JPH0212074A - Power source unit for measurement of ic testing device - Google Patents

Abstract

PURPOSE:To measure a peak current consumption value and average current consumption by detecting the current consumption at the timing corresponding to the state of an arbitrary test pattern signal impressed upon each signal input pin of an IC to be measured. CONSTITUTION:Electric power is supplied to an IC 30 to be measured from a power supply/current detection circuit 20 and, at the same time, test pattern signals P1-P4 are generated corresponding to each signal input pin of the IC 30 and impressed upon each signal input pin by means of test signal generating means (14-1)-(14-4). At the circuit 20 provided on the power supply line to the IC 30, the current consumption at the IC 30 is detected corresponding to the states of the signals P1-P4 by measuring the electric current at the circuit 20. Therefore, the current consumption of the IC which fluctuates corresponding to the changes of the signals P1-P4 at the means (14-1)-(14-4) can be detected.

Description

[Detailed Description of the Invention] [Field of Industrial Application] The present invention relates to a measurement power supply device installed in test/measurement equipment such as an IC (integrated circuit, hereinafter the same) test device, and in particular, to The current consumption can be detected at any timing synchronized with the test pattern signal applied to the signal input pin of the present invention.

[Prior Art] When measuring the current consumption of a digital IC, etc., a predetermined DC voltage is supplied to the power input pin of the IC from a measurement power supply installed in a test/measurement device such as an IC test device. The supplied current is detected as the current consumed by the IC. At this time.

There are cases in which current consumption is measured by applying various test pattern signals to predetermined signal input pins of the IC under test to change the internal operation, and cases in which current consumption is measured in an unattended signal state.

Generally, the current consumption of a digital IC is significantly different between an unattended signal state and a state where various test pattern signals and the like are applied. For example, the unattended signal state of the IC under test (
When the current consumption in the state where a test pattern signal etc. is applied (hereinafter referred to as operation mode for convenience) is several μA, the current consumption is from several mA to several tens of mA (hereinafter referred to as operation mode for convenience). It is A. Furthermore, in the operating mode of the IC under test, the current consumption of the IC dynamically changes depending on the type of test pattern signal applied to the signal input pin.

In the measurement power supply device for measuring the current consumption of IC,
It has a current detection circuit for supplying power to the IC under test and detecting its current consumption. In such a measurement power supply device applied to conventional IC test equipment,
The average steady-state current consumption corresponding to the no-signal mode or operation mode of the I7''+ to be measured was detected.

[Problems to be Solved by the Invention] Therefore, in the measurement power supply device applied to the conventional IC test equipment, the measurement power supply device changes dynamically depending on the type of test pattern signal applied to the signal input pin in the operating mode of the IC under test. There was a problem in that the consumed current could not be detected at any timing in the test pattern signal.

This invention has been made in view of the above points, and is capable of detecting the current consumption of an IC under test, which changes dynamically depending on the input test pattern signal, at any timing synchronized with any test pattern signal. The present invention aims to provide a power supply device for measurement that has the following characteristics.

[Means for Solving the Problems] A measurement power supply device according to the present invention is provided with a power supply means for supplying power to an IC under test, and a power supply line for the IC under test, and is configured to control current in the power supply line. The current consumption detection means detects the current consumption in the IC under test by measuring the current consumption, and the test signal generation means generates and applies a test pattern signal corresponding to each signal input pin of the IC under test. The present invention is characterized in that the current consumption detecting means can detect the current consumption depending on the state of the test pattern signal generated by the test signal generating means.

[Operation] When trying to measure the current consumption of an IC under test, the power supply means supplies power to the IC under test, and the test signal generation means generates a test pattern corresponding to each signal input pin of the IC under test. Generate and apply signals. The current consumption detection means provided in the power supply line for the IC under test detects the current consumption in the IC under test by measuring the current in the power supply line according to the state of the test pattern signal generated in the test signal generation means. Detect current.

