JPH01299473A - 回路基板検査方法 - Google Patents
回路基板検査方法Info
- Publication number
- JPH01299473A JPH01299473A JP63129724A JP12972488A JPH01299473A JP H01299473 A JPH01299473 A JP H01299473A JP 63129724 A JP63129724 A JP 63129724A JP 12972488 A JP12972488 A JP 12972488A JP H01299473 A JPH01299473 A JP H01299473A
- Authority
- JP
- Japan
- Prior art keywords
- pin
- pins
- board
- value
- measurement
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000007689 inspection Methods 0.000 title claims abstract description 17
- 238000000034 method Methods 0.000 title claims description 9
- 238000012360 testing method Methods 0.000 claims abstract description 35
- 238000005259 measurement Methods 0.000 claims abstract description 31
- 230000004044 response Effects 0.000 claims abstract description 4
- 230000002950 deficient Effects 0.000 claims description 3
- 229910000679 solder Inorganic materials 0.000 abstract description 5
- 239000003990 capacitor Substances 0.000 description 5
- 238000010586 diagram Methods 0.000 description 5
- 238000004519 manufacturing process Methods 0.000 description 5
- 238000001514 detection method Methods 0.000 description 4
- 238000006243 chemical reaction Methods 0.000 description 3
- 238000012217 deletion Methods 0.000 description 3
- 230000037430 deletion Effects 0.000 description 3
- 230000000052 comparative effect Effects 0.000 description 1
- 238000013480 data collection Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000006870 function Effects 0.000 description 1
- 230000007274 generation of a signal involved in cell-cell signaling Effects 0.000 description 1
- 238000002847 impedance measurement Methods 0.000 description 1
- 238000010998 test method Methods 0.000 description 1
- 238000010977 unit operation Methods 0.000 description 1
Landscapes
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
- Tests Of Electronic Circuits (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP63129724A JPH01299473A (ja) | 1988-05-27 | 1988-05-27 | 回路基板検査方法 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP63129724A JPH01299473A (ja) | 1988-05-27 | 1988-05-27 | 回路基板検査方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH01299473A true JPH01299473A (ja) | 1989-12-04 |
| JPH0581864B2 JPH0581864B2 (enrdf_load_stackoverflow) | 1993-11-16 |
Family
ID=15016630
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP63129724A Granted JPH01299473A (ja) | 1988-05-27 | 1988-05-27 | 回路基板検査方法 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH01299473A (enrdf_load_stackoverflow) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN114417778A (zh) * | 2022-01-24 | 2022-04-29 | 韩熔 | 借助结点电特征求取电路网表的方法 |
-
1988
- 1988-05-27 JP JP63129724A patent/JPH01299473A/ja active Granted
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN114417778A (zh) * | 2022-01-24 | 2022-04-29 | 韩熔 | 借助结点电特征求取电路网表的方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0581864B2 (enrdf_load_stackoverflow) | 1993-11-16 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| LAPS | Cancellation because of no payment of annual fees |