JPH024137B2 - - Google Patents

Info

Publication number
JPH024137B2
JPH024137B2 JP56063000A JP6300081A JPH024137B2 JP H024137 B2 JPH024137 B2 JP H024137B2 JP 56063000 A JP56063000 A JP 56063000A JP 6300081 A JP6300081 A JP 6300081A JP H024137 B2 JPH024137 B2 JP H024137B2
Authority
JP
Japan
Prior art keywords
semiconductor layer
forming
mask pattern
pattern
layer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP56063000A
Other languages
English (en)
Japanese (ja)
Other versions
JPS57177572A (en
Inventor
Kenichi Kikuchi
Toshiki Ehata
Hideki Hayashi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sumitomo Electric Industries Ltd
Original Assignee
Sumitomo Electric Industries Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sumitomo Electric Industries Ltd filed Critical Sumitomo Electric Industries Ltd
Priority to JP6300081A priority Critical patent/JPS57177572A/ja
Priority to EP82300499A priority patent/EP0057605B1/de
Priority to DE8282300499T priority patent/DE3273695D1/de
Publication of JPS57177572A publication Critical patent/JPS57177572A/ja
Publication of JPH024137B2 publication Critical patent/JPH024137B2/ja
Granted legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/66Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/66007Multistep manufacturing processes
    • H01L29/66075Multistep manufacturing processes of devices having semiconductor bodies comprising group 14 or group 13/15 materials
    • H01L29/66227Multistep manufacturing processes of devices having semiconductor bodies comprising group 14 or group 13/15 materials the devices being controllable only by the electric current supplied or the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched, e.g. three-terminal devices
    • H01L29/66409Unipolar field-effect transistors
    • H01L29/66848Unipolar field-effect transistors with a Schottky gate, i.e. MESFET
    • H01L29/66856Unipolar field-effect transistors with a Schottky gate, i.e. MESFET with an active layer made of a group 13/15 material
    • H01L29/66863Lateral single gate transistors
    • H01L29/66871Processes wherein the final gate is made after the formation of the source and drain regions in the active layer, e.g. dummy-gate processes
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/02Semiconductor bodies ; Multistep manufacturing processes therefor
    • H01L29/06Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions
    • H01L29/10Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions with semiconductor regions connected to an electrode not carrying current to be rectified, amplified or switched and such electrode being part of a semiconductor device which comprises three or more electrodes
    • H01L29/1025Channel region of field-effect devices
    • H01L29/1029Channel region of field-effect devices of field-effect transistors
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/40Electrodes ; Multistep manufacturing processes therefor
    • H01L29/43Electrodes ; Multistep manufacturing processes therefor characterised by the materials of which they are formed
    • H01L29/47Schottky barrier electrodes
    • H01L29/475Schottky barrier electrodes on AIII-BV compounds
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/66Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/66007Multistep manufacturing processes
    • H01L29/66075Multistep manufacturing processes of devices having semiconductor bodies comprising group 14 or group 13/15 materials
    • H01L29/66227Multistep manufacturing processes of devices having semiconductor bodies comprising group 14 or group 13/15 materials the devices being controllable only by the electric current supplied or the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched, e.g. three-terminal devices
    • H01L29/66409Unipolar field-effect transistors
    • H01L29/66848Unipolar field-effect transistors with a Schottky gate, i.e. MESFET
    • H01L29/66856Unipolar field-effect transistors with a Schottky gate, i.e. MESFET with an active layer made of a group 13/15 material
    • H01L29/66863Lateral single gate transistors
    • H01L29/66878Processes wherein the final gate is made before the formation, e.g. activation anneal, of the source and drain regions in the active layer
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/66Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/68Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
    • H01L29/76Unipolar devices, e.g. field effect transistors
    • H01L29/772Field effect transistors
    • H01L29/80Field effect transistors with field effect produced by a PN or other rectifying junction gate, i.e. potential-jump barrier
    • H01L29/812Field effect transistors with field effect produced by a PN or other rectifying junction gate, i.e. potential-jump barrier with a Schottky gate

