JPH0226721B2 - - Google Patents

Info

Publication number
JPH0226721B2
JPH0226721B2 JP57173034A JP17303482A JPH0226721B2 JP H0226721 B2 JPH0226721 B2 JP H0226721B2 JP 57173034 A JP57173034 A JP 57173034A JP 17303482 A JP17303482 A JP 17303482A JP H0226721 B2 JPH0226721 B2 JP H0226721B2
Authority
JP
Japan
Prior art keywords
liner thickness
liner
impedance
coil
lift
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP57173034A
Other languages
English (en)
Japanese (ja)
Other versions
JPS5967405A (ja
Inventor
Takahide Sakamoto
Tatsuo Hiroshima
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Steel Corp
Original Assignee
Sumitomo Metal Industries Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sumitomo Metal Industries Ltd filed Critical Sumitomo Metal Industries Ltd
Priority to JP57173034A priority Critical patent/JPS5967405A/ja
Priority to CA000437598A priority patent/CA1237773A/en
Priority to DE3335080A priority patent/DE3335080C2/de
Priority to US06/536,496 priority patent/US4673877A/en
Priority to SE8305277A priority patent/SE460309B/sv
Priority to FR8315587A priority patent/FR2534015B1/fr
Publication of JPS5967405A publication Critical patent/JPS5967405A/ja
Publication of JPH0226721B2 publication Critical patent/JPH0226721B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/02—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness
    • G01B7/06—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness
    • G01B7/10—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness using magnetic means, e.g. by measuring change of reluctance
    • G01B7/105—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness using magnetic means, e.g. by measuring change of reluctance for measuring thickness of coating
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21C—NUCLEAR REACTORS
    • G21C17/00—Monitoring; Testing ; Maintaining
    • G21C17/06—Devices or arrangements for monitoring or testing fuel or fuel elements outside the reactor core, e.g. for burn-up, for contamination
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E30/00—Energy generation of nuclear origin
    • Y02E30/30—Nuclear fission reactors

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • General Engineering & Computer Science (AREA)
  • High Energy & Nuclear Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
JP57173034A 1982-09-30 1982-09-30 ライナ厚測定方法 Granted JPS5967405A (ja)

Priority Applications (6)

Application Number Priority Date Filing Date Title
JP57173034A JPS5967405A (ja) 1982-09-30 1982-09-30 ライナ厚測定方法
CA000437598A CA1237773A (en) 1982-09-30 1983-09-26 Zirconium liner thickness measuring method and an apparatus therefor for a zirconium alloy tube
DE3335080A DE3335080C2 (de) 1982-09-30 1983-09-28 Für ein Zirkoniumslegierungsrohr vorgesehenes Verfahren zur Messung der Dicke eines Zirkonium-Futterrohres und eine Vorrichtung für diese Methode
US06/536,496 US4673877A (en) 1982-09-30 1983-09-28 Zirconium liner thickness measuring method and an apparatus therefor for a zirconium alloy tube
SE8305277A SE460309B (sv) 1982-09-30 1983-09-29 Saett att maeta tjockleken av ett zirkoniumfoder samt anordning foer utfoerande av saettet
FR8315587A FR2534015B1 (fr) 1982-09-30 1983-09-30 Procede et appareil de mesure de l'epaisseur d'un revetement de zirconium sur un tube en alliage de zirconium

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57173034A JPS5967405A (ja) 1982-09-30 1982-09-30 ライナ厚測定方法

Publications (2)

Publication Number Publication Date
JPS5967405A JPS5967405A (ja) 1984-04-17
JPH0226721B2 true JPH0226721B2 (en, 2012) 1990-06-12

Family

ID=15952966

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57173034A Granted JPS5967405A (ja) 1982-09-30 1982-09-30 ライナ厚測定方法

Country Status (6)

Country Link
US (1) US4673877A (en, 2012)
JP (1) JPS5967405A (en, 2012)
CA (1) CA1237773A (en, 2012)
DE (1) DE3335080C2 (en, 2012)
FR (1) FR2534015B1 (en, 2012)
SE (1) SE460309B (en, 2012)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH03129718U (en, 2012) * 1990-04-09 1991-12-26

