ZA825430B - Apparatus for testing electronic devices - Google Patents

Apparatus for testing electronic devices

Info

Publication number
ZA825430B
ZA825430B ZA825430A ZA825430A ZA825430B ZA 825430 B ZA825430 B ZA 825430B ZA 825430 A ZA825430 A ZA 825430A ZA 825430 A ZA825430 A ZA 825430A ZA 825430 B ZA825430 B ZA 825430B
Authority
ZA
South Africa
Prior art keywords
electronic devices
testing electronic
testing
devices
electronic
Prior art date
Application number
ZA825430A
Inventor
Gulamhusein Nanji Sadrudin
Derek John Painter
John Paul King
Original Assignee
Int Computers Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Int Computers Ltd filed Critical Int Computers Ltd
Publication of ZA825430B publication Critical patent/ZA825430B/en

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F15/00—Digital computers in general; Data processing equipment in general
    • G06F15/76—Architectures of general purpose stored program computers
    • G06F15/80—Architectures of general purpose stored program computers comprising an array of processing units with common control, e.g. single instruction multiple data processors
    • G06F15/8007—Architectures of general purpose stored program computers comprising an array of processing units with common control, e.g. single instruction multiple data processors single instruction multiple data [SIMD] multiprocessors
    • G06F15/8023—Two dimensional arrays, e.g. mesh, torus
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00—Printed circuits
    • H05K1/02—Details
    • H05K1/0266—Marks, test patterns or identification means
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00—Printed circuits
    • H05K1/02—Details
    • H05K1/0296—Conductive pattern lay-out details not covered by sub groups H05K1/02 - H05K1/0295
    • H05K1/0298—Multilayer circuits
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00—Printed circuits
    • H05K1/02—Details
    • H05K1/11—Printed elements for providing electric connections to or between printed circuits

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Theoretical Computer Science (AREA)
  • Computing Systems (AREA)
  • Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Multi Processors (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
ZA825430A 1981-08-06 1982-07-28 Apparatus for testing electronic devices ZA825430B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB8124124 1981-08-06

Publications (1)

Publication Number Publication Date
ZA825430B true ZA825430B (en) 1983-06-29

Family

ID=10523758

Family Applications (1)

Application Number Title Priority Date Filing Date
ZA825430A ZA825430B (en) 1981-08-06 1982-07-28 Apparatus for testing electronic devices

Country Status (4)

Country Link
AU (1) AU8690682A (en)
FR (1) FR2511216B1 (en)
GB (1) GB2104669A (en)
ZA (1) ZA825430B (en)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2130383B (en) * 1982-09-14 1986-06-04 Risho Kogyo Kk Test board for semiconductor packages
DK291184D0 (en) * 1984-06-13 1984-06-13 Boeegh Petersen Allan METHOD AND DEVICE FOR TESTING CIRCUIT PLATES
EP0175995B1 (en) * 1984-09-21 1990-01-03 Siemens Aktiengesellschaft Arrangement for testing integrated circuits
GB2178860B (en) * 1985-08-09 1988-12-14 Databasix Limited Improvements in or relating to testing equipment for printed circuit boards
JPH0746130B2 (en) * 1988-05-19 1995-05-17 富士通株式会社 LSI system
US5014002A (en) * 1989-04-18 1991-05-07 Vlsi Technology, Inc. ATE jumper programmable interface board
DE29906730U1 (en) * 1999-04-16 1999-07-08 Gesch, Helmuth, Prof. Dr. Ing., 84184 Tiefenbach Adapter base for holding electronic test objects
DE10301124A1 (en) * 2003-01-14 2004-07-29 Infineon Technologies Ag Universal measurement system, for adapting or contacting of different semiconductor package types, comprises an adapter for connecting a package matched socket to a standard PGA (pin grid array) socket

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2251225C3 (en) * 1972-10-19 1979-10-04 Olympia Werke Ag, 2940 Wilhelmshaven Circuit arrangement for transmitting signals between electronic assemblies of a data processing unit and input and output units
GB2020457B (en) * 1978-05-03 1982-03-10 Int Computers Ltd Array processors

Also Published As

Publication number Publication date
AU8690682A (en) 1983-02-10
FR2511216B1 (en) 1985-06-28
FR2511216A1 (en) 1983-02-11
GB2104669A (en) 1983-03-09

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