JPH01319937A - Heat-treatment method for pyroelectric material - Google Patents

Heat-treatment method for pyroelectric material

Info

Publication number
JPH01319937A
JPH01319937A JP63153188A JP15318888A JPH01319937A JP H01319937 A JPH01319937 A JP H01319937A JP 63153188 A JP63153188 A JP 63153188A JP 15318888 A JP15318888 A JP 15318888A JP H01319937 A JPH01319937 A JP H01319937A
Authority
JP
Japan
Prior art keywords
pyroelectric material
hot plate
pyroelectric
heat treatment
substrate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP63153188A
Other languages
Japanese (ja)
Other versions
JP2797321B2 (en
Inventor
Shinichiro Toyoda
豊田 真一郎
Toshimichi Ishida
敏道 石田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP63153188A priority Critical patent/JP2797321B2/en
Publication of JPH01319937A publication Critical patent/JPH01319937A/en
Application granted granted Critical
Publication of JP2797321B2 publication Critical patent/JP2797321B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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  • Surface Acoustic Wave Elements And Circuit Networks Thereof (AREA)
  • Drying Of Semiconductors (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)

Abstract

PURPOSE:To make the instantaneous temperature changes of pyroelectric material smaller, for preventing the pyroelectric material from breaking by shrinkage, or expansion, by moving the pyroelectric material over two or more hot plates having temperature differences. CONSTITUTION:Five sets of hot plates 1 are used and their temperatures are made to be 70, 140, 140 and 70 deg.C respectively. A conveying mechanism is provided to convey a substrate 3 between the plates 1. The conveyance is performed after holding the substrate 3 above each plate 1 for 30 to 60sec each. This makes the instantaneous temperature changes of pyroelectric material 5 smaller, and prevents the material 5 from breaking by shrinkage or expansion.

Description

【発明の詳細な説明】 産業上の利用分野 本発明は焦電材料を用いて表面弾性波フィルタ等を製造
する工程において焦電材料を含む基板上のホトレジスト
を露光、現像後エツチング前に硬化させて基板との密着
性及び耐プラズマ性を良(させるホトレジストの加熱処
理方法に関するものである。
DETAILED DESCRIPTION OF THE INVENTION Field of Industrial Application The present invention is a process for manufacturing a surface acoustic wave filter or the like using a pyroelectric material, in which a photoresist on a substrate containing a pyroelectric material is cured after exposure and development and before etching. The present invention relates to a heat treatment method for photoresist that improves its adhesion to a substrate and its plasma resistance.

従来の技術 近年1表面弾性波を通信工学の領域に採用する試みが急
速に高まってきており、その主基板となる焦電材料の加
工上の取り扱いが問題となっている。
BACKGROUND OF THE INVENTION In recent years, there has been a rapid increase in attempts to apply surface acoustic waves to the field of communication engineering, and the handling of pyroelectric materials, which are the main substrate, during processing has become a problem.

従来、焦電材料上にAeあるいはA2合金のすだれ状電
極やグレーティングを形成する場合には通常のフォトエ
ツチング法を用いているが線幅が狭(なる(4μm以下
)に従ってドライエツチングの採用が不可欠になってき
ている。ドライエツチングの採用においては、Aeある
いはAe合金配線形成のマスクとなるレジストの耐プラ
ズマ性が要求される為ドライエツチング前にレジストの
加熱処理が行われている。
Conventionally, when forming interdigital electrodes or gratings of Ae or A2 alloy on pyroelectric materials, normal photoetching is used, but as the line width becomes narrower (4 μm or less), dry etching becomes essential. When dry etching is employed, the resist, which serves as a mask for forming Ae or Ae alloy wiring, is required to have plasma resistance, so the resist is heated before dry etching.

