JPH0311435B2 - - Google Patents

Info

Publication number
JPH0311435B2
JPH0311435B2 JP56098854A JP9885481A JPH0311435B2 JP H0311435 B2 JPH0311435 B2 JP H0311435B2 JP 56098854 A JP56098854 A JP 56098854A JP 9885481 A JP9885481 A JP 9885481A JP H0311435 B2 JPH0311435 B2 JP H0311435B2
Authority
JP
Japan
Prior art keywords
data
address
memory
control
pattern
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP56098854A
Other languages
English (en)
Japanese (ja)
Other versions
JPS58774A (ja
Inventor
Hisatoshi Shirasaka
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Shibaura Electric Co Ltd filed Critical Tokyo Shibaura Electric Co Ltd
Priority to JP56098854A priority Critical patent/JPS58774A/ja
Publication of JPS58774A publication Critical patent/JPS58774A/ja
Publication of JPH0311435B2 publication Critical patent/JPH0311435B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G06F11/263—Generation of test inputs, e.g. test vectors, patterns or sequences ; with adaptation of the tested hardware for testability with external testers

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
JP56098854A 1981-06-25 1981-06-25 高速パタ−ン発生器 Granted JPS58774A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56098854A JPS58774A (ja) 1981-06-25 1981-06-25 高速パタ−ン発生器

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56098854A JPS58774A (ja) 1981-06-25 1981-06-25 高速パタ−ン発生器

Publications (2)

Publication Number Publication Date
JPS58774A JPS58774A (ja) 1983-01-05
JPH0311435B2 true JPH0311435B2 (enrdf_load_html_response) 1991-02-15

Family

ID=14230811

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56098854A Granted JPS58774A (ja) 1981-06-25 1981-06-25 高速パタ−ン発生器

Country Status (1)

Country Link
JP (1) JPS58774A (enrdf_load_html_response)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60181810A (ja) * 1984-02-29 1985-09-17 Fujitsu Ltd 波形発生制御装置
JPH0255331U (enrdf_load_html_response) * 1988-10-11 1990-04-20
JP2602997B2 (ja) * 1991-01-18 1997-04-23 株式会社東芝 パターン発生器

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5552967A (en) * 1978-10-13 1980-04-17 Advantest Corp Pattern signal generator

Also Published As

Publication number Publication date
JPS58774A (ja) 1983-01-05

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