JPH0358102B2 - - Google Patents
Info
- Publication number
- JPH0358102B2 JPH0358102B2 JP56205877A JP20587781A JPH0358102B2 JP H0358102 B2 JPH0358102 B2 JP H0358102B2 JP 56205877 A JP56205877 A JP 56205877A JP 20587781 A JP20587781 A JP 20587781A JP H0358102 B2 JPH0358102 B2 JP H0358102B2
- Authority
- JP
- Japan
- Prior art keywords
- copolymer
- general formula
- resist
- mixture
- formula
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/039—Macromolecular compounds which are photodegradable, e.g. positive electron resists
Landscapes
- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- General Physics & Mathematics (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Photosensitive Polymer And Photoresist Processing (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
Priority Applications (6)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP56205877A JPS58106536A (ja) | 1981-12-19 | 1981-12-19 | レジスト材料およびそれを用いる微細レジストパタ−ンの形成方法 |
EP82111725A EP0090089B1 (en) | 1981-12-19 | 1982-12-17 | Resist material and process for forming fine resist pattern |
DE8282111725T DE3279090D1 (en) | 1981-12-19 | 1982-12-17 | Resist material and process for forming fine resist pattern |
CA000418004A CA1207099A (en) | 1981-12-19 | 1982-12-17 | Resist material and process for forming fine resist pattern |
US06/450,726 US4539250A (en) | 1981-12-19 | 1982-12-17 | Resist material and process for forming fine resist pattern |
US06/710,190 US4686168A (en) | 1981-12-19 | 1985-03-11 | Fluoroalkyl acrylate resist material and process for forming fine resist pattern |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP56205877A JPS58106536A (ja) | 1981-12-19 | 1981-12-19 | レジスト材料およびそれを用いる微細レジストパタ−ンの形成方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS58106536A JPS58106536A (ja) | 1983-06-24 |
JPH0358102B2 true JPH0358102B2 (enrdf_load_stackoverflow) | 1991-09-04 |
Family
ID=16514204
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP56205877A Granted JPS58106536A (ja) | 1981-12-19 | 1981-12-19 | レジスト材料およびそれを用いる微細レジストパタ−ンの形成方法 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS58106536A (enrdf_load_stackoverflow) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH05114673A (ja) * | 1991-10-23 | 1993-05-07 | Nikko Kyodo Co Ltd | Tab用テ−プキヤリア製造裏止め剤 |
WO2017057253A1 (ja) * | 2015-09-30 | 2017-04-06 | 富士フイルム株式会社 | 処理液及びパターン形成方法 |
CN108139691A (zh) * | 2015-09-30 | 2018-06-08 | 富士胶片株式会社 | 处理液及图案形成方法 |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5558243A (en) * | 1978-10-24 | 1980-04-30 | Nippon Telegr & Teleph Corp <Ntt> | Highly sensitive positive resist composition |
JPS5619044A (en) * | 1979-06-29 | 1981-02-23 | Nec Corp | Positive type resist |
JPS57173833A (en) * | 1981-04-21 | 1982-10-26 | Toshiba Corp | Formation of radiation resist image |
JPS5821739A (ja) * | 1981-07-31 | 1983-02-08 | Toshiba Corp | フオトマスクの製造方法 |
JPS5859442A (ja) * | 1981-10-06 | 1983-04-08 | Toshiba Corp | ポジ型放射線感応レジスト材料 |
-
1981
- 1981-12-19 JP JP56205877A patent/JPS58106536A/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS58106536A (ja) | 1983-06-24 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
EP0090089B1 (en) | Resist material and process for forming fine resist pattern | |
JP2824350B2 (ja) | デバイスの製造方法 | |
JP3748596B2 (ja) | レジスト材料及びレジストパターンの形成方法 | |
JP2001072716A (ja) | 有機金属重合体およびその使用 | |
EP0064222B1 (en) | Process for forming resist patterns | |
WO2019150966A1 (ja) | レジスト組成物およびレジスト膜 | |
US7374859B2 (en) | Protective layers compatible with thick film pastes | |
JP3980201B2 (ja) | レジスト組成物およびそれを用いたレジストパターン形成方法 | |
JPH0358104B2 (enrdf_load_stackoverflow) | ||
US4476217A (en) | Sensitive positive electron beam resists | |
US4279984A (en) | Positive resist for high energy radiation | |
KR100198408B1 (ko) | 레지스트 물질 및 그의 사용방법 | |
JPH0358103B2 (enrdf_load_stackoverflow) | ||
JPH0358102B2 (enrdf_load_stackoverflow) | ||
EP0119017B1 (en) | Electron-beam and x-ray sensitive polymers and resists | |
EP0064864B1 (en) | Method of making sensitive positive electron beam resists | |
US4415653A (en) | Method of making sensitive positive electron beam resists | |
US4414313A (en) | Sensitive positive electron beam resists | |
JPS62240953A (ja) | レジスト | |
JPH087443B2 (ja) | 高解像度ポジ型放射線感応性レジスト | |
US4243742A (en) | Radiation-sensitive positively acting materials | |
JPS6411936B2 (enrdf_load_stackoverflow) | ||
JPH087441B2 (ja) | ポジ型高感度放射線感応性レジスト | |
JPH0381143B2 (enrdf_load_stackoverflow) | ||
JPH0721055B2 (ja) | 二酸化硫黄と核置換スチレン誘導体との共重合体 |