JPH0312106U - - Google Patents

Info

Publication number
JPH0312106U
JPH0312106U JP1989071659U JP7165989U JPH0312106U JP H0312106 U JPH0312106 U JP H0312106U JP 1989071659 U JP1989071659 U JP 1989071659U JP 7165989 U JP7165989 U JP 7165989U JP H0312106 U JPH0312106 U JP H0312106U
Authority
JP
Japan
Prior art keywords
light
diameter measuring
workpiece
emitting part
optical diameter
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1989071659U
Other languages
English (en)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1989071659U priority Critical patent/JPH0312106U/ja
Priority to US07/538,342 priority patent/US5105091A/en
Priority to EP19900306735 priority patent/EP0404544A3/en
Publication of JPH0312106U publication Critical patent/JPH0312106U/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/08—Measuring arrangements characterised by the use of optical techniques for measuring diameters
    • G01B11/10—Measuring arrangements characterised by the use of optical techniques for measuring diameters of objects while moving
    • G01B11/105—Measuring arrangements characterised by the use of optical techniques for measuring diameters of objects while moving using photoelectric detection means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/08—Measuring arrangements characterised by the use of optical techniques for measuring diameters
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N2021/8477—Investigating crystals, e.g. liquid crystals

Description

【図面の簡単な説明】
第１図は本考案に係る非接触式自動多点直径計
測装置の破断正面図、第２図は同装置の側面図、
第３図は同装置の構成を示すブロツク図である。 １０…発光部、１３…高周波蛍光灯、３０…コ
ントローラー（制御部）、５０…光学式直径計測
部、５５…イメージセンサー、７０…エンコーダ
ー（位置検出部）、８０…コンピユーター（演算
処理部）、９０…シーケンサー８０（制御部）、
Ｗ…単結晶インゴツトＷ（ワーク）。

Claims (1)

  1. 【実用新案登録請求の範囲】 (1) 棒状のワークの軸方向に並行移動する発光
    部と、該発光部に連動してワークの軸方向に並行
    移動し、且つ同発光部からの光を受けてワークの
    直径を非接触、且つリアルタイムに計測する光学
    式直径計測部と、該光学式直径計測部の位置を検
    出する位置検出部と、該位置検出部からの検出信
    号を受けて前記光学式直径計測部の計測動作を制
    御する制御部と、前記光学式直径計測部からの計
    測信号を受けて直径を演算し、データ処理する演
    算処理部を含んで構成される装置であつて、前記
    発光部は、スリツトを介してワークに向かつて投
    光し、そのスリツトと共にその移動方向に直角な
    方向に延在し、且つ少なくとも前記光学式直径計
    測部により当該発光部の両端が検出されるよう十
    分な長さを有するものであり、前記光学式直径計
    測部は、イメージセンサーを含んで構成されるこ
    とを特徴とする非接触式自動多点直径計測装置。 (2) 前記発光部は、ワークの軸直角方向に配さ
    れる高周波蛍光灯を含んで構成されることを特徴
    とする請求項１記載の非接触式自動多点直径計測
    装置。
JP1989071659U 1989-06-21 1989-06-21 Pending JPH0312106U (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP1989071659U JPH0312106U (ja) 1989-06-21 1989-06-21
US07/538,342 US5105091A (en) 1989-06-21 1990-06-13 Non-contact type automatic multi-point diameter measurement apparatus
EP19900306735 EP0404544A3 (en) 1989-06-21 1990-06-20 Non-contact type automatic multi-point diameter measurement apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1989071659U JPH0312106U (ja) 1989-06-21 1989-06-21

Publications (1)

Publication Number Publication Date
JPH0312106U true JPH0312106U (ja) 1991-02-07

Family

ID=13466955

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1989071659U Pending JPH0312106U (ja) 1989-06-21 1989-06-21

Country Status (3)

Country Link
US (1) US5105091A (ja)
EP (1) EP0404544A3 (ja)
JP (1) JPH0312106U (ja)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4783480B1 (ja) * 2011-03-31 2011-09-28 株式会社エステック 切削装置

