JPH0227488Y2 - - Google Patents
Info
- Publication number
- JPH0227488Y2 JPH0227488Y2 JP1982163995U JP16399582U JPH0227488Y2 JP H0227488 Y2 JPH0227488 Y2 JP H0227488Y2 JP 1982163995 U JP1982163995 U JP 1982163995U JP 16399582 U JP16399582 U JP 16399582U JP H0227488 Y2 JPH0227488 Y2 JP H0227488Y2
- Authority
- JP
- Japan
- Prior art keywords
- sample
- axis
- rotation
- moving
- stage
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP16399582U JPS5967850U (ja) | 1982-10-29 | 1982-10-29 | 試料移動装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP16399582U JPS5967850U (ja) | 1982-10-29 | 1982-10-29 | 試料移動装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5967850U JPS5967850U (ja) | 1984-05-08 |
| JPH0227488Y2 true JPH0227488Y2 (enrdf_load_html_response) | 1990-07-25 |
Family
ID=30359663
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP16399582U Granted JPS5967850U (ja) | 1982-10-29 | 1982-10-29 | 試料移動装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5967850U (enrdf_load_html_response) |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS53109471A (en) * | 1977-03-07 | 1978-09-25 | Hitachi Ltd | Test piece fine adjuster |
| JPS5413765A (en) * | 1977-07-04 | 1979-02-01 | Jeol Ltd | Sample slanting equipment of scanning electron microscope or the like |
-
1982
- 1982-10-29 JP JP16399582U patent/JPS5967850U/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5967850U (ja) | 1984-05-08 |
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