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Ceramic Engineering (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Manufacturing & Machinery (AREA)
  • Junction Field-Effect Transistors (AREA)
JP6300081A 1981-01-29 1981-04-24 Field effect transistor and manufacture thereof Granted JPS57177572A (en)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP6300081A JPS57177572A (en) 1981-04-24 1981-04-24 Field effect transistor and manufacture thereof
EP82300499A EP0057605B1 (de) 1981-01-29 1982-01-29 Schottky-Gate-Feldeffekttransistor und Verfahren zu seiner Herstellung
DE8282300499T DE3273695D1 (en) 1981-01-29 1982-01-29 A schottky-barrier gate field effect transistor and a process for the production of the same

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6300081A JPS57177572A (en) 1981-04-24 1981-04-24 Field effect transistor and manufacture thereof

Publications (2)

Publication Number Publication Date
JPS57177572A JPS57177572A (en) 1982-11-01
JPH024137B2 true JPH024137B2 (de) 1990-01-26

Family

ID=13216609

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6300081A Granted JPS57177572A (en) 1981-01-29 1981-04-24 Field effect transistor and manufacture thereof

Country Status (1)

Country Link
JP (1) JPS57177572A (de)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007204913A (ja) * 2006-02-02 2007-08-16 Groz Beckert Kg 編物システムのためのシステム構成要素とその取り扱い方法

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1816247B1 (de) 2006-02-02 2008-11-26 Groz-Beckert KG Systemteil für ein Stricksystem und Handhabungsverfahren

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5012985A (de) * 1973-06-01 1975-02-10
JPS535581A (en) * 1976-07-06 1978-01-19 Toshiba Corp Schottky gate type field effect transistor
JPS53143177A (en) * 1977-05-20 1978-12-13 Hitachi Ltd Production of field effect transistor

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5012985A (de) * 1973-06-01 1975-02-10
JPS535581A (en) * 1976-07-06 1978-01-19 Toshiba Corp Schottky gate type field effect transistor
JPS53143177A (en) * 1977-05-20 1978-12-13 Hitachi Ltd Production of field effect transistor

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007204913A (ja) * 2006-02-02 2007-08-16 Groz Beckert Kg 編物システムのためのシステム構成要素とその取り扱い方法

Also Published As

Publication number Publication date
JPS57177572A (en) 1982-11-01

Similar Documents

Publication Publication Date Title
US4343082A (en) Method of making contact electrodes to silicon gate, and source and drain regions, of a semiconductor device
JPS63263770A (ja) GaAs MESFET及びその製造方法
JPH048943B2 (de)
US4601095A (en) Process for fabricating a Schottky-barrier gate field effect transistor
USRE32613E (en) Method of making contact electrodes to silicon gate, and source and drain regions, of a semiconductor device
JPH024137B2 (de)
GB2074374A (en) Method of making field effect transistors
JPH03101169A (ja) 半導体デバイス作製方法
JPS58124276A (ja) シヨツトキゲ−ト電界効果トランジスタおよびその製造方法
US4694563A (en) Process for making Schottky-barrier gate FET
US4621415A (en) Method for manufacturing low resistance sub-micron gate Schottky barrier devices
JPS6034073A (ja) ショットキ−ゲ−ト型電界効果トランジスタの製造方法
US5888890A (en) Method of manufacturing field effect transistor
JPS58123778A (ja) シヨツトキゲ−ト電界効果トランジスタとその製造方法
JPS58123777A (ja) シヨツトキゲ−ト電界効果トランジスタとその製造方法
JPS6336151B2 (de)
JP2707436B2 (ja) 電界効果トランジスタの製造方法
JPH0434821B2 (de)
JPS6086871A (ja) 電界効果トランジスタの製造方法
JPS6347982A (ja) 半導体装置
JPS61265870A (ja) 電界効果トランジスタの製造方法
JPS58124277A (ja) シヨツトキゲ−ト型電界効果トランジスタの製造方法
JPH0439772B2 (de)
JPH0797634B2 (ja) 電界効果トランジスタとその製造方法
JPS6260269A (ja) 電界効果トランジスタの製造方法