Families Citing this family (50)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5967405A (ja) * 1982-09-30 1984-04-17 Sumitomo Metal Ind Ltd ライナ厚測定方法
JPS6138404A (ja) * 1984-07-30 1986-02-24 Kobe Steel Ltd ライナ−被覆管のライナ−層厚・ジルカロイ厚測定法
JPS6138403A (ja) * 1984-07-30 1986-02-24 Kobe Steel Ltd ライナ−被覆管のライナ−層厚・ジルカロイ厚の測定法
JPS6193901A (ja) * 1984-10-15 1986-05-12 Kobe Steel Ltd ライナ厚測定方法
FR2572175A1 (fr) * 1984-10-24 1986-04-25 Stein Heurtey Procede et dispositif pour mesurer l'epaisseur de couches metalliques minces deposees sur un support conducteur
JPS6196401A (ja) * 1984-10-18 1986-05-15 Kobe Steel Ltd ２周波によるライナ厚測定方法
JPH0514165Y2 (en, 2012) * 1984-12-22 1993-04-15
JPS61225603A (ja) * 1985-03-29 1986-10-07 Sumitomo Metal Ind Ltd ライナ厚さ測定装置
JPS6221003A (ja) * 1985-07-19 1987-01-29 Kobe Steel Ltd ライニング管の厚み測定法
US4857260A (en) * 1988-09-28 1989-08-15 General Electric Company Apparatus for assembling and welding end plugs to nuclear fuel cladding tubes and inspecting the end plug welds on an automated basis
US5006801A (en) * 1989-06-02 1991-04-09 General Electric Company Eddy current inspection probe with probe coil resonace reduction
US5015950A (en) * 1989-07-21 1991-05-14 Iowa State University Research Foundation, Inc. Method and apparatus for determining thermal resistance and structural integrity of coatings on conducting materials by monitoring electrical conductance of the underlying material upon localized heating of the overlying coating
CA1330829C (en) * 1989-08-09 1994-07-19 Peter P. Roosen Metal measuring method and apparatus
US5017869A (en) * 1989-12-14 1991-05-21 General Electric Company Swept frequency eddy current system for measuring coating thickness
US5101366A (en) * 1989-12-18 1992-03-31 General Electric Company Method for controlling the manufacture of zirconium tubes
FR2656415B1 (fr) * 1989-12-27 1993-04-09 Framatome Sa Procede et dispositif de mesure simultanee de distance entre tubes metalliques et d'epaisseur d'oxyde sur les tubes.
FR2663115B1 (fr) * 1990-06-08 1994-04-15 Framatome Procede et dispositif de controle de l'epaisseur et de la cohesion de l'interface d'un tube duplex.
US5251765A (en) * 1990-11-13 1993-10-12 Westinghouse Electric Corp. Apparatus and method for segregating rods of undesirable alloy composition
US5394084A (en) * 1991-12-23 1995-02-28 The Boeing Company Method and apparatus for reducing errors in eddy-current conductivity measurements due to lift-off by interpolating between a plurality of reference conductivity measurements
US5341678A (en) * 1993-05-12 1994-08-30 General Electric Company Method for determining thickness of ferromagnetic material deposition on nuclear fuel rods
US5418823A (en) * 1994-01-04 1995-05-23 General Electric Company Combined ultrasonic and eddy-current method and apparatus for non-destructive testing of tubular objects to determine thickness of metallic linings or coatings
US5541510A (en) * 1995-04-06 1996-07-30 Kaman Instrumentation Corporation Multi-Parameter eddy current measuring system with parameter compensation technical field
AU700581B2 (en) * 1995-06-29 1999-01-07 Bekaert Naamloze Vennootschap Method and installation for measuring the thickness of a non-ferromagnetic conductive layer on a ferromagnetic conductive substrate
US5661241A (en) * 1995-09-11 1997-08-26 The Babcock & Wilcox Company Ultrasonic technique for measuring the thickness of cladding on the inside surface of vessels from the outside diameter surface
JP2000502189A (ja) * 1995-12-22 2000-02-22 シーメンス アクチエンゲゼルシヤフト 導電性被膜の厚さ決定方法及び装置
SE508354C2 (sv) * 1996-07-05 1998-09-28 Asea Atom Ab Förfarande och anordning för bestämning av skikttjocklek
DE19702950C2 (de) * 1997-01-28 2001-05-03 Helmut Fischer Gmbh & Co Verfahren und Vorrichtung zum Messen der Schichtdicke an zylindrischen Kleinteilen
US7498164B2 (en) * 1998-05-16 2009-03-03 Applied Biosystems, Llc Instrument for monitoring nucleic acid sequence amplification reaction