従来のレジスト加熱処理方法は、たとえば第2図に示す
ようなものである、第2図において、ホットプレート1
は内部に電熱ヒータ2を内蔵している。そして、ホット
プレート1の上には被熱処理物である基板3が載置され
ている。この基板3は、AeあるいはA2合金の金属膜
4を焦電材料5の上に形成し、この金属膜4の上にホト
レジストホトレジスト6を一体的に構成したものであり
、焦電材料5をホットプレート1に当接させて配置され
ている。そして、ホットプレート1の上に載置された基
板3を、電熱ヒータ2により加熱処理することによって
、ホトレジストの硬化処理を行なっていた。また他のホ
トレジスト硬化装置として強制熱風循環・換気方式の恒
温器を用いてN2雰囲気で加熱処理する装置があり、現
在、この恒温器を用いて加熱処理する装置が、焦電材料
を含む基板上のホトレジスト硬化を行うために、多く使
用されている。
A conventional resist heat treatment method is as shown in FIG. 2, for example.
has an electric heater 2 built-in. A substrate 3, which is an object to be heat-treated, is placed on the hot plate 1. This substrate 3 has a metal film 4 of Ae or A2 alloy formed on a pyroelectric material 5, and a photoresist 6 is integrally formed on this metal film 4. It is placed in contact with the plate 1. Then, the substrate 3 placed on the hot plate 1 is heated by the electric heater 2 to harden the photoresist. In addition, there is another photoresist curing device that uses a thermostat with forced hot air circulation and ventilation to perform heat treatment in an N2 atmosphere. It is widely used to harden photoresists.

発明が解決しようとする課題 しかしながら上記のような従来の加熱処理方法では、焦
電材料の焦電効果により、焦電材料が電気的に分極され
、わずかな衝撃でも割れ、破損を生じるので、加熱、冷
却時に長時間を必要とする問題と、1枚のホットプレー
トを用いた加熱処理方法においては、焦電材料の温度が
瞬間的変化を生じるために、収縮、膨脹により割れやす
(、また、焦電効果によりホットプレートに密着するの
で搬送が難しいという問題点を有していた。本発明は上
記問題点に鑑み、焦電材料上にAeあるいはAe合金配
線を形成するためのフォトエツチング法においてAeあ
るいはAe合金膜上のホトレジストをホットプレートを
用いて加熱処理する方法を提供するものである。
Problems to be Solved by the Invention However, in the conventional heat treatment method as described above, the pyroelectric material becomes electrically polarized due to the pyroelectric effect of the pyroelectric material, causing cracking and damage even with the slightest impact. The problem is that it takes a long time to cool down, and the heat treatment method using a single hot plate causes instantaneous changes in the temperature of the pyroelectric material, making it susceptible to cracking due to contraction and expansion. There was a problem in that it was difficult to transport because it adhered to the hot plate due to the pyroelectric effect.In view of the above problems, the present invention is a photoetching method for forming Ae or Ae alloy wiring on pyroelectric material. The present invention provides a method of heat-treating a photoresist on an Ae or Ae alloy film using a hot plate.

課題を解決するための手段 上記問題点を解決するために、本発明の焦電材料の加熱
処理方法は加熱しようとする材料をホットプレートを用
いた加熱処理において、温度差をつけた数個のホットプ
レート上を移動させるものであり、さらには、ホットプ
レートと焦電材料の吸着を防ぐためにホットプレート上
に突起を設けたものである。
Means for Solving the Problems In order to solve the above-mentioned problems, the method for heat treatment of pyroelectric materials of the present invention heats the material to be heated using a hot plate. It is moved on a hot plate, and furthermore, protrusions are provided on the hot plate to prevent the hot plate from adhering to the pyroelectric material.

作   用 本発明の第1の発明の作用は上記した構成によって数個
の温度差つけたホットプレートを用いるため焦電材料の
瞬間的温度変化を小さくし、収縮、膨脹による割れをな
くすことができる。また本発明の第2の発明の作用は上
記したホットプレート上に突起を設けることにより、焦
電材料の瞬間的温度変化の軽減とホップレートとの吸着
を防止することができ焦電材料の加熱処理を容易するこ
とができる。
Function The function of the first invention of the present invention is that the above-described configuration uses several hot plates with different temperatures, thereby reducing the instantaneous temperature change of the pyroelectric material and eliminating cracks caused by contraction and expansion. . Further, the second aspect of the present invention is that by providing a protrusion on the hot plate described above, it is possible to reduce the instantaneous temperature change of the pyroelectric material and prevent adsorption with the hop rate, thereby heating the pyroelectric material. Processing can be facilitated.

