JPH0326643Y2 - - Google Patents

Info

Publication number
JPH0326643Y2
JPH0326643Y2 JP1985150552U JP15055285U JPH0326643Y2 JP H0326643 Y2 JPH0326643 Y2 JP H0326643Y2 JP 1985150552 U JP1985150552 U JP 1985150552U JP 15055285 U JP15055285 U JP 15055285U JP H0326643 Y2 JPH0326643 Y2 JP H0326643Y2
Authority
JP
Japan
Prior art keywords
probe
waveguide
dielectric block
dielectric
converter
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP1985150552U
Other languages
English (en)
Japanese (ja)
Other versions
JPS6258908U (en:Method
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1985150552U priority Critical patent/JPH0326643Y2/ja
Priority to US06/911,393 priority patent/US4725793A/en
Publication of JPS6258908U publication Critical patent/JPS6258908U/ja
Application granted granted Critical
Publication of JPH0326643Y2 publication Critical patent/JPH0326643Y2/ja
Expired legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01P—WAVEGUIDES; RESONATORS, LINES, OR OTHER DEVICES OF THE WAVEGUIDE TYPE
    • H01P5/00—Coupling devices of the waveguide type
    • H01P5/08—Coupling devices of the waveguide type for linking dissimilar lines or devices
    • H01P5/10—Coupling devices of the waveguide type for linking dissimilar lines or devices for coupling balanced lines or devices with unbalanced lines or devices
    • H01P5/107—Hollow-waveguide/strip-line transitions

Landscapes

  • Control Of Motors That Do Not Use Commutators (AREA)
JP1985150552U 1985-09-30 1985-09-30 Expired JPH0326643Y2 (en:Method)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP1985150552U JPH0326643Y2 (en:Method) 1985-09-30 1985-09-30
US06/911,393 US4725793A (en) 1985-09-30 1986-09-25 Waveguide-microstrip line converter

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1985150552U JPH0326643Y2 (en:Method) 1985-09-30 1985-09-30

Publications (2)

Publication Number Publication Date
JPS6258908U JPS6258908U (en:Method) 1987-04-11
JPH0326643Y2 true JPH0326643Y2 (en:Method) 1991-06-10

Family

ID=15499370

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1985150552U Expired JPH0326643Y2 (en:Method) 1985-09-30 1985-09-30

Country Status (2)

Country Link
US (1) US4725793A (en:Method)
JP (1) JPH0326643Y2 (en:Method)

Families Citing this family (63)

