JPH0238901B2 - - Google Patents

Info

Publication number
JPH0238901B2
JPH0238901B2 JP59016965A JP1696584A JPH0238901B2 JP H0238901 B2 JPH0238901 B2 JP H0238901B2 JP 59016965 A JP59016965 A JP 59016965A JP 1696584 A JP1696584 A JP 1696584A JP H0238901 B2 JPH0238901 B2 JP H0238901B2
Authority
JP
Japan
Prior art keywords
molten metal
particulate
molten steel
fine particles
gas
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP59016965A
Other languages
English (en)
Japanese (ja)
Other versions
JPS60162943A (ja
Inventor
Akihiro Ono
Koichi Chiba
Masao Saeki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Steel Corp
Original Assignee
Nippon Steel Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Steel Corp filed Critical Nippon Steel Corp
Priority to JP1696584A priority Critical patent/JPS60162943A/ja
Publication of JPS60162943A publication Critical patent/JPS60162943A/ja
Publication of JPH0238901B2 publication Critical patent/JPH0238901B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/71—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited
    • G01N21/73—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited using plasma burners or torches

Landscapes

  • Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Plasma & Fusion (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
JP1696584A 1984-02-03 1984-02-03 蒸発微粒子回収溶融金属分析方法および装置 Granted JPS60162943A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1696584A JPS60162943A (ja) 1984-02-03 1984-02-03 蒸発微粒子回収溶融金属分析方法および装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1696584A JPS60162943A (ja) 1984-02-03 1984-02-03 蒸発微粒子回収溶融金属分析方法および装置

Publications (2)

Publication Number Publication Date
JPS60162943A JPS60162943A (ja) 1985-08-24
JPH0238901B2 true JPH0238901B2 (enrdf_load_stackoverflow) 1990-09-03

Family

ID=11930808

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1696584A Granted JPS60162943A (ja) 1984-02-03 1984-02-03 蒸発微粒子回収溶融金属分析方法および装置

Country Status (1)

Country Link
JP (1) JPS60162943A (enrdf_load_stackoverflow)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3001648U (ja) * 1994-03-03 1994-09-06 平野産業株式会社 スリッパ

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4730925A (en) * 1985-09-20 1988-03-15 Nippon Steel Corporation Method of spectroscopically determining the composition of molten iron

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS562965B2 (enrdf_load_stackoverflow) * 1973-07-31 1981-01-22
JPS5890152A (ja) * 1981-11-25 1983-05-28 Nippon Steel Corp 小形状金属試料の直接発光分光分析方法及び装置

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3001648U (ja) * 1994-03-03 1994-09-06 平野産業株式会社 スリッパ

Also Published As

Publication number Publication date
JPS60162943A (ja) 1985-08-24

Similar Documents

Publication Publication Date Title
Zhang et al. Direct lead isotope analysis in Hg-rich sulfides by LA-MC-ICP-MS with a gas exchange device and matrix-matched calibration
US5671045A (en) Microwave plasma monitoring system for the elemental composition analysis of high temperature process streams
Darke et al. Review of solid sample introduction for plasma spectrometry and a comparison of results for laser ablation, electrothermal vaporization, and slurry nebulization
US4730925A (en) Method of spectroscopically determining the composition of molten iron
JPH0238901B2 (enrdf_load_stackoverflow)
Hu et al. Slurry sample introduction with fluorinating electrothermal vaporization for the direct ICP-AES determination of boron in plant leaves
JPH0215816B2 (enrdf_load_stackoverflow)
JPH0215817B2 (enrdf_load_stackoverflow)
Ohls Sample introduction into ICP-OES for metallic samples
Coedo et al. Spark ablation as sampling device for inductively coupled plasma mass spectrometric analysis of low-alloyed steels
JPS60219538A (ja) 不活性ガス吹き込み微粒子回収溶融金属分析方法および装置
JP2000028580A (ja) 金属試料中の元素分析装置
JPS5890150A (ja) 小形状金属試料のプラズマア−ク直接溶解発光分光分析方法及び装置
JPS63243872A (ja) 超音波振動微粒子生成による溶融金属の直接分析方法及び装置
JPS5890152A (ja) 小形状金属試料の直接発光分光分析方法及び装置
JP2708236B2 (ja) 金属試料中の微量炭素，硫黄，燐の分析方法
JPH0149891B2 (enrdf_load_stackoverflow)
JPS59157541A (ja) 微粒子生成プラズマ発光分光法による溶融金属の直接分析装置
ABANADES et al. oUENTIN FALCOz" DANIEL GAUTHIER
JPS6267430A (ja) 溶鉄成分の分光分析方法
JPH035548B2 (enrdf_load_stackoverflow)
JPH0726952B2 (ja) 金属試料中の微量炭素，硫黄，燐の分析方法およびその装置
JPS63243871A (ja) 上下可動式超音波振動微粒子生成による溶融金属の直接分析方法及び装置
JPS5890151A (ja) 大形金属材の直接発光分光分析装置
Trassy et al. Continuous monitoring of metal volatilisation in a plasma furnace by inductively coupled plasma emission spectrometry