーケンスのフローチヤ
ート、第3図は従来のハイブリツドIC抵抗トリ
ミング試験装置を示す構成図、第4図はハイブリ
ツドIC抵抗トリミング試験装置における処理シ
ーケンスのフローチヤートである。 図において、1……ハイブリツドICソケツト
部、2……レーザートリミング装置部、3……信
号発生処理部、4……電源部、5……計算機部、
6……計測器部、7……表示部、8……検知器で
ある。なお、図中、同一あるいは相当部分には同
一符号を付して示してある。
Fig. 1 is a block diagram showing a hybrid IC resistance trimming test device according to an embodiment of the present invention, Fig. 2 is a flowchart of the processing sequence in the hybrid IC resistance trimming test device of this invention, and Fig. 3 is a diagram showing a conventional hybrid IC resistance trimming test device. FIG. 4 is a block diagram showing the resistance trimming test device, and is a flowchart of the processing sequence in the hybrid IC resistance trimming test device. In the figure, 1...hybrid IC socket section, 2...laser trimming device section, 3...signal generation processing section, 4...power supply section, 5...computer section,
6... Measuring device section, 7... Display section, 8... Detector. In the drawings, the same or corresponding parts are designated by the same reference numerals.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] アナログ回路及びデイジタル回路といつた異な
るタイプの回路素子が一つの基板上にて混成され
、超小型構造を特徴とするハイブリツドIC単体
をセツトするためのハイブリツドICソケツト部
と、レーザーで抵抗トリミングを行うレーザート
リミング装置部と、上記ハイブリツドICソケツ
ト部及びレーザートリミング装置部への入力条件
設定並びに制御を行う信号発生処理部と、上記I
Cソケツト部、信号発生処理部へ電源の供給を行
う電源部と、所定のプログラムを収納し、上記信
号発生処理部の制御を行つている計算機部と、上
記ハイブリツドICソケツト部の出力信号を測定
する計測器部と、測定結果を表示する表示部を備
えた装置において、抵抗トリミングを行う上でレ
ーザー出力時のノイズによつて、測定に支障をき
たすため、そのノイズを感知する検知器を付加す
ることによつて、ノイズの変化量が規定値を超え
た場合、レーザートリミング装置部のレーザー光
を自動的に止めて、出力信号を測定することを特
徴とするハイブリツドIC抵抗トリミング試験装
置。
Different types of circuit elements such as analog circuits and digital circuits are mixed on one substrate, and a hybrid IC socket part for setting a single hybrid IC featuring an ultra-compact structure and resistor trimming using a laser are provided. a laser trimming device section; a signal generation processing section that sets and controls input conditions to the hybrid IC socket section and the laser trimming device section;
Measure the output signals of the C socket section, the power supply section that supplies power to the signal generation processing section, the computer section that stores a predetermined program and controls the signal generation processing section, and the hybrid IC socket section. When performing resistance trimming on a device equipped with a measuring instrument section to perform measurement and a display section to display measurement results, a detector is added to detect the noise since noise during laser output can interfere with measurement. A hybrid IC resistance trimming test device characterized in that when the amount of change in noise exceeds a specified value, the laser beam of the laser trimming device section is automatically stopped and the output signal is measured.
JP14291689U 1989-12-11 1989-12-11 Pending JPH0381611U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP14291689U JPH0381611U (en) 1989-12-11 1989-12-11

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP14291689U JPH0381611U (en) 1989-12-11 1989-12-11

Publications (1)

Publication Number Publication Date
JPH0381611U true JPH0381611U (en) 1991-08-21

Family

ID=31689721

Family Applications (1)

Application Number Title Priority Date Filing Date
JP14291689U Pending JPH0381611U (en) 1989-12-11 1989-12-11

Country Status (1)

Country Link
JP (1) JPH0381611U (en)

Similar Documents

Publication Publication Date Title
JPH0381611U (en)
JPH0381645U (en)
JPH0381646U (en)
JPH042033U (en)
JPS6430459U (en)
JPH0634699Y2 (en) Conductivity meter with automatic cell constant adjustment function
JPH0216292Y2 (en)
JPH01102783U (en)
JPH0136150Y2 (en)
JPH042032U (en)
JPS5848580Y2 (en) Indicator/Recorder
JPS6346816Y2 (en)
JPH025083U (en)
JPS5842940Y2 (en) PH measuring device
JPS6136577U (en) automatic test equipment
US3538438A (en) Transistor beta test and display circuit
JPH088431Y2 (en) Resistance measurement device
JPH01127036U (en)
JPS60131478A (en) Measuring device
JPH034278U (en)
JPH03122376U (en)
JPS6367299U (en)
JPH032847U (en)
JPS6132536A (en) Adjusting process of hybrid integrated circuit
JPH0261717B2 (en)