JPS6161474U - - Google Patents

Info

Publication number
JPS6161474U
JPS6161474U JP14576984U JP14576984U JPS6161474U JP S6161474 U JPS6161474 U JP S6161474U JP 14576984 U JP14576984 U JP 14576984U JP 14576984 U JP14576984 U JP 14576984U JP S6161474 U JPS6161474 U JP S6161474U
Authority
JP
Japan
Prior art keywords
stylus
circuit board
inspected
absence
correspond
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP14576984U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP14576984U priority Critical patent/JPS6161474U/ja
Publication of JPS6161474U publication Critical patent/JPS6161474U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Measuring Leads Or Probes (AREA)
  • Tests Of Electronic Circuits (AREA)

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本考案による装置の一実施例を示す回
路図、第2図は部品脱落検査の必要性を説明する
ための図、及び第3図は従来装置例を示す回路図
である。 11…基板、11a〜11c…チツプ部品、1
2a…支持板、12b〜12e…触針、S〜S
…セレクタスイツチ、12i…制御器。
FIG. 1 is a circuit diagram showing an embodiment of the device according to the present invention, FIG. 2 is a diagram for explaining the necessity of component dropout inspection, and FIG. 3 is a circuit diagram showing an example of a conventional device. 11... Board, 11a-11c... Chip parts, 1
2a...Support plate, 12b-12e...Stylus, S1 - S
3 ...Selector switch, 12i...Controller.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 被検査回路基板ユニツトの基板に取付けられた
脱落の有無を検査すべきチツプ部品に対応して設
けられた脱落検査用触針と、前記基板に取付けら
れた電気特性を検査すべきチツプ部品に対応して
設けられた電気特性検査用触針とを同一の支持部
材上に備えると共に、前記触針の各々に対応して
セレクタスイツチを設け、該セレクタスイツチを
時分割的に作動して該セレクタスイツチに対応す
る触針によるチツプ部品の有無及び電気特性を時
分割的に判定するようにしたことを特徴とする回
路基板検査装置。
A drop-off inspection stylus is installed to correspond to the chip parts attached to the board of the circuit board unit to be inspected for the presence or absence of detachment, and a probe is provided to correspond to the chip parts attached to the board to be inspected for electrical characteristics. stylus for electrical property testing provided on the same support member, and a selector switch is provided corresponding to each of the stylus, and the selector switch is operated in a time-division manner. 1. A circuit board inspection device characterized in that the presence or absence of a chip component and its electrical characteristics are determined in a time-sharing manner using a stylus corresponding to the circuit board.
JP14576984U 1984-09-28 1984-09-28 Pending JPS6161474U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP14576984U JPS6161474U (en) 1984-09-28 1984-09-28

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP14576984U JPS6161474U (en) 1984-09-28 1984-09-28

Publications (1)

Publication Number Publication Date
JPS6161474U true JPS6161474U (en) 1986-04-25

Family

ID=30704025

Family Applications (1)

Application Number Title Priority Date Filing Date
JP14576984U Pending JPS6161474U (en) 1984-09-28 1984-09-28

Country Status (1)

Country Link
JP (1) JPS6161474U (en)

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