JPH0325817B2 - - Google Patents

Info

Publication number
JPH0325817B2
JPH0325817B2 JP59078826A JP7882684A JPH0325817B2 JP H0325817 B2 JPH0325817 B2 JP H0325817B2 JP 59078826 A JP59078826 A JP 59078826A JP 7882684 A JP7882684 A JP 7882684A JP H0325817 B2 JPH0325817 B2 JP H0325817B2
Authority
JP
Japan
Prior art keywords
transistor
circuit
node
transistors
path
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP59078826A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6049443A (ja
Inventor
Baanzu Kirei Donarudo
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
International Business Machines Corp
Original Assignee
International Business Machines Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by International Business Machines Corp filed Critical International Business Machines Corp
Publication of JPS6049443A publication Critical patent/JPS6049443A/ja
Publication of JPH0325817B2 publication Critical patent/JPH0325817B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318552—Clock circuits details
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K3/00—Circuits for generating electric pulses; Monostable, bistable or multistable circuits
    • H03K3/02—Generators characterised by the type of circuit or by the means used for producing pulses
    • H03K3/027—Generators characterised by the type of circuit or by the means used for producing pulses by the use of logic circuits, with internal or external positive feedback
    • H03K3/037—Bistable circuits
    • H03K3/0375—Bistable circuits provided with means for increasing reliability; for protection; for ensuring a predetermined initial state when the supply voltage has been applied; for storing the actual state when the supply voltage fails
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K3/00—Circuits for generating electric pulses; Monostable, bistable or multistable circuits
    • H03K3/02—Generators characterised by the type of circuit or by the means used for producing pulses
    • H03K3/353—Generators characterised by the type of circuit or by the means used for producing pulses by the use, as active elements, of field-effect transistors with internal or external positive feedback
    • H03K3/356—Bistable circuits
    • H03K3/356017—Bistable circuits using additional transistors in the input circuit
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K3/00—Circuits for generating electric pulses; Monostable, bistable or multistable circuits
    • H03K3/02—Generators characterised by the type of circuit or by the means used for producing pulses
    • H03K3/353—Generators characterised by the type of circuit or by the means used for producing pulses by the use, as active elements, of field-effect transistors with internal or external positive feedback
    • H03K3/356—Bistable circuits
    • H03K3/356017—Bistable circuits using additional transistors in the input circuit
    • H03K3/356052—Bistable circuits using additional transistors in the input circuit using pass gates
    • H03K3/35606—Bistable circuits using additional transistors in the input circuit using pass gates with synchronous operation

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Shift Register Type Memory (AREA)
  • Logic Circuits (AREA)
JP59078826A 1983-08-01 1984-04-20 ラッチ回路 Granted JPS6049443A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US51933883A 1983-08-01 1983-08-01
US519338 1983-08-01

Publications (2)

Publication Number Publication Date
JPS6049443A JPS6049443A (ja) 1985-03-18
JPH0325817B2 true JPH0325817B2 (enExample) 1991-04-09

Family

ID=24067873

Family Applications (1)

Application Number Title Priority Date Filing Date
JP59078826A Granted JPS6049443A (ja) 1983-08-01 1984-04-20 ラッチ回路

Country Status (3)

Country Link
EP (1) EP0137165B1 (enExample)
JP (1) JPS6049443A (enExample)
DE (1) DE3471855D1 (enExample)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB9417591D0 (en) * 1994-09-01 1994-10-19 Inmos Ltd Scan testable double edge triggered scan cell

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4004170A (en) * 1975-04-29 1977-01-18 International Business Machines Corporation MOSFET latching driver
US3993919A (en) * 1975-06-27 1976-11-23 Ibm Corporation Programmable latch and other circuits for logic arrays

Also Published As

Publication number Publication date
JPS6049443A (ja) 1985-03-18
EP0137165A1 (en) 1985-04-17
DE3471855D1 (en) 1988-07-07
EP0137165B1 (en) 1988-06-01

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