実施例 以下本発明の一実施例の焦電材料の加熱処理方法につい
て図面を参照しながら説明する。
EXAMPLE Hereinafter, a heat treatment method for a pyroelectric material according to an example of the present invention will be described with reference to the drawings.

本発明の第1の実施例における焦電材料の加熱処理方法
を実施するレジスト加熱処理装置の構成は、従来例のレ
ジスト加熱処理方法装置である第2図と同様である。本
発明の第1の実施例においてはホットプレート1を5セ
ツト用いてそれぞれの温度を70℃、140e 140
℃、70仁とし、各々のホットプレート間を基板3を搬
送するための図示していない搬送機構を設けた。搬送は
基板3を各ホットプレート1(5セツト)に各々30S
EC〜60SEC保持後実施した。このようにホットプ
レートl(5セツト)に温度差を設け、一定時間保持後
搬送することにより、焦電材料(LiTaO3)の温度
の瞬間的温度変化を少なくすることができる。
The configuration of a resist heat treatment apparatus for carrying out the heat treatment method for pyroelectric materials in the first embodiment of the present invention is the same as that shown in FIG. 2, which is a conventional resist heat treatment apparatus. In the first embodiment of the present invention, five sets of hot plates 1 are used, each with a temperature of 70°C and 140°C.
℃ and 70 cm, and a transport mechanism (not shown) was provided to transport the substrate 3 between the respective hot plates. Transfer the board 3 to each hot plate 1 (5 sets) for 30 seconds each.
It was carried out after holding EC to 60 SEC. In this way, by providing a temperature difference between the hot plates 1 (5 sets) and transporting them after holding them for a certain period of time, it is possible to reduce instantaneous temperature changes in the temperature of the pyroelectric material (LiTaO3).

以下、本発明の第2の実施例について図面を参照しなが
ら説明する。第2図は、本発明の第2の実施例における
焦電材料の加熱処理方法を実施するレジスト加熱処理装
置の構成を示す図である。
A second embodiment of the present invention will be described below with reference to the drawings. FIG. 2 is a diagram showing the configuration of a resist heat treatment apparatus that implements a heat treatment method for pyroelectric material according to a second embodiment of the present invention.

本発明の第1の実施例と異なるのは、ホットプレート1
上に突起7を設けた点である。その他のホットプレート
数、ホットプレート温度は本発明の第1の実施例と同様
である。第1図に示すように基板3とホットプレート1
は突起7を介しているため面接触することがない。その
ために、基板3とホットプレート1の焦電効果による吸
着を防ぐことができる。また、突起7によ゛り基板3と
ホットプレート1の間に空間ができるので焦電材料の瞬
間的温度変化の軽減を図ることができる。
The difference from the first embodiment of the present invention is that the hot plate 1
This is because a protrusion 7 is provided on the top. The other number of hot plates and hot plate temperature are the same as in the first embodiment of the present invention. As shown in Figure 1, the substrate 3 and the hot plate 1
There is no surface contact between the protrusions 7 and the protrusions 7. Therefore, adhesion between the substrate 3 and the hot plate 1 due to the pyroelectric effect can be prevented. Furthermore, since the projections 7 create a space between the substrate 3 and the hot plate 1, it is possible to reduce instantaneous temperature changes in the pyroelectric material.

突起7は、φ7+in  厚さ0.1+asでホットプ
レート1上に4ケ所、正方形の形で設置した。
The protrusions 7 had a diameter of 7+in and a thickness of 0.1+as, and were installed at four locations on the hot plate 1 in a square shape.

