JPH0314454U - - Google Patents
Info
- Publication number
- JPH0314454U JPH0314454U JP7456189U JP7456189U JPH0314454U JP H0314454 U JPH0314454 U JP H0314454U JP 7456189 U JP7456189 U JP 7456189U JP 7456189 U JP7456189 U JP 7456189U JP H0314454 U JPH0314454 U JP H0314454U
- Authority
- JP
- Japan
- Prior art keywords
- reference frame
- substrate
- glass substrate
- sets
- inspected
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000000758 substrate Substances 0.000 claims description 13
- 239000011521 glass Substances 0.000 claims description 10
- 238000007689 inspection Methods 0.000 claims description 6
- 230000007547 defect Effects 0.000 claims description 4
- 238000010586 diagram Methods 0.000 description 2
- 238000000034 method Methods 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
Landscapes
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP7456189U JPH0725679Y2 (ja) | 1989-06-26 | 1989-06-26 | ガラス基板検査用フレキシブル載置台 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP7456189U JPH0725679Y2 (ja) | 1989-06-26 | 1989-06-26 | ガラス基板検査用フレキシブル載置台 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH0314454U true JPH0314454U (enrdf_load_stackoverflow) | 1991-02-14 |
| JPH0725679Y2 JPH0725679Y2 (ja) | 1995-06-07 |
Family
ID=31614357
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP7456189U Expired - Lifetime JPH0725679Y2 (ja) | 1989-06-26 | 1989-06-26 | ガラス基板検査用フレキシブル載置台 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0725679Y2 (enrdf_load_stackoverflow) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| AU5257001A (en) * | 2000-04-26 | 2001-11-07 | Olympus Optical Co., Ltd. | Holder mechanism |
| JP4659813B2 (ja) * | 2007-12-27 | 2011-03-30 | セイコーエプソン株式会社 | 表示器用照明装置 |
-
1989
- 1989-06-26 JP JP7456189U patent/JPH0725679Y2/ja not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0725679Y2 (ja) | 1995-06-07 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| TWI498542B (zh) | 光學檢測裝置 | |
| CN212845071U (zh) | 键帽检测装置和键帽检测设备 | |
| CN105835013A (zh) | 一种航空零部件检测记录工作台 | |
| CN206020295U (zh) | 一种镜片表面质量检测机 | |
| JPH0314454U (enrdf_load_stackoverflow) | ||
| FR2375578A1 (fr) | Appareil et procede pour inspecter le contour des articles | |
| CN215678052U (zh) | 一种oca光学胶便携式检验设备 | |
| JP2002341345A (ja) | 平面表示装置の製造方法、及びこのためのバックライトの検査方法 | |
| CN210954052U (zh) | 免疫层析检测用除阴影装置 | |
| CN211061401U (zh) | 一种榛子仁缺陷检测装置 | |
| JP2948353B2 (ja) | ガラス板の表面欠陥検査方法および検査装置 | |
| CN212873185U (zh) | 一种光桌检查台 | |
| CN215968448U (zh) | 一种组装用治具 | |
| CN213209945U (zh) | 一种玻璃生产用缺陷检测装置 | |
| JPS59113707U (ja) | 鏡面体の表面検査装置 | |
| JPH0311571A (ja) | フレキシブルプリント配線板と透明基板の回路接続部の位置合せ装置 | |
| JPH0431753A (ja) | 異物検査装置 | |
| JP3088374U (ja) | 対物レンズの黒点測定用治具 | |
| JPS63205922A (ja) | 半導体基板外観検査装置 | |
| JPS6336683Y2 (enrdf_load_stackoverflow) | ||
| JPS55144533A (en) | Apparatus for inspecting bottle | |
| JPS6213051Y2 (enrdf_load_stackoverflow) | ||
| JPS61199661U (enrdf_load_stackoverflow) | ||
| JPH0327343U (enrdf_load_stackoverflow) | ||
| JPH01140817U (enrdf_load_stackoverflow) |