JPH01152272U - - Google Patents

Info

Publication number
JPH01152272U
JPH01152272U JP5010388U JP5010388U JPH01152272U JP H01152272 U JPH01152272 U JP H01152272U JP 5010388 U JP5010388 U JP 5010388U JP 5010388 U JP5010388 U JP 5010388U JP H01152272 U JPH01152272 U JP H01152272U
Authority
JP
Japan
Prior art keywords
good
output
comparator
timing
pattern
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP5010388U
Other languages
English (en)
Japanese (ja)
Other versions
JPH073350Y2 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP5010388U priority Critical patent/JPH073350Y2/ja
Publication of JPH01152272U publication Critical patent/JPH01152272U/ja
Application granted granted Critical
Publication of JPH073350Y2 publication Critical patent/JPH073350Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP5010388U 1988-04-13 1988-04-13 Ｉｃ試験装置 Expired - Lifetime JPH073350Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP5010388U JPH073350Y2 (ja) 1988-04-13 1988-04-13 Ｉｃ試験装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5010388U JPH073350Y2 (ja) 1988-04-13 1988-04-13 Ｉｃ試験装置

Publications (2)

Publication Number Publication Date
JPH01152272U true JPH01152272U (en, 2012) 1989-10-20
JPH073350Y2 JPH073350Y2 (ja) 1995-01-30

Family

ID=31276176

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5010388U Expired - Lifetime JPH073350Y2 (ja) 1988-04-13 1988-04-13 Ｉｃ試験装置

Country Status (1)

Country Link
JP (1) JPH073350Y2 (en, 2012)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH085705A (ja) * 1994-06-16 1996-01-12 Nec Corp 論理機能試験装置

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH085705A (ja) * 1994-06-16 1996-01-12 Nec Corp 論理機能試験装置

Also Published As

Publication number Publication date
JPH073350Y2 (ja) 1995-01-30

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