JPH03214763A - Lead frame for semiconductor integrated circuit device and the device using the same - Google Patents

Lead frame for semiconductor integrated circuit device and the device using the same

Info

Publication number
JPH03214763A
JPH03214763A JP970990A JP970990A JPH03214763A JP H03214763 A JPH03214763 A JP H03214763A JP 970990 A JP970990 A JP 970990A JP 970990 A JP970990 A JP 970990A JP H03214763 A JPH03214763 A JP H03214763A
Authority
JP
Japan
Prior art keywords
integrated circuit
semiconductor integrated
lead frame
circuit device
package
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP970990A
Other languages
Japanese (ja)
Inventor
Hideaki Koyama
英明 小山
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP970990A priority Critical patent/JPH03214763A/en
Publication of JPH03214763A publication Critical patent/JPH03214763A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/4805Shape
    • H01L2224/4809Loop shape
    • H01L2224/48091Arched
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/481Disposition
    • H01L2224/48151Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/48221Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/48245Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
    • H01L2224/48247Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic connecting the wire to a bond pad of the item
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00Printed circuits
    • H05K1/02Details
    • H05K1/0201Thermal arrangements, e.g. for cooling, heating or preventing overheating
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/30Assembling printed circuits with electric components, e.g. with resistor
    • H05K3/303Surface mounted components, e.g. affixing before soldering, aligning means, spacing means
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/30Assembling printed circuits with electric components, e.g. with resistor
    • H05K3/32Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits
    • H05K3/34Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by soldering
    • H05K3/341Surface mounted components
    • H05K3/3421Leaded components

Landscapes

  • Lead Frames For Integrated Circuits (AREA)

Abstract

PURPOSE:To reduce a thermal resistance between a case and its environment by extending a heat sink pin protruding from an island in contact with a heat source toward a rear surface, and soldering it to a ground plane at the time of mounting on a printed board. CONSTITUTION:A heat sink pin 2 is formed in an integral structure with an island 6 to protrude from the bottom of a molding resin 1. When an IC package is mounted on a printed board 8, the pin 2 is bonded to the surface of a copper foil 9 at the rear side of a printed board 8 through the board 8 via a solder layer 7. It is then sealed with molding resin 1. Thus, its thermal resistance can be reduced without increasing a mounting area to cope with a monolithic large-scale circuit.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は半導体集積回路装置のリードフレーム及びこれ
を用いた半導体集積回路装置に関し、特に熱抵抗を低減
する半導体集積回路装置のリードフレーム及びこれを用
いた半導体集積回路装置に関する。
Detailed Description of the Invention [Field of Industrial Application] The present invention relates to a lead frame for a semiconductor integrated circuit device and a semiconductor integrated circuit device using the same, and particularly to a lead frame for a semiconductor integrated circuit device that reduces thermal resistance and the same. The present invention relates to a semiconductor integrated circuit device using.

〔従来の技術〕[Conventional technology]

従来、この種の技術としては、モールド封入のパッケー
ジで、第4図に示すDIPタイプの放熱フィン12付半
導体集積回路装置のリードフレーム(以下リードフレー
ムと記す)や第5図に示すSIPタイプの放熱フィン2
2付リードフレームがある程度で、モールド封入のフラ
ットパッケージやSOPタイプのパッケージは、特に、
放熱フィンのように構造的に熱をにがす技術はないのが
現状である。
Conventionally, as this type of technology, molded packages are used, such as the DIP type lead frame (hereinafter referred to as lead frame) of a semiconductor integrated circuit device with heat dissipation fins 12 shown in FIG. 4, and the SIP type shown in FIG. 5. Heat dissipation fin 2
In particular, molded flat packages and SOP type packages with lead frames with 2 attachments,
Currently, there is no technology that structurally dissipates heat like heat dissipation fins.

〔発明が解決しようとする課題〕[Problem to be solved by the invention]

上述した従来のDIPタイプのICパッケージの放熱フ
ィン付リードフレームでは、QFPなどのFlat系I
Cパッケージでは実施することが不可能で、又、DIP
タイプのICパッケージでも実施面積が大きくなる欠点
がある。
In the lead frame with heat dissipation fins of the conventional DIP type IC package mentioned above, Flat type I such as QFP
It is impossible to implement with C package, and DIP
Even with this type of IC package, there is a drawback that the implementation area is large.

