JPH0137701B2 - - Google Patents

Info

Publication number
JPH0137701B2
JPH0137701B2 JP25719684A JP25719684A JPH0137701B2 JP H0137701 B2 JPH0137701 B2 JP H0137701B2 JP 25719684 A JP25719684 A JP 25719684A JP 25719684 A JP25719684 A JP 25719684A JP H0137701 B2 JPH0137701 B2 JP H0137701B2
Authority
JP
Japan
Prior art keywords
voltage
resistor
dut
power supply
terminal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP25719684A
Other languages
English (en)
Japanese (ja)
Other versions
JPS61134682A (ja
Inventor
Ryoichi Sakai
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tektronix Japan Ltd
Original Assignee
Sony Tektronix Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sony Tektronix Corp filed Critical Sony Tektronix Corp
Priority to JP25719684A priority Critical patent/JPS61134682A/ja
Priority to NL8502440A priority patent/NL190940C/nl
Priority to GB08522687A priority patent/GB2168162B/en
Priority to US06/780,957 priority patent/US4727318A/en
Priority to CA000491892A priority patent/CA1228176A/en
Priority to DE19853542121 priority patent/DE3542121A1/de
Publication of JPS61134682A publication Critical patent/JPS61134682A/ja
Priority to US07/074,910 priority patent/US4782290A/en
Publication of JPH0137701B2 publication Critical patent/JPH0137701B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2601—Apparatus or methods therefor
    • G01R31/2603—Apparatus or methods therefor for curve tracing of semiconductor characteristics, e.g. on oscilloscope

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Current Or Voltage (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Amplifiers (AREA)
JP25719684A 1984-10-04 1984-12-05 素子特性測定装置 Granted JPS61134682A (ja)

Priority Applications (7)

Application Number Priority Date Filing Date Title
JP25719684A JPS61134682A (ja) 1984-12-05 1984-12-05 素子特性測定装置
NL8502440A NL190940C (nl) 1984-12-05 1985-09-05 Inrichting voor het meten van karakteristieken van elektronische ketenelementen.
GB08522687A GB2168162B (en) 1984-12-05 1985-09-13 Electronic device measurement apparatus
US06/780,957 US4727318A (en) 1984-10-04 1985-09-27 Apparatus for measuring characteristics of electronic devices
CA000491892A CA1228176A (en) 1984-12-05 1985-09-30 Electronic device measurement apparatus
DE19853542121 DE3542121A1 (de) 1984-12-05 1985-11-28 Messvorrichtung fuer elektronische bauelemente
US07/074,910 US4782290A (en) 1984-10-04 1987-07-17 Apparatus for measuring characteristics or electronic devices

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP25719684A JPS61134682A (ja) 1984-12-05 1984-12-05 素子特性測定装置

Publications (2)

Publication Number Publication Date
JPS61134682A JPS61134682A (ja) 1986-06-21
JPH0137701B2 true JPH0137701B2 (nl) 1989-08-09

Family

ID=17303010

Family Applications (1)

Application Number Title Priority Date Filing Date
JP25719684A Granted JPS61134682A (ja) 1984-10-04 1984-12-05 素子特性測定装置

Country Status (5)

Country Link
JP (1) JPS61134682A (nl)
CA (1) CA1228176A (nl)
DE (1) DE3542121A1 (nl)
GB (1) GB2168162B (nl)
NL (1) NL190940C (nl)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0721526B2 (ja) * 1987-08-18 1995-03-08 ソニ−・テクトロニクス株式会社 素子測定装置

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2980853A (en) * 1958-04-28 1961-04-18 Ryan Aeronautical Co Component output characteristic tracer
US3573618A (en) * 1968-05-27 1971-04-06 William G Dilley Solid-state characteristic curve tracer attachment for oscilloscopes
US4456880A (en) * 1982-02-04 1984-06-26 Warner Thomas H I-V Curve tracer employing parametric sampling

Also Published As

Publication number Publication date
JPS61134682A (ja) 1986-06-21
CA1228176A (en) 1987-10-13
GB2168162A (en) 1986-06-11
NL190940C (nl) 1994-11-01
GB8522687D0 (en) 1985-10-16
NL190940B (nl) 1994-06-01
DE3542121C2 (nl) 1991-09-05
GB2168162B (en) 1988-12-07
DE3542121A1 (de) 1986-06-05
NL8502440A (nl) 1986-07-01

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Legal Events

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EXPY Cancellation because of completion of term