JPH023295A - Q-switch solid-state laser oscillated by continuously excited - Google Patents
Q-switch solid-state laser oscillated by continuously excitedInfo
- Publication number
- JPH023295A JPH023295A JP63149942A JP14994288A JPH023295A JP H023295 A JPH023295 A JP H023295A JP 63149942 A JP63149942 A JP 63149942A JP 14994288 A JP14994288 A JP 14994288A JP H023295 A JPH023295 A JP H023295A
- Authority
- JP
- Japan
- Prior art keywords
- switch
- total reflection
- reflection mirror
- signal
- alarm
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000001514 detection method Methods 0.000 claims abstract description 9
- 230000005284 excitation Effects 0.000 claims abstract description 9
- 230000010355 oscillation Effects 0.000 claims description 15
- 230000007257 malfunction Effects 0.000 claims description 9
- 230000003287 optical effect Effects 0.000 abstract description 3
- 230000005764 inhibitory process Effects 0.000 abstract description 2
- 238000010586 diagram Methods 0.000 description 5
- 230000007547 defect Effects 0.000 description 3
- 238000003754 machining Methods 0.000 description 2
- 241000288105 Grus Species 0.000 description 1
- 230000002238 attenuated effect Effects 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
- H01S3/10—Controlling the intensity, frequency, phase, polarisation or direction of the emitted radiation, e.g. switching, gating, modulating or demodulating
- H01S3/11—Mode locking; Q-switching; Other giant-pulse techniques, e.g. cavity dumping
- H01S3/1123—Q-switching
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
- H01S3/10—Controlling the intensity, frequency, phase, polarisation or direction of the emitted radiation, e.g. switching, gating, modulating or demodulating
- H01S3/13—Stabilisation of laser output parameters, e.g. frequency or amplitude
- H01S3/131—Stabilisation of laser output parameters, e.g. frequency or amplitude by controlling the active medium, e.g. by controlling the processes or apparatus for excitation
- H01S3/1312—Stabilisation of laser output parameters, e.g. frequency or amplitude by controlling the active medium, e.g. by controlling the processes or apparatus for excitation by controlling the optical pumping
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S2301/00—Functional characteristics
- H01S2301/02—ASE (amplified spontaneous emission), noise; Reduction thereof
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
- H01S3/0014—Monitoring arrangements not otherwise provided for
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
- H01S3/09—Processes or apparatus for excitation, e.g. pumping
- H01S3/091—Processes or apparatus for excitation, e.g. pumping using optical pumping
- H01S3/0915—Processes or apparatus for excitation, e.g. pumping using optical pumping by incoherent light
- H01S3/092—Processes or apparatus for excitation, e.g. pumping using optical pumping by incoherent light of flash lamp
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
- H01S3/10—Controlling the intensity, frequency, phase, polarisation or direction of the emitted radiation, e.g. switching, gating, modulating or demodulating
- H01S3/13—Stabilisation of laser output parameters, e.g. frequency or amplitude
- H01S3/136—Stabilisation of laser output parameters, e.g. frequency or amplitude by controlling devices placed within the cavity
Landscapes
- Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- Engineering & Computer Science (AREA)
- Plasma & Fusion (AREA)
- Optics & Photonics (AREA)
- Lasers (AREA)
Abstract
Description
【発明の詳細な説明】
〔産業上の利用分野〕
本発明は連続励起Ｑスイッチ発振固体レーザに関するも
のである。DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a continuously pumped Q-switched oscillation solid-state laser.
連続励起Ｑスイッチ発振固体レーデは、出力反射鏡と全
反射鏡の間に固体レーザ材料に直列にＱスイッチ素子を
設けたレーデ発振装置であって。A continuous pump Q-switched oscillation solid-state radar is a radar oscillation device in which a Q-switched element is provided in series with a solid-state laser material between an output reflecting mirror and a total reflecting mirror.
Ｑスイッチ・ぐルスの尖頭値が高く、またレーデのオン
・オフ制御を高速で行えることから、レーザトリマ等の
精密加工分野へ広く実用化されている。Because the peak value of the Q-switch/Grus is high and the radar can be controlled on and off at high speed, it is widely used in precision processing fields such as laser trimmers.
