JPS6453979U - - Google Patents

Info

Publication number
JPS6453979U
JPS6453979U JP14910587U JP14910587U JPS6453979U JP S6453979 U JPS6453979 U JP S6453979U JP 14910587 U JP14910587 U JP 14910587U JP 14910587 U JP14910587 U JP 14910587U JP S6453979 U JPS6453979 U JP S6453979U
Authority
JP
Japan
Prior art keywords
semiconductor devices
sorting machine
electrical characteristics
measurement
sorting
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP14910587U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP14910587U priority Critical patent/JPS6453979U/ja
Publication of JPS6453979U publication Critical patent/JPS6453979U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本考案の一実施例を示す構成図、第2
図は従来の選別機を示す構成図である。 1…テスタ、2…選別プログラム部、3…選別
部、4…特性区分部、6…チエツクプログラム部
Fig. 1 is a configuration diagram showing one embodiment of the present invention;
The figure is a configuration diagram showing a conventional sorting machine. DESCRIPTION OF SYMBOLS 1...Tester, 2...Selection program section, 3...Selection section, 4...Characteristic classification section, 6...Check program section.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 半導体装置等の電気的特性を良否選別及び良品
特性区分する自動選別機において、良否選別、特
性区分後の特性について再測定を行う手段と、再
測定の結果をフイードバツクして測定状態の異常
を検知する手段とを有することを特徴とする自己
診断選別機。
In an automatic sorting machine that separates the electrical characteristics of semiconductor devices, etc. into pass/fail and categorizes the characteristics of non-defective products, there is a means for re-measuring the characteristics after sorting the electrical characteristics of semiconductor devices, etc., and detecting abnormalities in the measurement status by feeding back the results of the re-measurement. A self-diagnosis sorting machine characterized by having means for.
JP14910587U 1987-09-29 1987-09-29 Pending JPS6453979U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP14910587U JPS6453979U (en) 1987-09-29 1987-09-29

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP14910587U JPS6453979U (en) 1987-09-29 1987-09-29

Publications (1)

Publication Number Publication Date
JPS6453979U true JPS6453979U (en) 1989-04-03

Family

ID=31421032

Family Applications (1)

Application Number Title Priority Date Filing Date
JP14910587U Pending JPS6453979U (en) 1987-09-29 1987-09-29

Country Status (1)

Country Link
JP (1) JPS6453979U (en)

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