JPS6176692U - - Google Patents
Info
- Publication number
- JPS6176692U JPS6176692U JP16145484U JP16145484U JPS6176692U JP S6176692 U JPS6176692 U JP S6176692U JP 16145484 U JP16145484 U JP 16145484U JP 16145484 U JP16145484 U JP 16145484U JP S6176692 U JPS6176692 U JP S6176692U
- Authority
- JP
- Japan
- Prior art keywords
- semiconductor device
- socket
- contact
- lid
- leads
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000004065 semiconductor Substances 0.000 claims description 8
- 238000005259 measurement Methods 0.000 claims description 3
- 238000010586 diagram Methods 0.000 description 1
Landscapes
- Connecting Device With Holders (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Description
第１図は本考案の一実施例を示す断面図、第２
図は本考案の一実施例の測定原理を説明するため
の図である。第３図は従来の半導体装置用ソケツ
トの一例を示す断面図である。
１……ソケツト、２……ソケツトの蓋、３……
集積回路、４……半導体装置のリード、５……ソ
ケツトのピン、６……ソケツトのピン、７……半
導体装置内の微小抵抗、８……接触抵抗、９……
接触抵抗、１０……接触抵抗、１１……接触抵抗
、１２，１３……供給用のＩＣソケツトピン、１
４，１５……測定用のＩＣソケツトピン、１６，
１７……電圧計、１８……定電流源。
Fig. 1 is a sectional view showing one embodiment of the present invention;
The figure is a diagram for explaining the measurement principle of an embodiment of the present invention. FIG. 3 is a sectional view showing an example of a conventional socket for a semiconductor device. 1...Socket, 2...Socket lid, 3...
integrated circuit, 4... lead of semiconductor device, 5... pin of socket, 6... pin of socket, 7... minute resistance inside semiconductor device, 8... contact resistance, 9...
Contact resistance, 10... Contact resistance, 11... Contact resistance, 12, 13... IC socket pin for supply, 1
4, 15... IC socket pin for measurement, 16,
17...Voltmeter, 18... Constant current source.
Claims (1)
半導体装置用ソケツトにおいて、該ソケツトの蓋
の部分にも蓋を閉めた時半導体装置のリードに接
触する第１の接触子を設け、基体部に半導体装置
のリードに接触して第２の接触子を設け、第１お
よび第２の接触子の一方を測定用とし、他方を動
作条件設定用としたことを特徴とする半導体装置
用ソケツト。 In a socket for a semiconductor device that is connected to the leads of a semiconductor device with the lid closed, a first contact is provided on the lid portion of the socket to contact the leads of the semiconductor device when the lid is closed, and the semiconductor device is connected to the base portion. 1. A socket for a semiconductor device, characterized in that a second contact is provided in contact with a lead of the device, one of the first and second contacts is used for measurement, and the other is used for setting operating conditions.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP16145484U JPS6176692U (en) | 1984-10-25 | 1984-10-25 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP16145484U JPS6176692U (en) | 1984-10-25 | 1984-10-25 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS6176692U true JPS6176692U (en) | 1986-05-23 |
Family
ID=30719363
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP16145484U Pending JPS6176692U (en) | 1984-10-25 | 1984-10-25 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6176692U (en) |
-
1984
- 1984-10-25 JP JP16145484U patent/JPS6176692U/ja active Pending
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