JPH0338833Y2 - - Google Patents

Info

Publication number
JPH0338833Y2
JPH0338833Y2 JP1985186812U JP18681285U JPH0338833Y2 JP H0338833 Y2 JPH0338833 Y2 JP H0338833Y2 JP 1985186812 U JP1985186812 U JP 1985186812U JP 18681285 U JP18681285 U JP 18681285U JP H0338833 Y2 JPH0338833 Y2 JP H0338833Y2
Authority
JP
Japan
Prior art keywords
card
jig
probe card
fixing
clamper
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP1985186812U
Other languages
English (en)
Japanese (ja)
Other versions
JPS6294635U (US20020051482A1-20020502-M00057.png
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1985186812U priority Critical patent/JPH0338833Y2/ja
Publication of JPS6294635U publication Critical patent/JPS6294635U/ja
Application granted granted Critical
Publication of JPH0338833Y2 publication Critical patent/JPH0338833Y2/ja
Expired legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP1985186812U 1985-12-04 1985-12-04 Expired JPH0338833Y2 (US20020051482A1-20020502-M00057.png)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1985186812U JPH0338833Y2 (US20020051482A1-20020502-M00057.png) 1985-12-04 1985-12-04

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1985186812U JPH0338833Y2 (US20020051482A1-20020502-M00057.png) 1985-12-04 1985-12-04

Publications (2)

Publication Number Publication Date
JPS6294635U JPS6294635U (US20020051482A1-20020502-M00057.png) 1987-06-17
JPH0338833Y2 true JPH0338833Y2 (US20020051482A1-20020502-M00057.png) 1991-08-15

Family

ID=31136710

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1985186812U Expired JPH0338833Y2 (US20020051482A1-20020502-M00057.png) 1985-12-04 1985-12-04

Country Status (1)

Country Link
JP (1) JPH0338833Y2 (US20020051482A1-20020502-M00057.png)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102006054735A1 (de) * 2005-12-05 2007-06-06 Feinmetall Gmbh Elektrische Kontakteinrichtung und elektrische Prüfvorrichtung für die Prüfung eines elektrischen Prüflings
JP4842640B2 (ja) * 2005-12-28 2011-12-21 日本発條株式会社 プローブカードおよび検査方法
EP2128630A4 (en) * 2007-03-14 2014-05-14 Nhk Spring Co Ltd PROBE CARD

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS55125639A (en) * 1979-03-23 1980-09-27 Hitachi Ltd Inspection apparatus
JPS601840A (ja) * 1983-06-20 1985-01-08 Nec Corp プロ−ブカ−ドの固定装置
JPS60206149A (ja) * 1984-03-30 1985-10-17 Toshiba Corp ウエハの試験装置

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4849958U (US20020051482A1-20020502-M00057.png) * 1971-10-14 1973-06-30
JPS60143372U (ja) * 1984-03-06 1985-09-24 株式会社東芝 半導体素子の電気特性測定装置

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS55125639A (en) * 1979-03-23 1980-09-27 Hitachi Ltd Inspection apparatus
JPS601840A (ja) * 1983-06-20 1985-01-08 Nec Corp プロ−ブカ−ドの固定装置
JPS60206149A (ja) * 1984-03-30 1985-10-17 Toshiba Corp ウエハの試験装置

Also Published As

Publication number Publication date
JPS6294635U (US20020051482A1-20020502-M00057.png) 1987-06-17

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