JPH025244B2 - - Google Patents

Info

Publication number
JPH025244B2
JPH025244B2 JP57042334A JP4233482A JPH025244B2 JP H025244 B2 JPH025244 B2 JP H025244B2 JP 57042334 A JP57042334 A JP 57042334A JP 4233482 A JP4233482 A JP 4233482A JP H025244 B2 JPH025244 B2 JP H025244B2
Authority
JP
Japan
Prior art keywords
flow path
dust
measured
ray
gas
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP57042334A
Other languages
English (en)
Japanese (ja)
Other versions
JPS58160807A (ja
Inventor
Someyoshi Arai
Masaki Mori
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
DKK TOA Corp
Original Assignee
DKK Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by DKK Corp filed Critical DKK Corp
Priority to JP4233482A priority Critical patent/JPS58160807A/ja
Publication of JPS58160807A publication Critical patent/JPS58160807A/ja
Publication of JPH025244B2 publication Critical patent/JPH025244B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/06—Investigating concentration of particle suspensions
    • G01N15/0606—Investigating concentration of particle suspensions by collecting particles on a support
    • G01N15/0618—Investigating concentration of particle suspensions by collecting particles on a support of the filter type

Landscapes

  • Chemical & Material Sciences (AREA)
  • Dispersion Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
JP4233482A 1982-03-17 1982-03-17 β線透過式粉塵計 Granted JPS58160807A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP4233482A JPS58160807A (ja) 1982-03-17 1982-03-17 β線透過式粉塵計

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4233482A JPS58160807A (ja) 1982-03-17 1982-03-17 β線透過式粉塵計

Publications (2)

Publication Number Publication Date
JPS58160807A JPS58160807A (ja) 1983-09-24
JPH025244B2 true JPH025244B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1990-02-01

Family

ID=12633104

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4233482A Granted JPS58160807A (ja) 1982-03-17 1982-03-17 β線透過式粉塵計

Country Status (1)

Country Link
JP (1) JPS58160807A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010531979A (ja) * 2007-07-03 2010-09-30 ウーハン・チャンホン・インスツルメンツ・カンパニー・リミテッド β線煙塵濃度測定装置およびそれに用いられる試料の有効性確認方法

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61241640A (ja) * 1985-04-19 1986-10-27 Denki Kagaku Keiki Co Ltd ろ過捕集形粒子状物質濃度測定方法及びその装置
CN104359816A (zh) * 2014-11-19 2015-02-18 武汉怡特环保科技有限公司 β射线大气颗粒物监测装置
CN105043822B (zh) * 2014-12-31 2018-03-27 江苏天瑞仪器股份有限公司 一种大气颗粒物采集测量装置
CN109164118B (zh) * 2018-08-08 2022-04-05 北京雪迪龙科技股份有限公司 一种β吸收式测尘仪的定标系统及其方法
CN112098285B (zh) * 2020-09-10 2021-04-06 天津同阳科技发展有限公司 基于β射线法的挥发性颗粒物补偿测量装置及方法

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS625647Y2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) * 1978-03-15 1987-02-09

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010531979A (ja) * 2007-07-03 2010-09-30 ウーハン・チャンホン・インスツルメンツ・カンパニー・リミテッド β線煙塵濃度測定装置およびそれに用いられる試料の有効性確認方法

Also Published As

Publication number Publication date
JPS58160807A (ja) 1983-09-24

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