JPH0171664U - - Google Patents
Info
- Publication number
- JPH0171664U JPH0171664U JP1987167578U JP16757887U JPH0171664U JP H0171664 U JPH0171664 U JP H0171664U JP 1987167578 U JP1987167578 U JP 1987167578U JP 16757887 U JP16757887 U JP 16757887U JP H0171664 U JPH0171664 U JP H0171664U
- Authority
- JP
- Japan
- Prior art keywords
- magnetic field
- sensor
- detection device
- flaw detection
- optical fiber
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000001514 detection method Methods 0.000 claims description 5
- 239000013307 optical fiber Substances 0.000 claims description 5
- 230000002950 deficient Effects 0.000 claims 2
- 239000013078 crystal Substances 0.000 claims 1
- SBIBMFFZSBJNJF-UHFFFAOYSA-N selenium;zinc Chemical compound [Se]=[Zn] SBIBMFFZSBJNJF-UHFFFAOYSA-N 0.000 claims 1
- 230000003287 optical effect Effects 0.000 description 3
- 238000010586 diagram Methods 0.000 description 2
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical group [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
Landscapes
- Measuring Magnetic Variables (AREA)
- Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1987167578U JPH0619093Y2 (ja) | 1987-10-30 | 1987-10-30 | 探傷装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1987167578U JPH0619093Y2 (ja) | 1987-10-30 | 1987-10-30 | 探傷装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH0171664U true JPH0171664U (OSRAM) | 1989-05-12 |
| JPH0619093Y2 JPH0619093Y2 (ja) | 1994-05-18 |
Family
ID=31455997
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1987167578U Expired - Lifetime JPH0619093Y2 (ja) | 1987-10-30 | 1987-10-30 | 探傷装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0619093Y2 (OSRAM) |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6076650A (ja) * | 1983-07-05 | 1985-05-01 | ピイアールアイ・インストラメンテーション・インコーポレーテッド | タ−ゲツト物体中の欠陥，空隙，不連続部などを検出する方法および装置 |
-
1987
- 1987-10-30 JP JP1987167578U patent/JPH0619093Y2/ja not_active Expired - Lifetime
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6076650A (ja) * | 1983-07-05 | 1985-05-01 | ピイアールアイ・インストラメンテーション・インコーポレーテッド | タ−ゲツト物体中の欠陥，空隙，不連続部などを検出する方法および装置 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0619093Y2 (ja) | 1994-05-18 |
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