又、リードフレームの材質を変える等の対策では、熱抵
抗低減には限度があり、最近の大規模回路のモノリジッ
ク化の傾向に対してICパッケージのもつ熱抵抗で集積
化できないという欠点がある。
Furthermore, there is a limit to the reduction in thermal resistance with measures such as changing the material of the lead frame, and there is a drawback that the thermal resistance of the IC package prevents integration with the recent trend toward monolithic large-scale circuits.

本発明の目的は、実装面積を拡大することなく熱抵抗を
低減でき、大規模回路のモノリシック化に対応できるI
Cパッケージのリードフレームとこれを用いた半導体集
積回路装置を提供することにある。
An object of the present invention is to reduce thermal resistance without expanding the mounting area and to adapt to monolithic large-scale circuits.
An object of the present invention is to provide a C package lead frame and a semiconductor integrated circuit device using the lead frame.

〔課題を解決するための手段〕[Means to solve the problem]

1.本発明の半導体集積回路装置のリードフレームは、
ペレットを搭載するアイランドの裏面側に前記アイラン
ドと同一材質の放熱用ピンが突出している。
1. The lead frame of the semiconductor integrated circuit device of the present invention includes:
A heat dissipation pin made of the same material as the island protrudes from the back side of the island on which the pellets are mounted.

2,本発明のQFPタイプICパッケージの半導体集積
回路装置は、第1項記載の半導体集積回路装置のリード
フレームのアイランドにペレッ1〜を搭載しモールド樹
脂封止されている,,3.本発明のDIPタイプICパ
ッケージの半導体集積回路装置は、第1−項記載の半導
体集積回路装置のリードフレームのアイランドにペレッ
1〜を搭載しモールド樹脂封止されている。
2. In the semiconductor integrated circuit device of the QFP type IC package of the present invention, the pellets 1 to 1 are mounted on the island of the lead frame of the semiconductor integrated circuit device described in item 1 and sealed with mold resin. In the semiconductor integrated circuit device of the DIP type IC package of the present invention, pellets 1 to 1 are mounted on the islands of the lead frame of the semiconductor integrated circuit device described in section 1-1 and sealed with mold resin.

〔実施例〕〔Example〕

次に、本発明の実施例について図面を参照して説明する
Next, embodiments of the present invention will be described with reference to the drawings.

第1図(a),(1))は本発明の第1の実施例のリー
ドフレームを遡用した48p i nQFPタイプのI
Cパッケージの底面図及びA−A′線断面図、第2図は
第]−図(a>,(b)のICパッケージをプリント基
板に実装した断面図である。
Figure 1 (a), (1)) shows a 48 pin QFP type I which uses the lead frame of the first embodiment of the present invention.
FIG. 2 is a bottom view and a cross-sectional view taken along the line A-A' of the C package, and FIG. 2 is a cross-sectional view of the IC package shown in FIGS.

第1の実施例は、第1図(a),(b)に示すように、
48p i nQFPタイフ゜の丁Cパ・ンケージに適
用した例で、放熱ピン2は、アイラン1・6と一体構造
となっており、モールド樹脂1の底面より突出している
The first embodiment, as shown in FIGS. 1(a) and (b),
In this example, the heat dissipation pin 2 is integrated with the eyelins 1 and 6, and protrudes from the bottom surface of the molded resin 1.

第2図に示すように、プリント基板8にICパッケージ
を実装するときには、放熱ピン2はプリント基板8を貫
通してプリント基板8の裏側の銅はく9の面にはんだ層
7にて接合される。
As shown in FIG. 2, when an IC package is mounted on a printed circuit board 8, the heat dissipation pins 2 pass through the printed circuit board 8 and are bonded to the surface of the copper foil 9 on the back side of the printed circuit board 8 using a solder layer 7. Ru.