For example, a predetermined power supply voltage is applied to the IC under test from the power supply means.
At the same time, test pattern signals are applied from the test signal generating means to the signal input pins of the IC. The current consumption detection means is provided in a power supply line for the IC under test, and measures the current in the power supply line to determine the current consumed by the IC under test according to the test pattern signal in the test signal generation means. Detect. Therefore, the IC under test changes in response to changes in the test pattern signal in the test signal generating means.
It becomes possible to detect the current consumption of.

[Example] Hereinafter, an example of a measurement power supply device in an IC testing apparatus according to the present invention will be described in detail with reference to the accompanying drawings.

FIG. 1 is a block diagram showing one embodiment of a measurement power supply device according to the present invention, and only portions directly related to the present invention are shown. This power supply device is roughly divided into a control unit 11, a digital/analog (hereinafter referred to as D/A) converter 12, an analog/digital (hereinafter referred to as A/D) converter 15, a power supply and current detection circuit 20, etc. It has become. Note that as a load of the 'lt source device, an IC or various circuits for measuring current consumption can be connected. The control unit 11 provides the D/A converter 12 with digital data indicating the reference voltage to be applied to the IC under test 30, and processes the digital data indicating the detected current value provided from the A/D converter 15. I do. In addition, the control unit 1
1 sends various control signals and data for creating test pattern signals to the drivers 14-1 to 14-n, and also controls the timing generation circuit 13.

The drivers 14-1 to 14-n generate various test pattern signals P1 to P1 to be applied to the signal input pins of the IC under test 30 based on various control signals and test pattern signal creation data given from the control unit 11. Create and output Pn. Under the control of the control unit 11, the timing generation circuit 13 inputs a timing signal T that becomes active II II I+ at a timing synchronized with any test pattern signal P1 to Pn to the strobe signal input of an operational amplifier (operational amplifier, hereinafter the same) 25. Output against.

In addition, the test pattern signals P1 to Pn are for the completed work to be measured C30.
is a pulse corresponding to each of the plurality of signal input bins,
-An example is shown in Figure 2.

Note that FIG. 2 shows an example when the IC starts up, and the timing indicated by TO indicates the start up point.

Note that the extinction current at time To at the moment when the IC 30 to be measured rises is referred to as peak consumption current.

The D/A converter 12 generates an analog base*voltage Vi based on digital data given from the control unit]1. This reference voltage Vi is current-amplified by the amplifier 16 and then applied to one input (+input) of the operational amplifier 21 in the power supply and current detection circuit 20 .

The power supply and current detection circuit 20 inputs a reference voltage Vi, and outputs a power supply voltage V according to the reference voltage Vi.

is supplied to the IC 30 under test, and the IC 30
A detection voltage Di indicating the current consumption is output to the A/D converter 15. The reference voltage Vi applied to the +input of the operational amplifier 21 is applied to the power input pin of the IC 30 under test via the resistor 22.

One end of a resistor 22 and one input (+ input) of an operational amplifier 25 are connected to the output of the operational amplifier 21, and the other input (-human power) of the operational amplifier 25 and the other input of the operational amplifier 25 are connected to the other end of the resistor 22. One of the human power (+ input) of 24 °C is connected. That is, the operational amplifier 25 detects the voltage drop that occurs across the resistor 22 in response to the power supply current I supplied to the IC 30 under test. The operational amplifier 25 becomes operational in response to the timing signal 'r applied to the strobe signal input.

+, - Detect the voltage drop due to the resistor 22 applied to the human power. The detection voltage Di detected here is given to the A/D converter 15, where it is converted into digital data indicating the current consumption of the IC 30 to be measured. Given. The control unit 11 determines the current consumption of the JC 30 to be measured based on the digital data.

On the other hand, the power supply voltage VO applied to the device to be measured 1c30 is fed back to the operational amplifier 21 via the operational amplifier 24.

Since a feedback loop is thus configured, the power supply voltage Vo is corrected to be the same voltage as the reference voltage Vi.

Next, the operation of each part in the above configuration will be explained using a specific example. For example, in the control unit 11, the IC under test 3
The power supply voltage applied to 0 = 5V, that is, the base $ voltage Vi
= 5V, and the test pattern signals P1 to P4 as shown in FIG. 2 are applied to each predetermined pin of the IC 30 to be measured.

