JPH02135141U - - Google Patents

Info

Publication number
JPH02135141U
JPH02135141U JP4469689U JP4469689U JPH02135141U JP H02135141 U JPH02135141 U JP H02135141U JP 4469689 U JP4469689 U JP 4469689U JP 4469689 U JP4469689 U JP 4469689U JP H02135141 U JPH02135141 U JP H02135141U
Authority
JP
Japan
Prior art keywords
electrostatic chuck
electrostatic
substrate
internal electrode
chuck
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP4469689U
Other languages
Japanese (ja)
Other versions
JPH0746437Y2 (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP4469689U priority Critical patent/JPH0746437Y2/en
Publication of JPH02135141U publication Critical patent/JPH02135141U/ja
Application granted granted Critical
Publication of JPH0746437Y2 publication Critical patent/JPH0746437Y2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図及び第2図は本考案に係る静電チヤツク
の断面図、第3図A及びBは従来の静電チヤツク
の断面図である。 尚、図面中1……セラミツク基板、1a……セ
ラミツク層、2……上部内部電極、3……下部内
部電極、4……固定台、6……冷却水通路、W…
…ウエハーである。
1 and 2 are sectional views of an electrostatic chuck according to the present invention, and FIGS. 3A and 3B are sectional views of a conventional electrostatic chuck. In the drawings, 1...ceramic substrate, 1a...ceramic layer, 2...upper internal electrode, 3...lower internal electrode, 4...fixing stand, 6...cooling water passage, W...
...It's a wafer.

Claims (1)

【実用新案登録請求の範囲】 (1) 固定台上に取付けられる静電チヤツクにお
いて、前記固定台は導電性材料から構成され、ま
た静電チヤツクの基板内の上部には半導体ウエハ
ー等の試料を静電力によつて吸着するための上部
内部電極を設け、静電チヤツクの基板内の下部に
は基板自体を固定台に静電力によつて吸着させる
下部内部電極を設けたことを特徴とする静電チヤ
ツク。 (2) 前記固定台は内部に冷媒通路が形成されて
いることを特徴とする請求項1に記載の静電チヤ
ツク。
[Claims for Utility Model Registration] (1) In an electrostatic chuck that is mounted on a fixed base, the fixed base is made of a conductive material, and a sample such as a semiconductor wafer is mounted on the upper part of the substrate of the electrostatic chuck. The electrostatic chuck is characterized in that an upper internal electrode is provided for adsorption using electrostatic force, and a lower internal electrode is provided at the lower part of the substrate of the electrostatic chuck for adsorbing the substrate itself to a fixing base using electrostatic force. Electric chuck. (2) The electrostatic chuck according to claim 1, wherein the fixing base has a refrigerant passage formed therein.
JP4469689U 1989-04-17 1989-04-17 Electrostatic chuck Expired - Lifetime JPH0746437Y2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP4469689U JPH0746437Y2 (en) 1989-04-17 1989-04-17 Electrostatic chuck

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4469689U JPH0746437Y2 (en) 1989-04-17 1989-04-17 Electrostatic chuck

Publications (2)

Publication Number Publication Date
JPH02135141U true JPH02135141U (en) 1990-11-09
JPH0746437Y2 JPH0746437Y2 (en) 1995-10-25

Family

ID=31558227

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4469689U Expired - Lifetime JPH0746437Y2 (en) 1989-04-17 1989-04-17 Electrostatic chuck

Country Status (1)

Country Link
JP (1) JPH0746437Y2 (en)

