JPH0211872B2 - - Google Patents

Info

Publication number
JPH0211872B2
JPH0211872B2 JP56022928A JP2292881A JPH0211872B2 JP H0211872 B2 JPH0211872 B2 JP H0211872B2 JP 56022928 A JP56022928 A JP 56022928A JP 2292881 A JP2292881 A JP 2292881A JP H0211872 B2 JPH0211872 B2 JP H0211872B2
Authority
JP
Japan
Prior art keywords
output
pattern
input
memory
switching control
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP56022928A
Other languages
English (en)
Japanese (ja)
Other versions
JPS57137867A (en
Inventor
Yoshio Oonada
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi High Tech Corp
Original Assignee
Hitachi Electronics Engineering Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Electronics Engineering Co Ltd filed Critical Hitachi Electronics Engineering Co Ltd
Priority to JP56022928A priority Critical patent/JPS57137867A/ja
Publication of JPS57137867A publication Critical patent/JPS57137867A/ja
Publication of JPH0211872B2 publication Critical patent/JPH0211872B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
JP56022928A 1981-02-20 1981-02-20 Pattern generator input and output switching control for tester Granted JPS57137867A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56022928A JPS57137867A (en) 1981-02-20 1981-02-20 Pattern generator input and output switching control for tester

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56022928A JPS57137867A (en) 1981-02-20 1981-02-20 Pattern generator input and output switching control for tester

Publications (2)

Publication Number Publication Date
JPS57137867A JPS57137867A (en) 1982-08-25
JPH0211872B2 true JPH0211872B2 (en, 2012) 1990-03-16

Family

ID=12096286

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56022928A Granted JPS57137867A (en) 1981-02-20 1981-02-20 Pattern generator input and output switching control for tester

Country Status (1)

Country Link
JP (1) JPS57137867A (en, 2012)

Also Published As

Publication number Publication date
JPS57137867A (en) 1982-08-25

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