JPH0333064Y2 - - Google Patents
Info
- Publication number
- JPH0333064Y2 JPH0333064Y2 JP1986144604U JP14460486U JPH0333064Y2 JP H0333064 Y2 JPH0333064 Y2 JP H0333064Y2 JP 1986144604 U JP1986144604 U JP 1986144604U JP 14460486 U JP14460486 U JP 14460486U JP H0333064 Y2 JPH0333064 Y2 JP H0333064Y2
- Authority
- JP
- Japan
- Prior art keywords
- lead
- external leads
- external
- electrodes
- semiconductor device
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Landscapes
- Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Lead Frames For Integrated Circuits (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1986144604U JPH0333064Y2 (en, 2012) | 1986-09-20 | 1986-09-20 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1986144604U JPH0333064Y2 (en, 2012) | 1986-09-20 | 1986-09-20 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS6351444U JPS6351444U (en, 2012) | 1988-04-07 |
JPH0333064Y2 true JPH0333064Y2 (en, 2012) | 1991-07-12 |
Family
ID=31055360
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1986144604U Expired JPH0333064Y2 (en, 2012) | 1986-09-20 | 1986-09-20 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0333064Y2 (en, 2012) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP5439704B2 (ja) * | 2006-12-18 | 2014-03-12 | Jfeスチール株式会社 | 鋼帯形状検出装置 |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS55163869A (en) * | 1979-06-08 | 1980-12-20 | Mitoshi Ishii | Detection of bent of aligning direction of ic tie bar residue and lead wire |
JPS562276U (en, 2012) * | 1979-06-19 | 1981-01-10 |
-
1986
- 1986-09-20 JP JP1986144604U patent/JPH0333064Y2/ja not_active Expired
Also Published As
Publication number | Publication date |
---|---|
JPS6351444U (en, 2012) | 1988-04-07 |
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