発明の効果 以上のように本発明は、焦電材料の基板上に形成された
レジストの加熱処理を、温度差のつけた数個のホットプ
レートとホットプレート上に設けた数個の突起によって
焦電材料の瞬間的温度変化の軽減が図れると共に、突起
により、ホットプレートに面接触することがないために
焦電材料とホットプレートの吸着を防ぐことができる。
Effects of the Invention As described above, the present invention heats a resist formed on a pyroelectric material substrate using several hot plates with different temperatures and several protrusions provided on the hot plates. The instantaneous temperature change of the electric material can be reduced, and since the protrusions do not make surface contact with the hot plate, it is possible to prevent the pyroelectric material from adhering to the hot plate.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の一実施例に使用するレジスト加熱処理
装置の構成を示す概略図、第2図は従来のレジスト加熱
処理装置の構成を示す概略図である。 1・・・・・・ホットプレート、2・・・・・・電熱ヒ
ータ、3・・・・・・基板、4・・・・・・Aeあるい
はAe合金の金属膜、5・・・・・・焦電材料、6・・
・・・・ホトレジスト、7・・・・・・突起。 代理人の氏名 弁理人 中尾敏男 ほか1名1−−一不
・ン)、ブL−トー 7一 突厄 第2図
FIG. 1 is a schematic diagram showing the configuration of a resist heat treatment apparatus used in an embodiment of the present invention, and FIG. 2 is a schematic diagram showing the configuration of a conventional resist heat treatment apparatus. 1... Hot plate, 2... Electric heater, 3... Substrate, 4... Metal film of Ae or Ae alloy, 5...・Pyroelectric materials, 6...
...Photoresist, 7...Protrusion. Name of agent: Patent attorney Toshio Nakao and 1 other person 1--Ichifu・N), Buto L-71 Sudaku Figure 2

Claims (2)

【特許請求の範囲】[Claims] (1)焦電材料上に薄膜を形成し、その薄膜上にレジス
トパターンを形成し、これをエッチングする前に、レジ
ストを硬化させる為に加熱処理する方法において、前記
焦電材料を温度差をつけた2個以上のホットプレート上
を移動させることによって行う焦電材料の加熱処理方法
(1) A method in which a thin film is formed on a pyroelectric material, a resist pattern is formed on the thin film, and a heat treatment is performed to harden the resist before etching the pyroelectric material. A method of heating a pyroelectric material by moving it over two or more attached hot plates.
(2)ホットプレート上に突起を設けたことを特徴とす
る請求項1記載の焦電材料の加熱処理方法。
(2) The method for heat treatment of a pyroelectric material according to claim 1, characterized in that a protrusion is provided on the hot plate.
JP63153188A 1988-06-21 1988-06-21 Pyroelectric material heat treatment method Expired - Lifetime JP2797321B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP63153188A JP2797321B2 (en) 1988-06-21 1988-06-21 Pyroelectric material heat treatment method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP63153188A JP2797321B2 (en) 1988-06-21 1988-06-21 Pyroelectric material heat treatment method

Publications (2)

Publication Number Publication Date
JPH01319937A true JPH01319937A (en) 1989-12-26
JP2797321B2 JP2797321B2 (en) 1998-09-17

Family

ID=15556970

Family Applications (1)

Application Number Title Priority Date Filing Date
JP63153188A Expired - Lifetime JP2797321B2 (en) 1988-06-21 1988-06-21 Pyroelectric material heat treatment method

Country Status (1)

Country Link
JP (1) JP2797321B2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100431658B1 (en) * 2001-10-05 2004-05-17 삼성전자주식회사 Apparatus for heating a substrate and apparatus having the same

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6285911A (en) * 1985-09-24 1987-04-20 ス−パ−ウエイブ テクノロジ− インコ−ポレ−テツド Conveyor type heater for curing treatment after molding
JPS6331118A (en) * 1986-07-25 1988-02-09 Oki Electric Ind Co Ltd Baking furnace

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6285911A (en) * 1985-09-24 1987-04-20 ス−パ−ウエイブ テクノロジ− インコ−ポレ−テツド Conveyor type heater for curing treatment after molding
JPS6331118A (en) * 1986-07-25 1988-02-09 Oki Electric Ind Co Ltd Baking furnace

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100431658B1 (en) * 2001-10-05 2004-05-17 삼성전자주식회사 Apparatus for heating a substrate and apparatus having the same

Also Published As

Publication number Publication date
JP2797321B2 (en) 1998-09-17

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