JPS63120176U - - Google Patents

Info

Publication number
JPS63120176U
JPS63120176U JP1128287U JP1128287U JPS63120176U JP S63120176 U JPS63120176 U JP S63120176U JP 1128287 U JP1128287 U JP 1128287U JP 1128287 U JP1128287 U JP 1128287U JP S63120176 U JPS63120176 U JP S63120176U
Authority
JP
Japan
Prior art keywords
test
workpiece
jig
detection sensor
test jig
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1128287U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1128287U priority Critical patent/JPS63120176U/ja
Publication of JPS63120176U publication Critical patent/JPS63120176U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Tests Of Electronic Circuits (AREA)

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本考案に係るインサーキツトテスト装
置の概略構成説明図、第2図は従来のインサーキ
ツトテスト装置の概略構成説明図である。 20…テスト治具、22…テストプローブ、2
4…ワーク検出センサ、28…制御部、30…テ
ストプログラム、32…インサーキツトテスト装
置。
FIG. 1 is a diagram schematically illustrating the configuration of an in-circuit test device according to the present invention, and FIG. 2 is a diagram schematically illustrating the configuration of a conventional in-circuit test device. 20...Test jig, 22...Test probe, 2
4... Workpiece detection sensor, 28... Control unit, 30... Test program, 32... In-circuit test device.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 複数のテストプローブと該テストプローブ毎に
設けられたワーク検出センサとを備えたテスト治
具と、複数のテストプログラムを備えた制御部と
を含み、前記テスト治具からのワーク判別信号に
基づきワークに応じたテストプログラムを選択し
自動的にテストプログラムを実行することを特徴
とするインサーキツトテスト装置。
The test jig includes a plurality of test probes and a workpiece detection sensor provided for each test probe, and a control section having a plurality of test programs, and the test jig detects a workpiece based on a workpiece discrimination signal from the test jig. An in-circuit test device is characterized in that it selects a test program according to the situation and automatically executes the test program.
JP1128287U 1987-01-27 1987-01-27 Pending JPS63120176U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1128287U JPS63120176U (en) 1987-01-27 1987-01-27

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1128287U JPS63120176U (en) 1987-01-27 1987-01-27

Publications (1)

Publication Number Publication Date
JPS63120176U true JPS63120176U (en) 1988-08-03

Family

ID=30798354

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1128287U Pending JPS63120176U (en) 1987-01-27 1987-01-27

Country Status (1)

Country Link
JP (1) JPS63120176U (en)

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