JPH0136900B2 - - Google Patents
Info
- Publication number
- JPH0136900B2 JPH0136900B2 JP57091865A JP9186582A JPH0136900B2 JP H0136900 B2 JPH0136900 B2 JP H0136900B2 JP 57091865 A JP57091865 A JP 57091865A JP 9186582 A JP9186582 A JP 9186582A JP H0136900 B2 JPH0136900 B2 JP H0136900B2
- Authority
- JP
- Japan
- Prior art keywords
- ray
- wavelength
- peak
- peaks
- characteristic
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000002083 X-ray spectrum Methods 0.000 claims description 2
- 230000007717 exclusion Effects 0.000 claims 1
- 239000013078 crystal Substances 0.000 description 6
- 238000010586 diagram Methods 0.000 description 2
- 238000001514 detection method Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000010894 electron beam technology Methods 0.000 description 1
- 230000003340 mental effect Effects 0.000 description 1
- 238000000034 method Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
- G01N23/2076—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions for spectrometry, i.e. using an analysing crystal, e.g. for measuring X-ray fluorescence spectrum of a sample with wavelength-dispersion, i.e. WDXFS
Landscapes
- Chemical & Material Sciences (AREA)
- Physics & Mathematics (AREA)
- Life Sciences & Earth Sciences (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Crystallography & Structural Chemistry (AREA)
- Health & Medical Sciences (AREA)
- Dispersion Chemistry (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP57091865A JPS58208647A (ja) | 1982-05-28 | 1982-05-28 | Ｘ線分光分析装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP57091865A JPS58208647A (ja) | 1982-05-28 | 1982-05-28 | Ｘ線分光分析装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS58208647A JPS58208647A (ja) | 1983-12-05 |
| JPH0136900B2 true JPH0136900B2 (enrdf_load_stackoverflow) | 1989-08-03 |
Family
ID=14038444
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP57091865A Granted JPS58208647A (ja) | 1982-05-28 | 1982-05-28 | Ｘ線分光分析装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS58208647A (enrdf_load_stackoverflow) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0736006B2 (ja) * | 1985-06-28 | 1995-04-19 | 株式会社島津製作所 | Ｘ線分光器の波長較正装置 |
| JPH0740005B2 (ja) * | 1986-08-29 | 1995-05-01 | 日本電子株式会社 | 特性ｘ線スペクトルによる元素同定方法 |
-
1982
- 1982-05-28 JP JP57091865A patent/JPS58208647A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS58208647A (ja) | 1983-12-05 |
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