第3図は本発明の第2の実施例のリードフレームを適用
したDIPタイプのICパッケージの断面図である。
FIG. 3 is a sectional view of a DIP type IC package to which the lead frame of the second embodiment of the present invention is applied.

第2の実施例は、第3図に示すように、DIPタイプの
ICパッケージに適用した例である。放熱ピン2が下方
に出ている為、第4図に示す放熱フィン12付DTPの
ICパッケージよりも実装面積が小さくなるという利点
がある。
The second embodiment is an example in which the present invention is applied to a DIP type IC package, as shown in FIG. Since the heat dissipation pins 2 protrude downward, there is an advantage that the mounting area is smaller than that of the DTP IC package with heat dissipation fins 12 shown in FIG.

〔発明の効果〕〔Effect of the invention〕

以上説明したように本発明は、熱源に接しているアイラ
ンドから裏面方向に突起する放熱ピンを出しプリント基
板実装時にグランドプレーンにはんだ付けすることによ
り、実質的に放熱板が付いたことになり、熱かにげやす
くできる効果がある。すなわち、ケースと周囲との間の
熱抵抗が低減でき、大規模回路のモノリシック化に対応
できる効果がある。
As explained above, in the present invention, a heat dissipation pin that protrudes toward the back side from an island in contact with a heat source is taken out and soldered to a ground plane when mounted on a printed circuit board, so that a heat dissipation plate is essentially attached. It has the effect of making it easier to get hot. That is, the thermal resistance between the case and the surroundings can be reduced, and this has the effect of making it possible to make a large-scale circuit monolithic.

5

【図面の簡単な説明】[Brief explanation of drawings]

第1図(a),(1))は本発明の第1の実施例のリー
ドフレームを適用した48p i nQFPタイプのI
Cパッケージの底面図及びA−A’線断面図、第2図は
第1図(a),(b)のICパッケージをプリント基板
に実装した断面図、第3図は本発明の第2の実施例のリ
ードフレームを適用したDIPタイプのICパッケージ
の断面図、第4図は従来の放熱フィン付DIPタイプの
ICパッケージの斜視図、第5図は従来の放熱フィン付
SIPタイプのICパッケージの斜視図である。 1・・・モールド樹脂、2・・・放熱ピン、3・・・ピ
ン、4・・・ペレット、5・・・ボンディングワイヤ、
6・アイランド、7・・・はんだ層、8・・・プリント
基板、12.22・・・放熱フィン。
Figures 1(a) and (1)) show a 48pin QFP type I to which the lead frame of the first embodiment of the present invention is applied.
A bottom view and a sectional view taken along the line A-A' of the C package, FIG. 2 is a sectional view of the IC package of FIGS. 1(a) and (b) mounted on a printed circuit board, and FIG. FIG. 4 is a cross-sectional view of a DIP type IC package to which the lead frame of the embodiment is applied, FIG. 4 is a perspective view of a conventional DIP type IC package with heat dissipation fins, and FIG. 5 is a cross-sectional view of a conventional SIP type IC package with heat dissipation fins. FIG. DESCRIPTION OF SYMBOLS 1... Mold resin, 2... Heat dissipation pin, 3... Pin, 4... Pellet, 5... Bonding wire,
6. Island, 7. Solder layer, 8. Printed circuit board, 12.22. Radiation fin.

Claims (1)