When the current consumption measurement is started, the power supply voltage V o = 5 V is applied from the power supply and current detection circuit 20 to the IC 3 to be measured.
0 and is also applied to the power input pin of driver 1.4-
Test pattern signals P1 to P4 from 1 to 14-4 are 1Ic.
30 signals are applied to each of input bins 1 to 4, respectively. The power supply current I consumed by the TC 30 under test varies depending on the input test pattern (No. 71 P1 to P4. Generally, the consumption current I of a digital IC varies depending on the input test pattern signals P1 to Pn. Corresponds to the sum of high level state waveforms.

For example, when measuring the peak values in the test pattern signals P1 to P4, the timing signal T is applied from the timing generation circuit 13 to the strobe signal input of the operational amplifier 25 in response to the timing TO at the rising edge. The operational amplifier 25 is enabled to operate by the timing signal T applied to the strobe signal input, detects the voltage generated across the resistor 22, and transfers this detected voltage Di to the A/
It is output to the control section 11 via the D converter 15. Similarly, when measuring the current consumption at timing T2 of the test pattern signals P1 to P4, a timing signal T is generated from the timing generation circuit 13 in response to timing T2.
is output to the operational amplifier 25. As described above, the operational amplifier 25 detects the voltage generated across the resistor 22 and outputs the detected voltage D1 to the control section 11 via the A/D converter 1.5.

In this way, it is possible to measure the current consumption corresponding to the test pattern signals P1 to Pn applied to the IC 30 under test, so it is possible to measure both the current consumption peak value and the average current consumption. .

In this embodiment, the timing signal T is outputted from the timing generation circuit 13 to the operational amplifier 25, and the test butter-- generated in the drivers 14-1 to 14-n is outputted to the operational amplifier 25.
Although the current consumption of the IC 30 under test is detected and taken in according to the states of the signal signals P1 to Pn, the present invention is not limited to this embodiment as long as the circuit configuration can realize the purpose of the present invention. For example, the operational amplifier 25 may perform constant detection, and the control unit 11 may be provided with a timing generation function, and the detection voltage Di output from the operational amplifier 25 may be taken in according to the timing.

Furthermore, the power supply and current detection circuit 20 is not limited to this embodiment, and may have any other suitable circuit configuration.

Further, in this embodiment, the detection voltage D by the operational amplifier 25 is
Although i is provided to the control unit 11 via the A/D converter 15 as digital data indicating the current consumption, the detected voltage Di may be directly read as analog data indicating the current consumption.

[Effects of the Invention] As described above, according to the measurement power supply device in the IC testing apparatus according to the present invention, the power supply device consumes power at a timing corresponding to the state of an arbitrary test pattern signal applied to each signal input bin of the IC under test. Since the current can be detected, it is also possible to measure the current consumption peak value, the current consumption corresponding to the state of the test pattern signal, and the average current consumption. It has this excellent effect.

FIG. 1 is a block diagram showing an embodiment of a measurement power supply device included in an IC test device according to the present invention, and FIG. 2 is an example of a test pattern signal applied from the IC test device to an IC under test. This is a timing chart showing the following.

DESCRIPTION OF SYMBOLS 11... Control part, 12... Digital/analog converter, 13... Timing generation circuit, ], 4... Test pattern signal generation driver, ]5... Analog/digital converter, 16. ...Current buffer amplifier, 20
...Power supply and current detection circuit, 21, 24, 25.
...Operational amplifier, 22...Resistance, 3o...Measurement target I
C.

Claims (1)

[Scope of Claims] A power supply means for supplying power to an IC under test; and a power supply means provided in a power supply line for the IC under test, and measuring a current in the power supply line to control the IC under test.
current consumption detection means for detecting current consumption in the IC under test; and test signal generation means for generating and applying a test pattern signal corresponding to each signal input pin of the IC under test, the test signal generation means generating the test pattern signal. A measuring power supply device in which the current consumption detecting means can detect current consumption depending on the state of a test pattern signal.