JPH0330812B2 - - Google Patents

Info

Publication number
JPH0330812B2
JPH0330812B2 JP57019236A JP1923682A JPH0330812B2 JP H0330812 B2 JPH0330812 B2 JP H0330812B2 JP 57019236 A JP57019236 A JP 57019236A JP 1923682 A JP1923682 A JP 1923682A JP H0330812 B2 JPH0330812 B2 JP H0330812B2
Authority
JP
Japan
Prior art keywords
chip
printed circuit
circuit board
shadow
axis direction
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP57019236A
Other languages
English (en)
Japanese (ja)
Other versions
JPS58135941A (ja
Inventor
Norihisa Eguchi
Tatsuo Takeda
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP57019236A priority Critical patent/JPS58135941A/ja
Publication of JPS58135941A publication Critical patent/JPS58135941A/ja
Publication of JPH0330812B2 publication Critical patent/JPH0330812B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/956—Inspecting patterns on the surface of objects

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Supply And Installment Of Electrical Components (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Closed-Circuit Television Systems (AREA)
JP57019236A 1982-02-08 1982-02-08 チツプ部品の装着検査装置 Granted JPS58135941A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57019236A JPS58135941A (ja) 1982-02-08 1982-02-08 チツプ部品の装着検査装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57019236A JPS58135941A (ja) 1982-02-08 1982-02-08 チツプ部品の装着検査装置

Publications (2)

Publication Number Publication Date
JPS58135941A JPS58135941A (ja) 1983-08-12
JPH0330812B2 true JPH0330812B2 (enrdf_load_stackoverflow) 1991-05-01

Family

ID=11993748

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57019236A Granted JPS58135941A (ja) 1982-02-08 1982-02-08 チツプ部品の装着検査装置

Country Status (1)

Country Link
JP (1) JPS58135941A (enrdf_load_stackoverflow)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010175558A (ja) * 2010-04-01 2010-08-12 Daiichi Jitsugyo Viswill Co Ltd 検査装置

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6041300A (ja) * 1983-08-16 1985-03-04 富士通テン株式会社 チップ部品の実装状況確認方法
JPS60231400A (ja) * 1984-04-28 1985-11-16 日本ビクター株式会社 検査装置
JPH0656919B2 (ja) * 1984-12-03 1994-07-27 松下電器産業株式会社 電子部品実装機の検出装置
JPS6281800A (ja) * 1985-10-07 1987-04-15 東京エレクトロン株式会社 電子部品の取り付け状態検査方式
JPH07119705B2 (ja) * 1986-04-11 1995-12-20 東京エレクトロン 株式会社 電子部品の検査装置
JPS6393489A (ja) * 1986-10-08 1988-04-23 Nec Corp 位置検出方式
JP2605191B2 (ja) * 1991-09-13 1997-04-30 東京エレクトロン株式会社 電子部品の取付け状態検査方法

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5530659A (en) * 1978-08-25 1980-03-04 Mitsubishi Electric Corp Parts inspecting device for print substrate

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010175558A (ja) * 2010-04-01 2010-08-12 Daiichi Jitsugyo Viswill Co Ltd 検査装置

Also Published As

Publication number Publication date
JPS58135941A (ja) 1983-08-12

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