上述した従来の連続励起Ｑスイッチレーザにおいては、
Ｑスイッチ素子およびこれを駆動するＱスイッチドライ
バーの一方又は両方が動作不良となり、Ｑスイッチ・ぐ
ルスの出力が低下しても、これを検出する手段がないた
め、Ｑスイッチ動作不良のまま使われていた。そのため
加工に必要なレーザ出力が得られず、加工不良が生じて
はじめてＱスイッチ動作不良であることが判明するとい
う状態であった。In the conventional continuously pumped Q-switched laser described above,
Even if one or both of the Q-switch element and the Q-switch driver that drives it become malfunctioning, and the output of the Q-switch/Gurus decreases, there is no way to detect this, so the Q-switch is used with the malfunction. was. Therefore, the laser output necessary for processing could not be obtained, and it was not until a processing defect occurred that it was revealed that the Q switch was malfunctioning.
したがって本発明はＱスイッチの動作の不良を検出でき
る連続励起Ｑスイッチ発振固体レーデ装置を提供しよう
とするものである。Therefore, it is an object of the present invention to provide a continuous excitation Q-switch oscillation solid-state radar device that can detect malfunctions of Q-switches.
本発明はＱスイッチ素子またはＱスイッチドライバーの
不良によってＱスイッチＯＦＦ時のレーデ発振抑止能力
が低下した時に生ずる微弱レーザ力（もれ光という）を
検出し、Ｑスイッチ動作不良の警報を出すとともに、レ
ーデ発振を停止させるようにしたものである。The present invention detects the weak laser power (referred to as leakage light) that occurs when the ability to suppress radar oscillation when the Q switch is OFF is reduced due to a defect in the Q switch element or Q switch driver, and issues an alarm for Q switch malfunction. This is designed to stop Rade oscillation.
すなわち本発明の連続励起Ｑスイッチ発振固体続励起Ｑ
スイッチ発振レーデ装置において、前記全反射鏡の外側
に同軸に配置され、該全反射鏡を通しての漏洩レーデ光
を検出するディテクタと。That is, the continuous excitation Q switch oscillation solid-state continuous excitation Q of the present invention
In the switched oscillation radar device, a detector is disposed coaxially outside the total reflection mirror and detects leaked radar light passing through the total reflection mirror.
このディテクタの出力信号が所定の値よシ犬きくなる−
と該レーデ装置の発振を停止させると共に警報を発する
手段とから成るＱスイッチ動作不良検出機構を付加して
成ることを特徴とするものである。The output signal of this detector becomes louder than a predetermined value.
The present invention is characterized by the addition of a Q-switch malfunction detection mechanism consisting of means for stopping oscillation of the radar device and issuing an alarm.
以下余白 〔実施例〕 次に本発明について図面を参照して説明する。Margin below 〔Example〕 Next, the present invention will be explained with reference to the drawings.
第１図は本発明の一実施例の概略図であり、第２図は本
発明の装置の動作タイミングを示す図である。FIG. 1 is a schematic diagram of an embodiment of the present invention, and FIG. 2 is a diagram showing the operation timing of the apparatus of the present invention.
励起ランフ’２５で励起される固体レーザ材料１２は、
全反射鏡１１及び出力反射鏡１４で構成されるレーザ共
振器中におかれている。またＱスイッチ素子１３も共振
器中におかれ、レーデ出力を・ぞルス発振化している。The solid-state laser material 12 excited by the excitation ramp '25 is
It is placed in a laser resonator composed of a total reflection mirror 11 and an output reflection mirror 14. A Q-switch element 13 is also placed in the resonator to make the radar output oscillate.
全反射鏡１１の後方には光学アッテネータ２６を置き、
全反射鏡１１からもれがあったときこれを減衰させ、デ
ィテクタ２１に入射させる。ディテクタ２１の出力信号
はオぜアンｆ２２で増幅し、ダート回路２４に入力する
。An optical attenuator 26 is placed behind the total reflection mirror 11,
When there is leakage from the total reflection mirror 11, it is attenuated and made incident on the detector 21. The output signal of the detector 21 is amplified by the amplifier f22 and input to the dart circuit 24.
