JPS63168870U - - Google Patents
Info
- Publication number
- JPS63168870U JPS63168870U JP6232287U JP6232287U JPS63168870U JP S63168870 U JPS63168870 U JP S63168870U JP 6232287 U JP6232287 U JP 6232287U JP 6232287 U JP6232287 U JP 6232287U JP S63168870 U JPS63168870 U JP S63168870U
- Authority
- JP
- Japan
- Prior art keywords
- test
- workpiece
- control unit
- detection sensor
- movable plate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000000523 sample Substances 0.000 claims description 5
- 238000001514 detection method Methods 0.000 claims description 3
- 238000010586 diagram Methods 0.000 description 2
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Tests Of Electronic Circuits (AREA)
Description
第１図は本考案に係るインサーキツトテスト装
置の正面図、第２図はワークホルダの平面図、第
３図はその―線に沿う断面図、第４図は本考
案の構成を示すブロツク図、第５図は従来のイン
サーキツトテスト装置の概略構成ブロツク図であ
る。
１０……テストプローブ、１２……起動スイツ
チ、１４……ワークホルダ、１６……テストプロ
グラム、１８……制御部、２０……装置本体、２
２……可動板、２４……プローブピン、２６……
シリンダ、３６……ワーク検出センサ。
Fig. 1 is a front view of the in-circuit test device according to the present invention, Fig. 2 is a plan view of the work holder, Fig. 3 is a sectional view taken along the - line, and Fig. 4 is a block diagram showing the configuration of the present invention. , FIG. 5 is a schematic block diagram of a conventional in-circuit test device. 10...Test probe, 12...Start switch, 14...Work holder, 16...Test program, 18...Control unit, 20...Device main body, 2
2...Movable plate, 24...Probe pin, 26...
Cylinder, 36...Work detection sensor.
Claims (1)
トプローブと、前記テストプローブに対応して設
けられワーク検出センサを備えたワークホルダと
、テストスタートにより前記可動板を移動させて
テストプローブをワークに接触させる駆動手段と
、ワークの種類に応じて複数の異なるテストプロ
グラムを備えた制御部とを含み、前記制御部はワ
ーク検出センサからのワーク判別信号に基づきワ
ークの種類に応じたテストプログラムを自動的に
選択し、該テストプログラム内容に従つたテスト
を実行することを特徴とするインサーキツトテス
ト装置。 A plurality of test probes are attached to a movable plate of the apparatus main body, a work holder provided corresponding to the test probes and equipped with a workpiece detection sensor, and when the test is started, the movable plate is moved to bring the test probe into contact with the workpiece. and a control unit having a plurality of different test programs according to the type of workpiece, and the control unit automatically executes a test program according to the type of workpiece based on a workpiece discrimination signal from a workpiece detection sensor. An in-circuit test device characterized in that the in-circuit test device selects a test program and executes a test according to the content of the test program.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP6232287U JPS63168870U (en) | 1987-04-23 | 1987-04-23 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP6232287U JPS63168870U (en) | 1987-04-23 | 1987-04-23 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS63168870U true JPS63168870U (en) | 1988-11-02 |
Family
ID=30896484
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP6232287U Pending JPS63168870U (en) | 1987-04-23 | 1987-04-23 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS63168870U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2009210311A (en) * | 2008-03-03 | 2009-09-17 | Yokogawa Electric Corp | Performance board discrimination device |
-
1987
- 1987-04-23 JP JP6232287U patent/JPS63168870U/ja active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2009210311A (en) * | 2008-03-03 | 2009-09-17 | Yokogawa Electric Corp | Performance board discrimination device |