JPH0237533B2 - - Google Patents

Info

Publication number
JPH0237533B2
JPH0237533B2 JP57058621A JP5862182A JPH0237533B2 JP H0237533 B2 JPH0237533 B2 JP H0237533B2 JP 57058621 A JP57058621 A JP 57058621A JP 5862182 A JP5862182 A JP 5862182A JP H0237533 B2 JPH0237533 B2 JP H0237533B2
Authority
JP
Japan
Prior art keywords
linear
linear sensor
straight line
pattern
parallel straight
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP57058621A
Other languages
English (en)
Japanese (ja)
Other versions
JPS58174825A (ja
Inventor
Hiroshi Tamaki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tokyo Optical Co Ltd
Original Assignee
Tokyo Optical Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Optical Co Ltd filed Critical Tokyo Optical Co Ltd
Priority to JP57058621A priority Critical patent/JPS58174825A/ja
Publication of JPS58174825A publication Critical patent/JPS58174825A/ja
Publication of JPH0237533B2 publication Critical patent/JPH0237533B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/02Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/024Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by means of diode-array scanning

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Facsimile Scanning Arrangements (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
JP57058621A 1982-04-08 1982-04-08 リニアセンサの配置関係を検出する方法及びその装置 Granted JPS58174825A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57058621A JPS58174825A (ja) 1982-04-08 1982-04-08 リニアセンサの配置関係を検出する方法及びその装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57058621A JPS58174825A (ja) 1982-04-08 1982-04-08 リニアセンサの配置関係を検出する方法及びその装置

Publications (2)

Publication Number Publication Date
JPS58174825A JPS58174825A (ja) 1983-10-13
JPH0237533B2 true JPH0237533B2 (enrdf_load_stackoverflow) 1990-08-24

Family

ID=13089635

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57058621A Granted JPS58174825A (ja) 1982-04-08 1982-04-08 リニアセンサの配置関係を検出する方法及びその装置

Country Status (1)

Country Link
JP (1) JPS58174825A (enrdf_load_stackoverflow)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60210236A (ja) * 1984-04-04 1985-10-22 キヤノン株式会社 眼屈折力測定装置
JPS63274830A (ja) * 1987-05-06 1988-11-11 Mitsubishi Heavy Ind Ltd 光学的軸捩計

Also Published As

Publication number Publication date
JPS58174825A (ja) 1983-10-13

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