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6111262A (en) * 1998-10-30 2000-08-29 Sumitomo Metal Industries, Ltd. Method for measuring a diameter of a crystal
US7578165B1 (en) * 2004-12-17 2009-08-25 Interface Associates, Inc. Measurement apparatus and methods for balloon catheters
US7942847B2 (en) 2005-12-16 2011-05-17 Interface Associates, Inc. Multi-layer balloons for medical applications and methods for manufacturing the same
CN105222703A (zh) * 2015-09-30 2016-01-06 河南航天精工制造有限公司 一种显微镜测量螺纹单一中径的方法
EP3450097A1 (en) * 2017-09-05 2019-03-06 Renishaw PLC Non-contact optical tool setting apparatus and method
CN109959340A (zh) * 2019-04-17 2019-07-02 吉林工程技术师范学院 一种基于电气控制的螺旋管检验装置
CN114791266B (zh) * 2022-03-08 2023-01-17 中车大连机车研究所有限公司 一种新型四点接触球轴承滚道测量系统

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57127803A (en) * 1981-01-30 1982-08-09 Riide Denki Kk Optical gauge for measuring outer diameter
JPS57203904A (en) * 1981-06-10 1982-12-14 Mitsutoyo Mfg Co Ltd Optical dimension measurement and its device
JPS5761509B2 (ja) * 1974-07-16 1982-12-24 Mitsubishi Electric Corp
JPS612007A (ja) * 1984-06-15 1986-01-08 Kajima Corp 土運船内土砂の体積計測方法
JPS63150609A (ja) * 1986-12-16 1988-06-23 Teijin Eng Kk 外径測定方法

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3724958A (en) * 1970-03-09 1973-04-03 Knox Inc Scanning and control apparatus
FR2389099A1 (fr) * 1977-04-25 1978-11-24 Sopelem Procede optique de controle dimensionnel
SE414543C (sv) * 1978-11-10 1982-09-23 Kockums Automation Forfarande vid metverdesuttagning for faststellande av ett forbestemt diameter- och/eller krokningsverde hos ett langstreckt foremal sasom en virkesstock eller dylikt samt anordning for genomforande av forfarandet
CH648138A5 (de) * 1980-05-08 1985-02-28 Zumbach Electronic Ag Verfahren und vorrichtung zum automatischen regeln einer groesse eines einen extruder verlassenden objekts.
JPS6049209A (ja) * 1983-08-27 1985-03-18 O Ii M Syst:Kk 平ドリルの刃部径測定装置
DE3510644A1 (de) * 1985-03-23 1986-10-02 Rheinmetall GmbH, 4000 Düsseldorf Verfahren zur vermessung von insbesondere rotationssymmetrischen werkstuecken
DE3521260A1 (de) * 1985-06-13 1986-12-18 OEM Meßtechnik GmbH, 8000 München Verfahren und vorrichtung zum ermitteln der abmessungen eines laenglichen pruefobjektes
US4912337A (en) * 1988-06-03 1990-03-27 Honeywell Inc. Position responsive apparatus

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5761509B2 (ja) * 1974-07-16 1982-12-24 Mitsubishi Electric Corp
JPS57127803A (en) * 1981-01-30 1982-08-09 Riide Denki Kk Optical gauge for measuring outer diameter
JPS57203904A (en) * 1981-06-10 1982-12-14 Mitsutoyo Mfg Co Ltd Optical dimension measurement and its device
JPS612007A (ja) * 1984-06-15 1986-01-08 Kajima Corp 土運船内土砂の体積計測方法
JPS63150609A (ja) * 1986-12-16 1988-06-23 Teijin Eng Kk 外径測定方法

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4783480B1 (ja) * 2011-03-31 2011-09-28 株式会社エステック 切削装置

Also Published As

Publication number Publication date
EP0404544A3 (en) 1991-11-27
US5105091A (en) 1992-04-14
EP0404544A2 (en) 1990-12-27

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