JPS5530659A - Parts inspecting device for print substrate - Google Patents

Parts inspecting device for print substrate

Info

Publication number
JPS5530659A
JPS5530659A JP10400078A JP10400078A JPS5530659A JP S5530659 A JPS5530659 A JP S5530659A JP 10400078 A JP10400078 A JP 10400078A JP 10400078 A JP10400078 A JP 10400078A JP S5530659 A JPS5530659 A JP S5530659A
Authority
JP
Japan
Prior art keywords
parts
substrate
slit
binary
circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP10400078A
Other languages
Japanese (ja)
Other versions
JPS6117310B2 (en
Inventor
Takeshi Inoue
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP10400078A priority Critical patent/JPS5530659A/en
Publication of JPS5530659A publication Critical patent/JPS5530659A/en
Publication of JPS6117310B2 publication Critical patent/JPS6117310B2/ja
Granted legal-status Critical Current

Links

Abstract

PURPOSE: To make it possible to accomplish the automatic inspections with the use of a simple construction by forming a slit pattern light on a print substrate to make the pattern detecting signals binary so that the existence of the parts may be judged.
CONSTITUTION: By the slit light from a slit light projector 6, a slit pattern 6 is formed on a substrate 1, and the reflected lights from the slit patterns according to the existence of the circuit parts 2a of the substrate 1 are received by a photoelectric converting element 8 having a number of subelements. These receives signals are converted into binary signals by a binary circuit 9, which is preset with a threshold value. A parts existence detecting circuit 10 judges that there are the parts 2a, when the number of low level bits is large in the binary signals, so that it memorizes the judged results in its memory. Then, an XY table 5 is controlled through a print substrate analyzing circuit 11 for memorizing the parts positions in the substrate so that similar judgements are repeated.
COPYRIGHT: (C)1980,JPO&Japio
JP10400078A 1978-08-25 1978-08-25 Parts inspecting device for print substrate Granted JPS5530659A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10400078A JPS5530659A (en) 1978-08-25 1978-08-25 Parts inspecting device for print substrate

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10400078A JPS5530659A (en) 1978-08-25 1978-08-25 Parts inspecting device for print substrate

Publications (2)

Publication Number Publication Date
JPS5530659A true JPS5530659A (en) 1980-03-04
JPS6117310B2 JPS6117310B2 (en) 1986-05-07

Family

ID=14369009

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10400078A Granted JPS5530659A (en) 1978-08-25 1978-08-25 Parts inspecting device for print substrate

Country Status (1)

Country Link
JP (1) JPS5530659A (en)

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5733304A (en) * 1980-08-06 1982-02-23 Hitachi Ltd Method and device for shape inspection
JPS57199945A (en) * 1981-06-03 1982-12-08 Toshiba Corp Measuring and evaluating device for solder wettability
JPS58135941A (en) * 1982-02-08 1983-08-12 Matsushita Electric Ind Co Ltd Inspecting device for mounting of chip parts
JPS58146844A (en) * 1982-02-06 1983-09-01 インタ−ナショナル ビジネス マシ−ンズ コ−ポレ−ション Automatic optical characteristic inspecting device
US4670726A (en) * 1984-12-20 1987-06-02 Hitachi Metals, Ltd. Convergence device for electron beams in color picture tube
JPS62282250A (en) * 1985-12-27 1987-12-08 エイ・ティ・アンド・ティ・コーポレーション Method and device for inspecting circuit board
JPS6312752U (en) * 1986-07-10 1988-01-27
JPS63170746U (en) * 1987-01-14 1988-11-07
JPH0499963U (en) * 1991-02-01 1992-08-28

Cited By (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5733304A (en) * 1980-08-06 1982-02-23 Hitachi Ltd Method and device for shape inspection
JPS639602B2 (en) * 1980-08-06 1988-03-01 Hitachi Ltd
JPS57199945A (en) * 1981-06-03 1982-12-08 Toshiba Corp Measuring and evaluating device for solder wettability
JPS58146844A (en) * 1982-02-06 1983-09-01 インタ−ナショナル ビジネス マシ−ンズ コ−ポレ−ション Automatic optical characteristic inspecting device
JPH0236894B2 (en) * 1982-02-06 1990-08-21 Intaanashonaru Bijinesu Mashiinzu Corp
JPS58135941A (en) * 1982-02-08 1983-08-12 Matsushita Electric Ind Co Ltd Inspecting device for mounting of chip parts
JPH0330812B2 (en) * 1982-02-08 1991-05-01 Matsushita Electric Ind Co Ltd
US4670726A (en) * 1984-12-20 1987-06-02 Hitachi Metals, Ltd. Convergence device for electron beams in color picture tube
JPS62282250A (en) * 1985-12-27 1987-12-08 エイ・ティ・アンド・ティ・コーポレーション Method and device for inspecting circuit board
JPS6312752U (en) * 1986-07-10 1988-01-27
JPS63170746U (en) * 1987-01-14 1988-11-07
JPH0499963U (en) * 1991-02-01 1992-08-28

Also Published As

Publication number Publication date
JPS6117310B2 (en) 1986-05-07

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