一方タイミング回路１８にはＱスイッチドライバエ５か
らのパルス繰シ返し信号ａが入力され。On the other hand, the pulse repetition signal a from the Q switch driver 5 is input to the timing circuit 18.
コ／・ぐレータ検出禁止信号すを出力する。このコン・
ぞレータ検出禁止信号すはダート回路２４とコンパレー
タ２０に入力し、Ｑスイッチパルス発振時にはＱスイッ
チ動作不良検出を行わないよう制御している。Outputs the co/glarator detection inhibition signal. This con-
The sensor detection prohibition signal is input to the dart circuit 24 and the comparator 20, and is controlled so as not to detect a Q switch malfunction during Q switch pulse oscillation.
コンパレータ２０はレベル調整ｉ ２３ ｆセットされ
たレベル８以上の信号が入力した時にのみアラーム回路
１９に信号ｄを出力する。アラーム回路１９はコンパレ
ータ回路２０からの信号ｄをホールドし、出力信号ｅに
よシ警報ブザー１７を鳴らし励起ランプ電源１６を停止
させる。The comparator 20 outputs the signal d to the alarm circuit 19 only when a signal of level 8 or higher, which is set in the level adjustment i 23 f, is input. The alarm circuit 19 holds the signal d from the comparator circuit 20, and uses the output signal e to sound the alarm buzzer 17 and stop the excitation lamp power supply 16.
第２図の横軸は時間を、縦軸は信号強度を相対的に表わ
したものである。Ｑスイッチ繰り返し信号ａは通常はハ
イレベルであって、Ｑスイッチ・にルス発生時間だけロ
ーレベルになって・ぐルスを発生させる。このＱスイッ
チ繰り返し信号ａはパルス幅数μｓ２周期数百μＳ〜数
ｍ３で使用するのが適当である。In FIG. 2, the horizontal axis represents time, and the vertical axis represents relative signal strength. The Q-switch repetition signal a is normally at a high level, and becomes low level only during the pulse generation time in the Q-switch to generate a pulse. It is appropriate to use this Q-switch repetition signal a with a pulse width of several μs and a period of several hundred μS to several m3.
検出禁止信号すはコンパレータ２０のコンパレート動作
を行なわすか行なわせないかを制御する信号で、Ｑスイ
ッチノ’？ルスＣが出力する時はローレベルとなってコ
ン・やレータ２０を禁止する。したがってコンパレータ
レベル２０２よりもレベルの高いＱスイッチ・ぐルスで
もコンパレータ回路２０は検出を行わない。Ｑスイッチ
発振が終シ。The detection prohibition signal is a signal that controls whether the comparator 20 performs the comparison operation or not. When the pulse C outputs, it becomes a low level and inhibits the converter 20. Therefore, even if the Q-switch signal has a higher level than the comparator level 202, the comparator circuit 20 does not perform detection. Q switch oscillation has ended.
反転分布のエネルギーがレーデ共振器の損失を越えもれ
光が発生するまでには数十μ秒の時間おくれがあるので
、この時間内にコンノＰレータヲ検出可能状態にする。Since there is a time lag of several tens of microseconds before the energy of the population inversion exceeds the loss of the Rade resonator and leakage light is generated, the controller is brought into a detectable state within this time.
コンパレータ２０は、検出禁止信号すがハイレベルとな
るフン・ンレート開始時間２０３から検出ヲハシめ、コ
ンノぐレートレベル２ｏ２よりも出力の高いもれ光２０
１があるとこれを検出し、出力ｄをハイレベルにする。The comparator 20 stops detecting the leakage light 20 whose output is higher than the detection rate level 2o2 from the start time 203 when the detection prohibition signal becomes high level.
If there is a 1, it is detected and the output d is set to high level.
アラーム出力ｅはコンパレート回路の出力ｄをホールド
し出力する。The alarm output e holds and outputs the output d of the comparator circuit.
以上説明したように本発明は、Ｑスイッチパルスの検出
は行うことなく、ＱスイッチＯＦＦ時にＱスイッチ動作
不良により生じたもれ光だけを検出して警報を出すこと
ができる。したがってこれを加工用レーザ装置に応用し
た場合、Ｑスイッチ動作不良による加工不良を未然にふ
せぐことかできる効果がある。As described above, the present invention can issue an alarm by detecting only the leakage light caused by a Q-switch malfunction when the Q-switch is OFF, without detecting the Q-switch pulse. Therefore, when this is applied to a laser device for machining, it is effective in preventing machining defects due to malfunction of the Q switch.
