JPS58208647A - Ｘ線分光分析装置 - Google Patents

Ｘ線分光分析装置

Info

Publication number
JPS58208647A
JPS58208647A JP57091865A JP9186582A JPS58208647A JP S58208647 A JPS58208647 A JP S58208647A JP 57091865 A JP57091865 A JP 57091865A JP 9186582 A JP9186582 A JP 9186582A JP S58208647 A JPS58208647 A JP S58208647A
Authority
JP
Japan
Prior art keywords
ray
wavelength
peak
memory means
characteristic
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP57091865A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0136900B2 (enrdf_load_stackoverflow
Inventor
Masao Kawai
河合　政夫
Fukuo Zenitani
銭谷　福男
Kazuo Koyanagi
和夫 小柳
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Shimazu Seisakusho KK
Original Assignee
Shimadzu Corp
Shimazu Seisakusho KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp, Shimazu Seisakusho KK filed Critical Shimadzu Corp
Priority to JP57091865A priority Critical patent/JPS58208647A/ja
Publication of JPS58208647A publication Critical patent/JPS58208647A/ja
Publication of JPH0136900B2 publication Critical patent/JPH0136900B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
    • G01N23/2076—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions for spectrometry, i.e. using an analysing crystal, e.g. for measuring X-ray fluorescence spectrum of a sample with wavelength-dispersion, i.e. WDXFS

Landscapes

  • Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Dispersion Chemistry (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP57091865A 1982-05-28 1982-05-28 Ｘ線分光分析装置 Granted JPS58208647A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57091865A JPS58208647A (ja) 1982-05-28 1982-05-28 Ｘ線分光分析装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57091865A JPS58208647A (ja) 1982-05-28 1982-05-28 Ｘ線分光分析装置

Publications (2)

Publication Number Publication Date
JPS58208647A true JPS58208647A (ja) 1983-12-05
JPH0136900B2 JPH0136900B2 (enrdf_load_stackoverflow) 1989-08-03

Family

ID=14038444

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57091865A Granted JPS58208647A (ja) 1982-05-28 1982-05-28 Ｘ線分光分析装置

Country Status (1)

Country Link
JP (1) JPS58208647A (enrdf_load_stackoverflow)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS623651A (ja) * 1985-06-28 1987-01-09 Shimadzu Corp Ｘ線分光器の波長較正装置
JPS6358240A (ja) * 1986-08-29 1988-03-14 Jeol Ltd 特性ｘ線スペクトルによる元素同定方法

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS623651A (ja) * 1985-06-28 1987-01-09 Shimadzu Corp Ｘ線分光器の波長較正装置
JPS6358240A (ja) * 1986-08-29 1988-03-14 Jeol Ltd 特性ｘ線スペクトルによる元素同定方法

Also Published As

Publication number Publication date
JPH0136900B2 (enrdf_load_stackoverflow) 1989-08-03

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