JPH0312106U - - Google Patents
Info
- Publication number
- JPH0312106U JPH0312106U JP1989071659U JP7165989U JPH0312106U JP H0312106 U JPH0312106 U JP H0312106U JP 1989071659 U JP1989071659 U JP 1989071659U JP 7165989 U JP7165989 U JP 7165989U JP H0312106 U JPH0312106 U JP H0312106U
- Authority
- JP
- Japan
- Prior art keywords
- light
- diameter measuring
- workpiece
- emitting part
- optical diameter
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 230000003287 optical effect Effects 0.000 claims description 7
- 238000005259 measurement Methods 0.000 claims 4
- 238000000034 method Methods 0.000 claims 1
- 239000013078 crystal Substances 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/08—Measuring arrangements characterised by the use of optical techniques for measuring diameters
- G01B11/10—Measuring arrangements characterised by the use of optical techniques for measuring diameters of objects while moving
- G01B11/105—Measuring arrangements characterised by the use of optical techniques for measuring diameters of objects while moving using photoelectric detection means
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/08—Measuring arrangements characterised by the use of optical techniques for measuring diameters
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N2021/8477—Investigating crystals, e.g. liquid crystals
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1989071659U JPH0312106U (US06582424-20030624-M00016.png) | 1989-06-21 | 1989-06-21 | |
US07/538,342 US5105091A (en) | 1989-06-21 | 1990-06-13 | Non-contact type automatic multi-point diameter measurement apparatus |
EP19900306735 EP0404544A3 (en) | 1989-06-21 | 1990-06-20 | Non-contact type automatic multi-point diameter measurement apparatus |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1989071659U JPH0312106U (US06582424-20030624-M00016.png) | 1989-06-21 | 1989-06-21 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH0312106U true JPH0312106U (US06582424-20030624-M00016.png) | 1991-02-07 |
Family
ID=13466955
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1989071659U Pending JPH0312106U (US06582424-20030624-M00016.png) | 1989-06-21 | 1989-06-21 |
Country Status (3)
Country | Link |
---|---|
US (1) | US5105091A (US06582424-20030624-M00016.png) |
EP (1) | EP0404544A3 (US06582424-20030624-M00016.png) |
JP (1) | JPH0312106U (US06582424-20030624-M00016.png) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4783480B1 (ja) * | 2011-03-31 | 2011-09-28 | 株式会社エステック | 切削装置 |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6111262A (en) * | 1998-10-30 | 2000-08-29 | Sumitomo Metal Industries, Ltd. | Method for measuring a diameter of a crystal |
US7578165B1 (en) * | 2004-12-17 | 2009-08-25 | Interface Associates, Inc. | Measurement apparatus and methods for balloon catheters |
WO2007075585A2 (en) | 2005-12-16 | 2007-07-05 | Interface Associates, Inc. | Multi-layer balloons for medical applications and methods for manufacturing the same |
CN105222703A (zh) * | 2015-09-30 | 2016-01-06 | 河南航天精工制造有限公司 | 一种显微镜测量螺纹单一中径的方法 |
EP3450097A1 (en) * | 2017-09-05 | 2019-03-06 | Renishaw PLC | Non-contact optical tool setting apparatus and method |
CN109959340A (zh) * | 2019-04-17 | 2019-07-02 | 吉林工程技术师范学院 | 一种基于电气控制的螺旋管检验装置 |
CN114791266B (zh) * | 2022-03-08 | 2023-01-17 | 中车大连机车研究所有限公司 | 一种新型四点接触球轴承滚道测量系统 |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS57127803A (en) * | 1981-01-30 | 1982-08-09 | Riide Denki Kk | Optical gauge for measuring outer diameter |
JPS57203904A (en) * | 1981-06-10 | 1982-12-14 | Mitsutoyo Mfg Co Ltd | Optical dimension measurement and its device |
JPS5761509B2 (US06582424-20030624-M00016.png) * | 1974-07-16 | 1982-12-24 | Mitsubishi Electric Corp | |
JPS612007A (ja) * | 1984-06-15 | 1986-01-08 | Kajima Corp | 土運船内土砂の体積計測方法 |
JPS63150609A (ja) * | 1986-12-16 | 1988-06-23 | Teijin Eng Kk | 外径測定方法 |
Family Cites Families (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3724958A (en) * | 1970-03-09 | 1973-04-03 | Knox Inc | Scanning and control apparatus |
FR2389099A1 (fr) * | 1977-04-25 | 1978-11-24 | Sopelem | Procede optique de controle dimensionnel |
SE414543C (sv) * | 1978-11-10 | 1982-10-04 | Kockums Automation | Forfarande vid metverdesuttagning for faststellande av ett forbestemt diameter- och/eller krokningsverde hos ett langstreckt foremal sasom en virkesstock eller dylikt samt anordning for genomforande av forfarandet |
CH648138A5 (de) * | 1980-05-08 | 1985-02-28 | Zumbach Electronic Ag | Verfahren und vorrichtung zum automatischen regeln einer groesse eines einen extruder verlassenden objekts. |
JPS6049209A (ja) * | 1983-08-27 | 1985-03-18 | O Ii M Syst:Kk | 平ドリルの刃部径測定装置 |
DE3510644A1 (de) * | 1985-03-23 | 1986-10-02 | Rheinmetall GmbH, 4000 Düsseldorf | Verfahren zur vermessung von insbesondere rotationssymmetrischen werkstuecken |
DE3521260A1 (de) * | 1985-06-13 | 1986-12-18 | OEM Meßtechnik GmbH, 8000 München | Verfahren und vorrichtung zum ermitteln der abmessungen eines laenglichen pruefobjektes |
US4912337A (en) * | 1988-06-03 | 1990-03-27 | Honeywell Inc. | Position responsive apparatus |
-
1989
- 1989-06-21 JP JP1989071659U patent/JPH0312106U/ja active Pending
-
1990
- 1990-06-13 US US07/538,342 patent/US5105091A/en not_active Expired - Fee Related
- 1990-06-20 EP EP19900306735 patent/EP0404544A3/en not_active Withdrawn
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5761509B2 (US06582424-20030624-M00016.png) * | 1974-07-16 | 1982-12-24 | Mitsubishi Electric Corp | |
JPS57127803A (en) * | 1981-01-30 | 1982-08-09 | Riide Denki Kk | Optical gauge for measuring outer diameter |
JPS57203904A (en) * | 1981-06-10 | 1982-12-14 | Mitsutoyo Mfg Co Ltd | Optical dimension measurement and its device |
JPS612007A (ja) * | 1984-06-15 | 1986-01-08 | Kajima Corp | 土運船内土砂の体積計測方法 |
JPS63150609A (ja) * | 1986-12-16 | 1988-06-23 | Teijin Eng Kk | 外径測定方法 |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4783480B1 (ja) * | 2011-03-31 | 2011-09-28 | 株式会社エステック | 切削装置 |
Also Published As
Publication number | Publication date |
---|---|
US5105091A (en) | 1992-04-14 |
EP0404544A3 (en) | 1991-11-27 |
EP0404544A2 (en) | 1990-12-27 |