JPH01152216U - - Google Patents
Info
- Publication number
- JPH01152216U JPH01152216U JP4963988U JP4963988U JPH01152216U JP H01152216 U JPH01152216 U JP H01152216U JP 4963988 U JP4963988 U JP 4963988U JP 4963988 U JP4963988 U JP 4963988U JP H01152216 U JPH01152216 U JP H01152216U
- Authority
- JP
- Japan
- Prior art keywords
- test
- fail
- pass
- central computer
- microcomputer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000010586 diagram Methods 0.000 description 3
- 239000011159 matrix material Substances 0.000 description 1
Landscapes
- Testing Electric Properties And Detecting Electric Faults (AREA)
- Tests Of Electronic Circuits (AREA)
- Testing Or Calibration Of Command Recording Devices (AREA)
Description
第１図はこの考案の自動試験装置を示す構成図
、第２図は従来の自動試験装置を示す構成図、第
３図は従来の試験装置を示す構成図である。
図中、１ａ〜１ｃは被試験物、２ａ〜２ｃは試
験装置、３はセントラルコンピユータ、４ａ〜４
ｃは計測器、５はマトリクススイツチ、６はマイ
クロコンピユータ、７は合否判定器である。なお
、図中、同一あるいは相当部分には同一符号を付
して示してある。
FIG. 1 is a block diagram showing an automatic test device of this invention, FIG. 2 is a block diagram showing a conventional automatic test device, and FIG. 3 is a block diagram showing a conventional test device. In the figure, 1a to 1c are test objects, 2a to 2c are test devices, 3 is a central computer, and 4a to 4
c is a measuring device, 5 is a matrix switch, 6 is a microcomputer, and 7 is a pass/fail judge. In the drawings, the same or corresponding parts are denoted by the same reference numerals.
Claims (1)
ンピユータの端末機器として被試験物の試験をす
る複数個の試験装置と、この試験装置に接続され
る被試験物とを備え、上記セントラルコンピユー
タにより上記試験装置を制御して上記被試験物を
自動的に試験する自動試験装置において、上記各
試験装置にマイクロコンピユータと、合否判定器
とを備え、上記セントラルコンピユータ内の試験
・校正プログラムを上記マイクロコンピユータに
呼びこんでから上記マイクロコンピユータの制御
下で試験を実行し、被試験物の合否を上記合否判
定器で検出し、不合格の場合は、再度、上記試験
装置の校正を実行し、上記被試験物の合否の判定
を行うことを特徴とする自動試験装置。 A central computer, a plurality of test devices that test a test object as a terminal device of the central computer, and a test object connected to the test device, and the test device is controlled by the central computer. In the automatic testing device for automatically testing the above-mentioned test object, each of the above-mentioned test devices is equipped with a microcomputer and a pass/fail judge, and the test/calibration program in the central computer is called into the microcomputer, and then the The test is executed under the control of a microcomputer, and the pass/fail tester detects the pass/fail of the test object. If it fails, the test equipment is calibrated again, and the pass/fail of the test object is determined. An automatic test device characterized by performing the following.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP4963988U JPH01152216U (en) | 1988-04-13 | 1988-04-13 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP4963988U JPH01152216U (en) | 1988-04-13 | 1988-04-13 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH01152216U true JPH01152216U (en) | 1989-10-20 |
Family
ID=31275725
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP4963988U Pending JPH01152216U (en) | 1988-04-13 | 1988-04-13 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH01152216U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH03200085A (en) * | 1989-12-28 | 1991-09-02 | Sharp Corp | Automatic calibrating system for digital measuring instrument |
-
1988
- 1988-04-13 JP JP4963988U patent/JPH01152216U/ja active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH03200085A (en) * | 1989-12-28 | 1991-09-02 | Sharp Corp | Automatic calibrating system for digital measuring instrument |
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