Cited By (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04300138A (en) * 1991-03-28 1992-10-23 Shin Etsu Chem Co Ltd Electrostatic chuck
JPH05198663A (en) * 1992-01-21 1993-08-06 Hitachi Ltd Sample conveying holder
JPH09162272A (en) * 1995-12-04 1997-06-20 Sony Corp Electrostatic chuck, thin board holding device, semiconductor manufacturing device, and transfer method
JPH11111829A (en) * 1997-10-06 1999-04-23 Ulvac Corp Electrostatic sucking hot plate vacuum-treatment apparatus and method for vacuum treatment
JP2000288868A (en) * 1999-04-02 2000-10-17 Honda Motor Co Ltd Work fixing device with cooling mechanism
JP2001144167A (en) * 1999-11-12 2001-05-25 Ngk Insulators Ltd Semiconductor holder
JP2001189378A (en) * 1990-12-25 2001-07-10 Ngk Insulators Ltd Wafer-chucking heating apparatus
JP2003100856A (en) * 2001-09-26 2003-04-04 Kyocera Corp Wafer supporting member
JP2003347396A (en) * 1990-12-25 2003-12-05 Ngk Insulators Ltd Wafer chucking heating apparatus and wafer chucking apparatus
JP2006344955A (en) * 2005-06-09 2006-12-21 Ngk Insulators Ltd Electrostatic chuck
WO2011001978A1 (en) * 2009-07-02 2011-01-06 株式会社クリエイティブ テクノロジー Electrostatic attracting structure and fabricating method therefor
WO2015111616A1 (en) * 2014-01-22 2015-07-30 株式会社アルバック Plasma treatment device and wafer transportation tray
JP2016136552A (en) * 2015-01-23 2016-07-28 株式会社日立ハイテクノロジーズ Plasma processing apparatus
JP2018518844A (en) * 2015-06-11 2018-07-12 フラウンホッファー−ゲゼルシャフト ツァ フェルダールング デァ アンゲヴァンテン フォアシュンク エー.ファオ Apparatus having a film for electrostatically coupling a substrate to a substrate carrier
JP2018206804A (en) * 2017-05-30 2018-12-27 東京エレクトロン株式会社 Electrostatic chuck and plasma processing apparatus
JP2018206803A (en) * 2017-05-30 2018-12-27 東京エレクトロン株式会社 Method of operating electrostatic chuck of plasma processing apparatus
WO2024004039A1 (en) * 2022-06-28 2024-01-04 日本碍子株式会社 Wafer placement table

Cited By (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001189378A (en) * 1990-12-25 2001-07-10 Ngk Insulators Ltd Wafer-chucking heating apparatus
JP2003347396A (en) * 1990-12-25 2003-12-05 Ngk Insulators Ltd Wafer chucking heating apparatus and wafer chucking apparatus
JPH04300138A (en) * 1991-03-28 1992-10-23 Shin Etsu Chem Co Ltd Electrostatic chuck
JPH05198663A (en) * 1992-01-21 1993-08-06 Hitachi Ltd Sample conveying holder
JPH09162272A (en) * 1995-12-04 1997-06-20 Sony Corp Electrostatic chuck, thin board holding device, semiconductor manufacturing device, and transfer method
JPH11111829A (en) * 1997-10-06 1999-04-23 Ulvac Corp Electrostatic sucking hot plate vacuum-treatment apparatus and method for vacuum treatment
JP2000288868A (en) * 1999-04-02 2000-10-17 Honda Motor Co Ltd Work fixing device with cooling mechanism
JP2001144167A (en) * 1999-11-12 2001-05-25 Ngk Insulators Ltd Semiconductor holder
JP4698097B2 (en) * 2001-09-26 2011-06-08 京セラ株式会社 Wafer support member
JP2003100856A (en) * 2001-09-26 2003-04-04 Kyocera Corp Wafer supporting member
JP2006344955A (en) * 2005-06-09 2006-12-21 Ngk Insulators Ltd Electrostatic chuck
WO2011001978A1 (en) * 2009-07-02 2011-01-06 株式会社クリエイティブ テクノロジー Electrostatic attracting structure and fabricating method therefor
WO2015111616A1 (en) * 2014-01-22 2015-07-30 株式会社アルバック Plasma treatment device and wafer transportation tray
JP6088670B2 (en) * 2014-01-22 2017-03-01 株式会社アルバック Plasma processing apparatus and wafer transfer tray
JPWO2015111616A1 (en) * 2014-01-22 2017-03-23 株式会社アルバック Plasma processing apparatus and wafer transfer tray
JP2016136552A (en) * 2015-01-23 2016-07-28 株式会社日立ハイテクノロジーズ Plasma processing apparatus
JP2018518844A (en) * 2015-06-11 2018-07-12 フラウンホッファー−ゲゼルシャフト ツァ フェルダールング デァ アンゲヴァンテン フォアシュンク エー.ファオ Apparatus having a film for electrostatically coupling a substrate to a substrate carrier
US10304714B2 (en) 2015-06-11 2019-05-28 Fraunhofer-Gesellschaft Zur Foerderung Der Angewandten Forschung E.V. Device comprising film for electrostatic coupling of a substrate to a substrate carrier
JP2018206804A (en) * 2017-05-30 2018-12-27 東京エレクトロン株式会社 Electrostatic chuck and plasma processing apparatus
JP2018206803A (en) * 2017-05-30 2018-12-27 東京エレクトロン株式会社 Method of operating electrostatic chuck of plasma processing apparatus
WO2024004039A1 (en) * 2022-06-28 2024-01-04 日本碍子株式会社 Wafer placement table

Also Published As

Publication number Publication date
JPH0746437Y2 (en) 1995-10-25

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Legal Events

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EXPY Cancellation because of completion of term