JPH0342576U - - Google Patents

Info

Publication number
JPH0342576U
JPH0342576U JP10407389U JP10407389U JPH0342576U JP H0342576 U JPH0342576 U JP H0342576U JP 10407389 U JP10407389 U JP 10407389U JP 10407389 U JP10407389 U JP 10407389U JP H0342576 U JPH0342576 U JP H0342576U
Authority
JP
Japan
Prior art keywords
semiconductor device
plug
testing
test circuit
semiconductor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP10407389U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP10407389U priority Critical patent/JPH0342576U/ja
Publication of JPH0342576U publication Critical patent/JPH0342576U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Description

【図面の簡単な説明】[Brief explanation of drawings]

第1図はこの考案による改良された回路図、第
2図はその要部斜視図、第3図は従来装置の回路
図、第4図はその部分斜視図である。 図中、1はテスタ、20はプラグイン、30は
テスト回路、4は専用回路、5は信号処理回路、
6はデバイスである。なお、各図中同一符号は同
一又は相当部分を示す。
FIG. 1 is a circuit diagram of an improved circuit according to this invention, FIG. 2 is a perspective view of a main part thereof, FIG. 3 is a circuit diagram of a conventional device, and FIG. 4 is a partial perspective view thereof. In the figure, 1 is a tester, 20 is a plug-in, 30 is a test circuit, 4 is a dedicated circuit, 5 is a signal processing circuit,
6 is a device. Note that the same reference numerals in each figure indicate the same or equivalent parts.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 半導体装置のテスタと、上記半導体装置をテス
トするテスト回路とのインターフエイスとなるプ
ラグインを備えた半導体装置のテスト装置におい
て、上記プラグインには、上記テスト回路のうち
汎用部分を配置したことを特徴とする半導体装置
のテスト装置。
In a semiconductor device testing device equipped with a plug-in that serves as an interface between a semiconductor device tester and a test circuit for testing the semiconductor device, the plug-in is provided with a general-purpose part of the test circuit. Characteristic test equipment for semiconductor devices.
JP10407389U 1989-09-04 1989-09-04 Pending JPH0342576U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10407389U JPH0342576U (en) 1989-09-04 1989-09-04

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10407389U JPH0342576U (en) 1989-09-04 1989-09-04

Publications (1)

Publication Number Publication Date
JPH0342576U true JPH0342576U (en) 1991-04-22

Family

ID=31652881

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10407389U Pending JPH0342576U (en) 1989-09-04 1989-09-04

Country Status (1)

Country Link
JP (1) JPH0342576U (en)

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