JPH0358058B2 - - Google Patents

Info

Publication number
JPH0358058B2
JPH0358058B2 JP56023286A JP2328681A JPH0358058B2 JP H0358058 B2 JPH0358058 B2 JP H0358058B2 JP 56023286 A JP56023286 A JP 56023286A JP 2328681 A JP2328681 A JP 2328681A JP H0358058 B2 JPH0358058 B2 JP H0358058B2
Authority
JP
Japan
Prior art keywords
angle
plane
crystal
rays
axis
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP56023286A
Other languages
English (en)
Japanese (ja)
Other versions
JPS57136150A (en
Inventor
Tetsuo Kikuchi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Rigaku Denki Co Ltd
Original Assignee
Rigaku Denki Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Rigaku Denki Co Ltd filed Critical Rigaku Denki Co Ltd
Priority to JP2328681A priority Critical patent/JPS57136150A/ja
Publication of JPS57136150A publication Critical patent/JPS57136150A/ja
Publication of JPH0358058B2 publication Critical patent/JPH0358058B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions

Landscapes

  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP2328681A 1981-02-18 1981-02-18 Method for measuring deviation angle of cut plane of single crystal Granted JPS57136150A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2328681A JPS57136150A (en) 1981-02-18 1981-02-18 Method for measuring deviation angle of cut plane of single crystal

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2328681A JPS57136150A (en) 1981-02-18 1981-02-18 Method for measuring deviation angle of cut plane of single crystal

Publications (2)

Publication Number Publication Date
JPS57136150A JPS57136150A (en) 1982-08-23
JPH0358058B2 true JPH0358058B2 (enrdf_load_stackoverflow) 1991-09-04

Family

ID=12106356

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2328681A Granted JPS57136150A (en) 1981-02-18 1981-02-18 Method for measuring deviation angle of cut plane of single crystal

Country Status (1)

Country Link
JP (1) JPS57136150A (enrdf_load_stackoverflow)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3904543B2 (ja) * 2003-10-14 2007-04-11 株式会社リガク Ｘ線結晶方位測定装置及びｘ線結晶方位測定方法
US7285168B2 (en) 2004-08-10 2007-10-23 Efg Elektrotechnische Fabrikations-Und Grosshandelsgesellschaft Mnb Method and apparatus for the measurement, orientation and fixation of at least one single crystal
CN105092583A (zh) * 2015-08-13 2015-11-25 中国振华集团永光电子有限公司（国营第八七三厂） 一种使用普通光源的硅单晶晶向偏离测试装置

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
ELECTRONICS *

Also Published As

Publication number Publication date
JPS57136150A (en) 1982-08-23

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