JPH0149894B2 - - Google Patents

Info

Publication number
JPH0149894B2
JPH0149894B2 JP56016476A JP1647681A JPH0149894B2 JP H0149894 B2 JPH0149894 B2 JP H0149894B2 JP 56016476 A JP56016476 A JP 56016476A JP 1647681 A JP1647681 A JP 1647681A JP H0149894 B2 JPH0149894 B2 JP H0149894B2
Authority
JP
Japan
Prior art keywords
measured
ray
rays
ray tube
foil
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP56016476A
Other languages
English (en)
Japanese (ja)
Other versions
JPS57131042A (en
Inventor
Tokio Hirano
Masaaki Inoe
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Yokogawa Electric Corp
Original Assignee
Yokogawa Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Yokogawa Electric Corp filed Critical Yokogawa Electric Corp
Priority to JP56016476A priority Critical patent/JPS57131042A/ja
Publication of JPS57131042A publication Critical patent/JPS57131042A/ja
Publication of JPH0149894B2 publication Critical patent/JPH0149894B2/ja
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05G—X-RAY TECHNIQUE
    • H05G1/00—X-ray apparatus involving X-ray tubes; Circuits therefor
    • H05G1/08—Electrical details
    • H05G1/26—Measuring, controlling or protecting
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays

Landscapes

  • Health & Medical Sciences (AREA)
  • Toxicology (AREA)
  • General Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP56016476A 1981-02-06 1981-02-06 X rays analyzer with automatic calibration apparatus Granted JPS57131042A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56016476A JPS57131042A (en) 1981-02-06 1981-02-06 X rays analyzer with automatic calibration apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56016476A JPS57131042A (en) 1981-02-06 1981-02-06 X rays analyzer with automatic calibration apparatus

Publications (2)

Publication Number Publication Date
JPS57131042A JPS57131042A (en) 1982-08-13
JPH0149894B2 true JPH0149894B2 (OSRAM) 1989-10-26

Family

ID=11917323

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56016476A Granted JPS57131042A (en) 1981-02-06 1981-02-06 X rays analyzer with automatic calibration apparatus

Country Status (1)

Country Link
JP (1) JPS57131042A (OSRAM)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004530912A (ja) * 2001-06-29 2004-10-07 パナリティカル ビー ヴィ 材料サンプルの検討
DE60330977D1 (de) 2002-09-11 2010-03-04 Citizen Holdings Co Ltd Antennenstruktur und funkkorrekturtakt
CN1961457B (zh) 2004-08-25 2012-10-17 西铁城控股株式会社 电子装置
DE102005016124A1 (de) * 2005-04-08 2006-10-12 Robert Bosch Gmbh Sensorvorrichtung einer Verpackungsmaschine
CN109839399B (zh) * 2019-01-23 2021-04-30 中国科学院上海应用物理研究所 基于kb镜的同步辐射共聚焦荧光实验装置的仪器校准方法
US11333544B2 (en) * 2019-06-17 2022-05-17 Honeywell International Inc. Apparatus for simultaneously determining weights of composite sheets

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5214117B2 (OSRAM) * 1972-12-11 1977-04-19
JPS5594149A (en) * 1979-01-12 1980-07-17 Yokogawa Hokushin Electric Corp Reflecting type ash content meter

Also Published As

Publication number Publication date
JPS57131042A (en) 1982-08-13

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