JPH0321852U - - Google Patents
Info
- Publication number
- JPH0321852U JPH0321852U JP8330089U JP8330089U JPH0321852U JP H0321852 U JPH0321852 U JP H0321852U JP 8330089 U JP8330089 U JP 8330089U JP 8330089 U JP8330089 U JP 8330089U JP H0321852 U JPH0321852 U JP H0321852U
- Authority
- JP
- Japan
- Prior art keywords
- semiconductor device
- electrical characteristic
- testing
- pass
- main surface
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000004065 semiconductor Substances 0.000 claims description 7
- 238000012216 screening Methods 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 239000003550 marker Substances 0.000 description 1
Landscapes
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Description
第１図はこの考案の一実施例を示す半導体装置
の上面図、第２図は従来の半導体装置を示す上面
図、第３図は複合機能を有する半導体装置の検査
装置の概略構成図である。
図において、１……半導体装置、２……半導体
装置の機能領域、８……電気的特性分類表示用の
マーカパツドである。なお、各図中の同一符号は
同一または相当部分を示す。
FIG. 1 is a top view of a semiconductor device showing an embodiment of this invention, FIG. 2 is a top view of a conventional semiconductor device, and FIG. 3 is a schematic configuration diagram of an inspection device for a semiconductor device having multiple functions. . In the figure, 1...semiconductor device, 2... functional area of the semiconductor device, and 8... marker pad for displaying electrical characteristic classification. Note that the same reference numerals in each figure indicate the same or corresponding parts.
Claims (1)
る半導体装置において、前記半導体装置の主面上
に電気的特性分類表示用のカーカパツドを形成し
たことを特徴とする半導体装置。 1. A semiconductor device for which pass/fail screening is performed by wafer auto-testing, characterized in that a car cap for displaying electrical characteristic classification is formed on a main surface of the semiconductor device.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8330089U JPH0321852U (en) | 1989-07-14 | 1989-07-14 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8330089U JPH0321852U (en) | 1989-07-14 | 1989-07-14 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH0321852U true JPH0321852U (en) | 1991-03-05 |
Family
ID=31630849
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP8330089U Pending JPH0321852U (en) | 1989-07-14 | 1989-07-14 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0321852U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2009060997A (en) * | 2007-09-05 | 2009-03-26 | Hakubun:Kk | Housing case |
-
1989
- 1989-07-14 JP JP8330089U patent/JPH0321852U/ja active Pending
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2009060997A (en) * | 2007-09-05 | 2009-03-26 | Hakubun:Kk | Housing case |
| JP4613195B2 (en) * | 2007-09-05 | 2011-01-12 | 株式会社はくぶん | Storage case |