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US5017892A (en) * 1989-05-16 1991-05-21 Cornell Research Foundation, Inc. Waveguide adaptors and Gunn oscillators using the same
US5262739A (en) * 1989-05-16 1993-11-16 Cornell Research Foundation, Inc. Waveguide adaptors
US4920450A (en) * 1989-06-23 1990-04-24 Motorola, Inc. Temperature dependent capacitor
TW212252B (en:Method) * 1992-05-01 1993-09-01 Martin Marietta Corp
US5345170A (en) * 1992-06-11 1994-09-06 Cascade Microtech, Inc. Wafer probe station having integrated guarding, Kelvin connection and shielding systems
US6380751B2 (en) * 1992-06-11 2002-04-30 Cascade Microtech, Inc. Wafer probe station having environment control enclosure
US6232789B1 (en) * 1997-05-28 2001-05-15 Cascade Microtech, Inc. Probe holder for low current measurements
US5561377A (en) * 1995-04-14 1996-10-01 Cascade Microtech, Inc. System for evaluating probing networks
JP3389819B2 (ja) * 1996-06-10 2003-03-24 株式会社村田製作所 誘電体導波管型共振器
US5914613A (en) * 1996-08-08 1999-06-22 Cascade Microtech, Inc. Membrane probing system with local contact scrub
FR2754108B1 (fr) * 1996-10-01 1998-11-13 Alsthom Cge Alcatel Transition entre un guide d'ondes a crete et un circuit planaire
SE508296C2 (sv) * 1997-01-10 1998-09-21 Ericsson Telefon Ab L M Anordning vid mikrostripfördelningsnät samt gruppantenn
SE509159C2 (sv) * 1997-01-27 1998-12-07 Ericsson Telefon Ab L M Hållkrets jämte förfarande för styrning av en hållkrets
US6002263A (en) 1997-06-06 1999-12-14 Cascade Microtech, Inc. Probe station having inner and outer shielding
US6256882B1 (en) * 1998-07-14 2001-07-10 Cascade Microtech, Inc. Membrane probing system
DE19902248A1 (de) * 1999-01-21 2000-07-27 Bosch Gmbh Robert Schaltungsanordnung
US6578264B1 (en) 1999-06-04 2003-06-17 Cascade Microtech, Inc. Method for constructing a membrane probe using a depression
US6445202B1 (en) 1999-06-30 2002-09-03 Cascade Microtech, Inc. Probe station thermal chuck with shielding for capacitive current
US6838890B2 (en) 2000-02-25 2005-01-04 Cascade Microtech, Inc. Membrane probing system
US6965226B2 (en) * 2000-09-05 2005-11-15 Cascade Microtech, Inc. Chuck for holding a device under test
US6914423B2 (en) * 2000-09-05 2005-07-05 Cascade Microtech, Inc. Probe station
DE20114544U1 (de) 2000-12-04 2002-02-21 Cascade Microtech, Inc., Beaverton, Oreg. Wafersonde
GB0108696D0 (en) * 2001-04-05 2001-05-30 Koninkl Philips Electronics Nv A transition from microstrip to waveguide
US7355420B2 (en) 2001-08-21 2008-04-08 Cascade Microtech, Inc. Membrane probing system
US6777964B2 (en) * 2002-01-25 2004-08-17 Cascade Microtech, Inc. Probe station
US7352258B2 (en) * 2002-03-28 2008-04-01 Cascade Microtech, Inc. Waveguide adapter for probe assembly having a detachable bias tee
KR100864916B1 (ko) * 2002-05-23 2008-10-22 캐스케이드 마이크로테크 인코포레이티드 피시험 디바이스를 테스트하기 위한 프로브
US6847219B1 (en) * 2002-11-08 2005-01-25 Cascade Microtech, Inc. Probe station with low noise characteristics
US6724205B1 (en) * 2002-11-13 2004-04-20 Cascade Microtech, Inc. Probe for combined signals
US7250779B2 (en) 2002-11-25 2007-07-31 Cascade Microtech, Inc. Probe station with low inductance path
US6861856B2 (en) 2002-12-13 2005-03-01 Cascade Microtech, Inc. Guarded tub enclosure
US7221172B2 (en) * 2003-05-06 2007-05-22 Cascade Microtech, Inc. Switched suspended conductor and connection
US7057404B2 (en) * 2003-05-23 2006-06-06 Sharp Laboratories Of America, Inc. Shielded probe for testing a device under test
US7492172B2 (en) * 2003-05-23 2009-02-17 Cascade Microtech, Inc. Chuck for holding a device under test
US7250626B2 (en) * 2003-10-22 2007-07-31 Cascade Microtech, Inc. Probe testing structure