【特許請求の範囲】 1、ペレットを搭載するアイランドの裏面側に前記アイ
ランドと同一材質の放熱用ピンが突出していることを特
徴とする半導体集積回路装置のリードフレーム。 2、第1項記載の半導体集積回路装置のリードフレーム
のアイランドにペレットを搭載しモールド樹脂封止した
ことを特徴とするQFPタイプICパッケージの半導体
集積回路装置。 3、第1項記載の半導体集積回路装置のリードフレーム
のアイランドにペレットを搭載しモールド樹脂封止した
ことを特徴とするDIPタイプICパッケージの半導体
集積回路装置。
[Scope of Claims] 1. A lead frame for a semiconductor integrated circuit device, characterized in that a heat dissipation pin made of the same material as the island projects from the back side of the island on which a pellet is mounted. 2. A semiconductor integrated circuit device in a QFP type IC package, characterized in that a pellet is mounted on the island of the lead frame of the semiconductor integrated circuit device according to item 1 and sealed with a mold resin. 3. A semiconductor integrated circuit device in a DIP type IC package, characterized in that a pellet is mounted on an island of a lead frame of the semiconductor integrated circuit device according to item 1 and sealed with a mold resin.
JP970990A 1990-01-19 1990-01-19 Lead frame for semiconductor integrated circuit device and the device using the same Pending JPH03214763A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP970990A JPH03214763A (en) 1990-01-19 1990-01-19 Lead frame for semiconductor integrated circuit device and the device using the same

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP970990A JPH03214763A (en) 1990-01-19 1990-01-19 Lead frame for semiconductor integrated circuit device and the device using the same

Publications (1)

Publication Number Publication Date
JPH03214763A true JPH03214763A (en) 1991-09-19

Family

ID=11727779

Family Applications (1)

Application Number Title Priority Date Filing Date
JP970990A Pending JPH03214763A (en) 1990-01-19 1990-01-19 Lead frame for semiconductor integrated circuit device and the device using the same

Country Status (1)

Country Link
JP (1) JPH03214763A (en)

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0650373U (en) * 1992-06-12 1994-07-08 八重洲無線株式会社 Laser diode mounting structure
US5444025A (en) * 1991-10-23 1995-08-22 Fujitsu Limited Process for encapsulating a semiconductor package having a heat sink using a jig
US5563773A (en) * 1991-11-15 1996-10-08 Kabushiki Kaisha Toshiba Semiconductor module having multiple insulation and wiring layers
KR19980039675A (en) * 1996-11-28 1998-08-17 황인길 Structure of Semiconductor Package
US6455348B1 (en) 1998-03-12 2002-09-24 Matsushita Electric Industrial Co., Ltd. Lead frame, resin-molded semiconductor device, and method for manufacturing the same
KR100352119B1 (en) * 1996-12-13 2002-12-31 앰코 테크놀로지 코리아 주식회사 Structure of ball grid array semiconductor package having heatsink and fabricating method thereof
JP2009532912A (en) * 2006-04-06 2009-09-10 フリースケール セミコンダクター インコーポレイテッド Molded semiconductor package with integral through-hole heat dissipation pins

Cited By (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5444025A (en) * 1991-10-23 1995-08-22 Fujitsu Limited Process for encapsulating a semiconductor package having a heat sink using a jig
US5659200A (en) * 1991-10-23 1997-08-19 Fujitsu, Ltd. Semiconductor device having radiator structure
US5563773A (en) * 1991-11-15 1996-10-08 Kabushiki Kaisha Toshiba Semiconductor module having multiple insulation and wiring layers
JPH0650373U (en) * 1992-06-12 1994-07-08 八重洲無線株式会社 Laser diode mounting structure
KR19980039675A (en) * 1996-11-28 1998-08-17 황인길 Structure of Semiconductor Package
KR100352119B1 (en) * 1996-12-13 2002-12-31 앰코 테크놀로지 코리아 주식회사 Structure of ball grid array semiconductor package having heatsink and fabricating method thereof
US6455348B1 (en) 1998-03-12 2002-09-24 Matsushita Electric Industrial Co., Ltd. Lead frame, resin-molded semiconductor device, and method for manufacturing the same
JP2009532912A (en) * 2006-04-06 2009-09-10 フリースケール セミコンダクター インコーポレイテッド Molded semiconductor package with integral through-hole heat dissipation pins
JP2014013908A (en) * 2006-04-06 2014-01-23 Freescale Semiconductor Inc Molded semiconductor package with integrated through hole technology (tht) heat spreader pin and method of manufacturing the same
US8659146B2 (en) 2006-04-06 2014-02-25 Freescale Semiconductor, Inc. Lead frame based, over-molded semiconductor package with integrated through hole technology (THT) heat spreader pin(s) and associated method of manufacturing

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