第１図は本発明の構成を示すブロック図、第２図は第１
図の装置の動作のタイミングをあられす図である。
記号の説明＝１１は全反射鏡、１２は固体レーザ材料、
１３はＱスイッチ素子、１４は出力反射鏡、１５はＱス
イッチドライバ、１６は励起ランプ電源、１７は警報ブ
ザ−１８はタイミング回路、１９はアラーム回路、２０
はコン・ぞレータ。
２１はディテクタ、２２はオ（アンプ、２３はレベル調
整器、２４はダート回路、２５は励起ランプ、２６は光
学アッテネータ、２７はＱスイッチ動作不良検出器、２
０１はもれ光をそれぞれあられしている。Figure 1 is a block diagram showing the configuration of the present invention, and Figure 2 is a block diagram showing the configuration of the present invention.
FIG. 3 is a diagram showing the timing of the operation of the device shown in FIG. Explanation of symbols = 11 is a total reflection mirror, 12 is a solid-state laser material,
13 is a Q switch element, 14 is an output reflector, 15 is a Q switch driver, 16 is an excitation lamp power supply, 17 is an alarm buzzer, 18 is a timing circuit, 19 is an alarm circuit, 20
Hakon zoreta. 21 is a detector, 22 is an amplifier, 23 is a level adjuster, 24 is a dirt circuit, 25 is an excitation lamp, 26 is an optical attenuator, 27 is a Q switch malfunction detector, 2
01 is raining leaking light.
Claims (1)
スイッチ素子が同軸に配置された連続励起Ｑスイッチ発
振レーザ装置において、前記全反射鏡の外側に同軸に配
置され、該全反射鏡を通しての漏洩レーザ光を検出する
ディテクタと、このディテクタの出力信号が所定の値よ
り大きくなると該レーザ装置の発振を停止させると共に
警報を発する手段とから成るＱスイッチ動作不良検出機
構を付加して成ることを特徴とする連続励起Ｑスイッチ
発振固体レーザ。1. Solid-state laser material and Q between the output reflecting mirror and the total reflecting mirror
In a continuously pumped Q-switched oscillation laser device in which a switch element is coaxially arranged, a detector is disposed coaxially outside the total reflection mirror and detects leaked laser light passing through the total reflection mirror, and an output signal of this detector is arranged coaxially outside the total reflection mirror. 1. A continuously pumped Q-switch oscillation solid-state laser, characterized in that the continuous excitation Q-switch oscillation solid-state laser is further equipped with a Q-switch malfunction detection mechanism comprising means for stopping oscillation of the laser device and issuing an alarm when the value exceeds a predetermined value.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP63149942A JPH0797681B2 (en) | 1988-06-20 | 1988-06-20 | Continuously pumped Q-switched solid-state laser |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP63149942A JPH0797681B2 (en) | 1988-06-20 | 1988-06-20 | Continuously pumped Q-switched solid-state laser |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH023295A true JPH023295A (en) | 1990-01-08 |
| JPH0797681B2 JPH0797681B2 (en) | 1995-10-18 |
Family
ID=15485941
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP63149942A Expired - Lifetime JPH0797681B2 (en) | 1988-06-20 | 1988-06-20 | Continuously pumped Q-switched solid-state laser |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0797681B2 (en) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP2257390B1 (en) | 2008-03-05 | 2012-01-04 | Southwire Company | Ultrasound probe with protective niobium layer |
| PL3071718T3 (en) | 2013-11-18 | 2020-02-28 | Southwire Company, Llc | Ultrasonic probes with gas outlets for degassing of molten metals |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS49149681U (en) * | 1973-04-25 | 1974-12-25 |
-
1988
- 1988-06-20 JP JP63149942A patent/JPH0797681B2/en not_active Expired - Lifetime
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS49149681U (en) * | 1973-04-25 | 1974-12-25 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0797681B2 (en) | 1995-10-18 |
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