JPS6341783U

JPS6341783U -

Info

Publication number: JPS6341783U
Application number: JP13689386U
Authority: JP
Priority date: 1986-09-04
Filing date: 1986-09-04
Publication date: 1988-03-18

Description

[Brief explanation of the drawing]

第１図はこの考案の一実施例を示す回路図、第
２図は従来装置の回路図である。図において、１は半導体ウエハ、２はプローブ
ボード、６０は第１の電源回路、６１は第２の電
源回路、９０は測定回路、１００は基準電源回路
、１１０は判定回路、１２０は表示回路である。
なお、図中同一符号は同一、又は相当部分を示す
。 FIG. 1 is a circuit diagram showing an embodiment of this invention, and FIG. 2 is a circuit diagram of a conventional device. In the figure, 1 is a semiconductor wafer, 2 is a probe board, 60 is a first power supply circuit, 61 is a second power supply circuit, 90 is a measurement circuit, 100 is a reference power supply circuit, 110 is a determination circuit, and 120 is a display circuit. be.
Note that the same reference numerals in the figures indicate the same or equivalent parts.

Claims

[Scope of utility model registration request]

A first power supply circuit that directly applies a constant DC voltage to one power supply terminal of the operational amplifier IC via the IC socket;
a second power supply circuit that directly applies a constant DC voltage through the C socket; a reference power supply circuit that biases the input terminal of the IC to a reference voltage directly through the IC socket; and an output of the IC. A measurement circuit that directly measures the output value of the side terminal via the IC socket, a judgment circuit that compares the measurement value of this measurement circuit with a predetermined reference value and makes a judgment, and a judgment result of this judgment circuit. An operational amplifier IC test device equipped with a display circuit.