GB2168162B - Electronic device measurement apparatus - Google Patents

Electronic device measurement apparatus

Info

Publication number
GB2168162B
GB2168162B GB08522687A GB8522687A GB2168162B GB 2168162 B GB2168162 B GB 2168162B GB 08522687 A GB08522687 A GB 08522687A GB 8522687 A GB8522687 A GB 8522687A GB 2168162 B GB2168162 B GB 2168162B
Authority
GB
United Kingdom
Prior art keywords
electronic device
measurement apparatus
device measurement
electronic
measurement
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB08522687A
Other languages
English (en)
Other versions
GB2168162A (en
GB8522687D0 (en
Inventor
Ryoichi Sakai
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tektronix Japan Ltd
Original Assignee
Sony Tektronix Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sony Tektronix Corp filed Critical Sony Tektronix Corp
Publication of GB8522687D0 publication Critical patent/GB8522687D0/en
Publication of GB2168162A publication Critical patent/GB2168162A/en
Application granted granted Critical
Publication of GB2168162B publication Critical patent/GB2168162B/en
Expired legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26Testing of individual semiconductor devices
    • G01R31/2601Apparatus or methods therefor
    • G01R31/2603Apparatus or methods therefor for curve tracing of semiconductor characteristics, e.g. on oscilloscope

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Current Or Voltage (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Amplifiers (AREA)
GB08522687A 1984-12-05 1985-09-13 Electronic device measurement apparatus Expired GB2168162B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP25719684A JPS61134682A (ja) 1984-12-05 1984-12-05 素子特性測定装置

Publications (3)

Publication Number Publication Date
GB8522687D0 GB8522687D0 (en) 1985-10-16
GB2168162A GB2168162A (en) 1986-06-11
GB2168162B true GB2168162B (en) 1988-12-07

Family

ID=17303010

Family Applications (1)

Application Number Title Priority Date Filing Date
GB08522687A Expired GB2168162B (en) 1984-12-05 1985-09-13 Electronic device measurement apparatus

Country Status (5)

Country Link
JP (1) JPS61134682A (nl)
CA (1) CA1228176A (nl)
DE (1) DE3542121A1 (nl)
GB (1) GB2168162B (nl)
NL (1) NL190940C (nl)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0721526B2 (ja) * 1987-08-18 1995-03-08 ソニ−・テクトロニクス株式会社 素子測定装置

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2980853A (en) * 1958-04-28 1961-04-18 Ryan Aeronautical Co Component output characteristic tracer
US3573618A (en) * 1968-05-27 1971-04-06 William G Dilley Solid-state characteristic curve tracer attachment for oscilloscopes
US4456880A (en) * 1982-02-04 1984-06-26 Warner Thomas H I-V Curve tracer employing parametric sampling

Also Published As

Publication number Publication date
JPS61134682A (ja) 1986-06-21
CA1228176A (en) 1987-10-13
GB2168162A (en) 1986-06-11
NL190940C (nl) 1994-11-01
GB8522687D0 (en) 1985-10-16
NL190940B (nl) 1994-06-01
DE3542121C2 (nl) 1991-09-05
JPH0137701B2 (nl) 1989-08-09
DE3542121A1 (de) 1986-06-05
NL8502440A (nl) 1986-07-01

Similar Documents

Publication Publication Date Title
GB8529530D0 (en) Measuring apparatus
GB8613436D0 (en) Electronic foot measuring apparatus
GB8510194D0 (en) Electronic weighing device
IE851998L (en) Test apparatus for electronic equipment
GB8322687D0 (en) Measuring device
JPS57182117A (en) Electronic vernier measuring device
JPS57153223A (en) Electronic weighing apparatus
GB8518038D0 (en) Measuring apparatus
GB8416323D0 (en) Measuring device
GB8430398D0 (en) Component measuring apparatus
GB8308448D0 (en) Printed area measuring apparatus
GB2137364B (en) Electrical measuring device
GB2164151B (en) Measuring apparatus
GB2184242B (en) Electronic measuring device
ZW17182A1 (en) Electronic checking apparatus
ZA825430B (en) Apparatus for testing electronic devices
GB2168156B (en) Measuring apparatus
GB8505965D0 (en) Measuring device
GB8421234D0 (en) Measuring device
DE3567103D1 (en) Combination measuring apparatus
GB2168162B (en) Electronic device measurement apparatus
JPS5762600A (en) Electronic part inspecting device
GB8421921D0 (en) Measuring device
GB8512100D0 (en) Electronic measuring apparatus
GB8525753D0 (en) Electronic device

Legal Events

Date Code Title Description
PCNP Patent ceased through non-payment of renewal fee

Effective date: 19940913