DE19860487A1 (de) * 1998-12-28 2000-07-06 Siemens Ag Verfahren und Vorrichtung zur räumlichen Vermessung einer Inhomogenität an einer Oberfläche eines Kernreaktorbauteils und Anwendung des Verfahrens zur Vermessung einer elektrisch praktisch nicht leitenden Schicht
EP1052505A1 (de) * 1999-05-11 2000-11-15 Asea Brown Boveri AG Verfahren zur Oberflächenuntersuchung an einem, wenigstens eine elektrisch leitfähige Schicht aufweisenden Prüfgut
US6366083B1 (en) * 1999-09-17 2002-04-02 Framatome Anp Inc. Method for measuring the thickness of oxide layer underlying crud layer containing ferromagnetic material on nuclear fuel rods
US6369566B1 (en) * 1999-09-27 2002-04-09 Framatone Anp Inc. Method for measuring crud thickness on nuclear fuel rods
EP1244907A1 (en) * 1999-12-23 2002-10-02 KLA-Tencor Corporation In-situ metalization monitoring using eddy current measurements and optical measurements
TWI241398B (en) * 2000-03-28 2005-10-11 Toshiba Corp Eddy current loss measuring sensor, film thickness measuring device, film thickness measuring method and recording medium
US6924641B1 (en) * 2000-05-19 2005-08-02 Applied Materials, Inc. Method and apparatus for monitoring a metal layer during chemical mechanical polishing
DE10102303C1 (de) * 2001-01-19 2002-08-22 Framatome Anp Gmbh Meßsystem zur Ermittlung der Schichtdicke einer Oxidschicht
US6608495B2 (en) 2001-03-19 2003-08-19 Applied Materials, Inc. Eddy-optic sensor for object inspection
US6966816B2 (en) * 2001-05-02 2005-11-22 Applied Materials, Inc. Integrated endpoint detection system with optical and eddy current monitoring
US6811466B1 (en) * 2001-12-28 2004-11-02 Applied Materials, Inc. System and method for in-line metal profile measurement
US7001242B2 (en) * 2002-02-06 2006-02-21 Applied Materials, Inc. Method and apparatus of eddy current monitoring for chemical mechanical polishing
US20030210040A1 (en) * 2002-05-08 2003-11-13 Samsung Electro-Mechanics Co., Ltd. Permeability detection system of ferrite core using magnetic field induction method
RU2227909C2 (ru) * 2002-06-06 2004-04-27 Орловский государственный технический университет Термоэлектрический способ контроля толщины электропроводящих покрытий на электропроводящей основе
US6945845B2 (en) * 2003-03-04 2005-09-20 Applied Materials, Inc. Chemical mechanical polishing apparatus with non-conductive elements
US7025658B2 (en) * 2003-08-18 2006-04-11 Applied Materials, Inc. Platen and head rotation rates for monitoring chemical mechanical polishing
JP4451111B2 (ja) * 2003-10-20 2010-04-14 株式会社荏原製作所 渦電流センサ
SE530770C2 (sv) * 2005-08-24 2008-09-09 Westinghouse Electric Sweden System och användning avseende virvelströmsmätningar på komponenter för nukleära reaktorer
US8337278B2 (en) 2007-09-24 2012-12-25 Applied Materials, Inc. Wafer edge characterization by successive radius measurements
US7705589B2 (en) * 2008-02-19 2010-04-27 Korea Research Institute Of Standards And Science Sensor for detecting surface defects of metal tube using eddy current method
JP2010164483A (ja) * 2009-01-16 2010-07-29 Idemitsu Eng Co Ltd 非破壊検査装置および非破壊検査方法
JP2021001814A (ja) * 2019-06-21 2021-01-07 国立大学法人 岡山大学 非破壊検査方法及び非破壊検査装置

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JPS58166203A (ja) * 1982-03-26 1983-10-01 Nuclear Fuel Ind Ltd 核燃料用被覆管内面コ−テイング膜厚測定法ならびにその装置
JPS5967405A (ja) * 1982-09-30 1984-04-17 Sumitomo Metal Ind Ltd ライナ厚測定方法

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH03129718U (en, 2012) * 1990-04-09 1991-12-26

Also Published As

Publication number Publication date
DE3335080A1 (de) 1984-04-05
SE8305277D0 (sv) 1983-09-29
SE460309B (sv) 1989-09-25
US4673877A (en) 1987-06-16
FR2534015B1 (fr) 1985-07-05
JPS5967405A (ja) 1984-04-17
DE3335080C2 (de) 1986-01-30
FR2534015A1 (fr) 1984-04-06
CA1237773A (en) 1988-06-07
SE8305277L (sv) 1984-03-31

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