US7187188B2 (en) 2003-12-24 2007-03-06 Cascade Microtech, Inc. Chuck with integrated wafer support
WO2005065258A2 (en) 2003-12-24 2005-07-21 Cascade Microtech, Inc. Active wafer probe
WO2005121824A2 (en) * 2004-06-07 2005-12-22 Cascade Microtech, Inc. Thermal optical chuck
US7330041B2 (en) 2004-06-14 2008-02-12 Cascade Microtech, Inc. Localizing a temperature of a device for testing
KR101157449B1 (ko) * 2004-07-07 2012-06-22 캐스케이드 마이크로테크 인코포레이티드 멤브레인 서스펜디드 프로브를 구비한 프로브 헤드
EP1789812A2 (en) * 2004-09-13 2007-05-30 Cascade Microtech, Inc. Double sided probing structures
US20060169897A1 (en) * 2005-01-31 2006-08-03 Cascade Microtech, Inc. Microscope system for testing semiconductors
US7656172B2 (en) * 2005-01-31 2010-02-02 Cascade Microtech, Inc. System for testing semiconductors
US7535247B2 (en) 2005-01-31 2009-05-19 Cascade Microtech, Inc. Interface for testing semiconductors
US7449899B2 (en) * 2005-06-08 2008-11-11 Cascade Microtech, Inc. Probe for high frequency signals
JP5080459B2 (ja) * 2005-06-13 2012-11-21 カスケード マイクロテック インコーポレイテッド 広帯域能動／受動差動信号プローブ
US7609077B2 (en) 2006-06-09 2009-10-27 Cascade Microtech, Inc. Differential signal probe with integral balun
US7443186B2 (en) * 2006-06-12 2008-10-28 Cascade Microtech, Inc. On-wafer test structures for differential signals
US7403028B2 (en) 2006-06-12 2008-07-22 Cascade Microtech, Inc. Test structure and probe for differential signals
US7723999B2 (en) 2006-06-12 2010-05-25 Cascade Microtech, Inc. Calibration structures for differential signal probing
US7764072B2 (en) 2006-06-12 2010-07-27 Cascade Microtech, Inc. Differential signal probing system
JP4542531B2 (ja) * 2006-08-25 2010-09-15 東光株式会社 伝送モードの変換構造
US7876114B2 (en) 2007-08-08 2011-01-25 Cascade Microtech, Inc. Differential waveguide probe
US7888957B2 (en) * 2008-10-06 2011-02-15 Cascade Microtech, Inc. Probing apparatus with impedance optimized interface
US8410806B2 (en) 2008-11-21 2013-04-02 Cascade Microtech, Inc. Replaceable coupon for a probing apparatus
US8319503B2 (en) * 2008-11-24 2012-11-27 Cascade Microtech, Inc. Test apparatus for measuring a characteristic of a device under test
US9362607B2 (en) 2012-03-09 2016-06-07 Aselsan Elektronik Sanayi Ve Ticaret Anonim Sirketi Waveguide propagation apparatus compatible with hermetic packaging
JP6104672B2 (ja) * 2013-03-29 2017-03-29 モレックス エルエルシー 高周波伝送装置
JP5788452B2 (ja) * 2013-09-13 2015-09-30 東光株式会社 誘電体導波管共振器およびそれを用いた誘電体導波管フィルタ
JP5801362B2 (ja) * 2013-09-13 2015-10-28 東光株式会社 誘電体導波管入出力構造、および、それを用いた誘電体導波管デュプレクサ
DE102014218339A1 (de) * 2014-09-12 2016-03-17 Robert Bosch Gmbh Einrichtung zur Übertragung von Millimeterwellensignalen
US11264689B2 (en) * 2020-02-21 2022-03-01 Rohde & Schwarz Gmbh & Co. Kg Transition between a waveguide and a substrate integrated waveguide, where the transition includes a main body formed by symmetrical halves
US12344406B1 (en) 2021-08-17 2025-07-01 Hrl Laboratories, Llc High temperature RF surface aperture

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3265995A (en) * 1964-03-18 1966-08-09 Bell Telephone Labor Inc Transmission line to waveguide junction
US3577105A (en) * 1969-05-29 1971-05-04 Us Army Method and apparatus for joining plated dielectric-form waveguide components
US3626335A (en) * 1969-11-10 1971-12-07 Emerson Electric Co Phase-shifting means
BE792698A (fr) * 1971-12-21 1973-06-13 Illinois Tool Works Catheter-canule samenstel
US4280112A (en) * 1979-02-21 1981-07-21 Eisenhart Robert L Electrical coupler
US4349790A (en) * 1981-04-17 1982-09-14 Rca Corporation Coax to rectangular waveguide coupler

Also Published As

Publication number Publication date
US4725793A (en) 1988-02-16
JPS6258908U (en:Method) 1987-04-11

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