CA1228176A - Electronic device measurement apparatus - Google Patents

Electronic device measurement apparatus

Info

Publication number
CA1228176A
CA1228176A CA000491892A CA491892A CA1228176A CA 1228176 A CA1228176 A CA 1228176A CA 000491892 A CA000491892 A CA 000491892A CA 491892 A CA491892 A CA 491892A CA 1228176 A CA1228176 A CA 1228176A
Authority
CA
Canada
Prior art keywords
voltage
terminal
electronic device
resistor
amplifier
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
CA000491892A
Other languages
English (en)
French (fr)
Inventor
Ryoichi Sakai
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tektronix Japan Ltd
Original Assignee
Sony Tektronix Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sony Tektronix Corp filed Critical Sony Tektronix Corp
Application granted granted Critical
Publication of CA1228176A publication Critical patent/CA1228176A/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2601—Apparatus or methods therefor
    • G01R31/2603—Apparatus or methods therefor for curve tracing of semiconductor characteristics, e.g. on oscilloscope

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Current Or Voltage (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Amplifiers (AREA)
CA000491892A 1984-12-05 1985-09-30 Electronic device measurement apparatus Expired CA1228176A (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP25719684A JPS61134682A (ja) 1984-12-05 1984-12-05 素子特性測定装置
JP257196/84 1984-12-05

Publications (1)

Publication Number Publication Date
CA1228176A true CA1228176A (en) 1987-10-13

Family

ID=17303010

Family Applications (1)

Application Number Title Priority Date Filing Date
CA000491892A Expired CA1228176A (en) 1984-12-05 1985-09-30 Electronic device measurement apparatus

Country Status (5)

Country Link
JP (1) JPS61134682A (nl)
CA (1) CA1228176A (nl)
DE (1) DE3542121A1 (nl)
GB (1) GB2168162B (nl)
NL (1) NL190940C (nl)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0721526B2 (ja) * 1987-08-18 1995-03-08 ソニ−・テクトロニクス株式会社 素子測定装置

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2980853A (en) * 1958-04-28 1961-04-18 Ryan Aeronautical Co Component output characteristic tracer
US3573618A (en) * 1968-05-27 1971-04-06 William G Dilley Solid-state characteristic curve tracer attachment for oscilloscopes
US4456880A (en) * 1982-02-04 1984-06-26 Warner Thomas H I-V Curve tracer employing parametric sampling

Also Published As

Publication number Publication date
JPS61134682A (ja) 1986-06-21
GB2168162A (en) 1986-06-11
NL190940C (nl) 1994-11-01
GB8522687D0 (en) 1985-10-16
NL190940B (nl) 1994-06-01
DE3542121C2 (nl) 1991-09-05
JPH0137701B2 (nl) 1989-08-09
GB2168162B (en) 1988-12-07
DE3542121A1 (de) 1986-06-05
NL8502440A (nl) 1986-07-01

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Legal Events

Date Code Title Description
MKEX Expiry