JP7846951B2 - 原子層堆積法で堆積させた耐浸食性金属酸化物コーティング - Google Patents
原子層堆積法で堆積させた耐浸食性金属酸化物コーティングInfo
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Description
K*[m*(M1+M2+O)+n*(M2+M1+O)]
ここで、Kはゼロより大きい整数であって、目標厚さを達成するために実行されるスーパーサイクルの数を表す。K、m、nを調整することで、前駆体の化学的特性にかかわらず、所望の組成(例えば、第2金属に対する第1金属の所望の比率)のコーティングを達成し得る。
K*[a*(M1+M2+M3+O)+b*(M1+M3+M2+O)+c*(M2+M1+M3+O)+d*(M2+M3+M1+O)+e*(M3+M1+M2+O)+f*(M3+M2+M1+O)]
ここで、a、b、c、d、e、及びfは、負でない整数である。各共堆積法のM1、M2及びM3の各モル数は、実験によって決定されてもよい。同様に、4つの金属の共堆積の場合には、以下の共堆積法を混用して、目標組成のコーティングを達成してもよい。すなわち、M1+M2+M3+M4+O、M1+M3+M4+M2+O、M1+M4+M2+M3+O、M1+M3+M2+M4+O、M1+M4+M3+M2+O、M1+M2+M4+M3+O、M2+M1+M3+M4+O、M2+M3+M4+M1+O、M2+M4+M1+M3+O、M2+M1+M4+M3+O、M2+M3+M1+M4+O、M2+M4+M3+M1+O、M3+M1+M2+M4+O、M3+M2+M4+M1+O、M3+M4+M1+M2+O、M3+M1+M4+M2+O、M3+M2+M1+M4+O、M3+M4+M2+M1+O、M4+M1+M2+M3+O、M4+M2+M3+M1+O、M4+M3+M1+M2+O、M4+M1+M3+M2+O、M4+M2+M1+M3+O、M4+M3+M3+M1+Oである。したがって、以下の式を用いて、目標組成を達成してもよい。
K*[a*(M1+M2+M3+M4+O)+b*(M1+M3+M4+M2+O)+c*(M1+M4+M2+M3+O)+d*(M1+M3+M2+M4+O)+e*(M1+M4+M3+M2+O)+f*(M1+M2+M4+M3+O)+g*(M2+M1+M3+M4+O)+h*(M2+M3+M4+M1+O)+i*(M2+M4+M1+M3+O)+j*(M2+M1+M4+M3+O)+k(M2+M3+M1+M4+O)+l*(M2+M4+M3+M1+O)+m*(M3+M1+M2+M4+O)+n*(M3+M2+M4+M1+O)+o*(M3+M4+M1+M2+O)+p*(M3+M1+M4+M2+O)+q*(M3+M2+M1+M4+O)+r*(M3+M4+M2+M1+O)+s*(M4+M1+M2+M3+O)+t*(M4+M2+M3+M1+O)+u*(M4+M3+M1+M2+O)+v*(M4+M1+M3+M2+O)+w*(M4+M2+M1+M3+O)+x*(M4+M3+M3+M1+O)]
ここで、aからxは負でない整数である。
180*[2*(1s Y+1s Zr+100ms H2O)+1*(1s Zr+1s Y+100ms H2O)]
したがって、コーティングは、2回のRE-Zr共堆積サイクル(m=2)対1回のZr-RE共堆積サイクル(n=1)の比によって形成された。各サイクルでは、各Y前駆体及びZr前駆体を1秒間、律動的に送り、反応物質のH2Oを100msの間、律動的に送った。合計180(K=180)回のスーパーサイクルが実行された。ALDリアクタを300℃の温度に制御した。膜を形成するために使用されたイットリウム含有前駆体は(CH3Cp)3Yであり、ジルコニウム含有前駆体はCpトリス(ジメチルアミノ)ジルコニウムであった。得られた希土類金属含有コーティングの厚さは50nmであった。
Claims (15)
- 物品であって、
本体と、
本体の表面に希土類金属含有酸化物コーティングとを備え、
希土類金属含有酸化物コーティングは、10mol%から40mol%の第1金属と、10mol%から40mol%の第2金属とを含み、第1金属は希土類金属であり、第2金属はハフニウム、及びタンタルからなる群から選択され、
希土類金属含有酸化物コーティングは、第1金属と第2金属の均質混合物を含んでいる物品。 - 希土類金属含有酸化物コーティングは、5nmから10μmの厚さを有する、請求項1に記載の物品。
- 希土類金属含有酸化物コーティングは20mol%から85mol%の酸素を含み、
物品は、チャンバ壁、シャワーヘッド、ノズル、プラズマ生成ユニット、高周波電極、電極ハウジング、ディフューザー、ガスラインからなる群から選択される処理チャンバの構成要素であり、及び/又は、
本体は、アルミニウム、鋼、シリコン、銅及びマグネシウムからなる群から選択される材料を含んでいる、請求項1に記載の物品。 - 第1金属は、イットリウム、エルビウム、ランタン、ルテチウム、スカンジウム、ガドリニウム、サマリウム及びジスプロシウムからなる群から選択される希土類金属を含む、又は
第1金属はイットリウムを含み、希土類金属含有酸化物コーティングは、1mol%から40mol%の濃度のジルコニウムを含んでいる、又は
希土類金属含有酸化物コーティングは、YwZrxHfyOz、ErwZrxHfyOz、YvErwZrxHfyOz、YxHfyOz、ErxHfyOz、YxTayOz、ErxTayOz、YwTaxHfyOz、ErwTaxHfyOz及びYvErwTaxHfyOzからなる群から選択される組成を含んでいる、請求項1に記載の物品。 - 本体の表面にバッファ層をさらに備え、希土類金属含有酸化物コーティングはバッファ層を覆い、バッファ層は、酸化アルミニウム、酸化シリコン及び窒化アルミニウムからなる群から選択される材料を含んでいる、請求項1に記載の物品。
- 原子層堆積法を用いて、物品の表面に希土類金属含有酸化物コーティングを共堆積させる工程を含む方法であって、
希土類金属含有酸化物コーティングを共堆積させる工程は、
第1期間の間に表面を第1金属含有前駆体又は第2金属含有前駆体と接触させて、第1金属(M1)又は第2金属(M2)を含む部分的金属吸着層を形成する工程であって、第1金属含有前駆体は希土類金属前駆体であり、第2金属含有前駆体は、ハフニウム含有前駆体、及びタンタル含有前駆体からなる群から選択される工程と、
第2期間の間に部分的金属吸着層を第2金属含有前駆体又は第1金属含有前駆体と接触させて、第1金属と第2金属とを含む共吸着層を形成する工程であって、第1金属は第2金属とは異なっている工程と、
共吸着層を反応物質と接触させて、希土類金属含有酸化物コーティングを形成する工程とを含み、
希土類金属含有酸化物コーティングは、10mol%から40mol%の第1金属と、5mol%から40mol%の第2金属とを含み、
第1金属の濃度は第2金属の濃度より高く、
希土類金属含有酸化物コーティングは、第1金属と第2金属の均質混合物を含んでいる方法。 - 希土類金属含有酸化物コーティングを共堆積させる工程は、
少なくとも1回のM1-M2共堆積サイクルを実行する工程であって、
表面を第1金属含有前駆体と接触させて、部分的金属吸着層を形成する工程と、
続いて、部分的金属吸着層を第2金属含有前駆体と接触させて、M1-M2共吸着層を形成する工程と、
M1-M2共吸着層を反応物質と接触させる工程とを含む工程を含み、
少なくとも1回のM1-M2共堆積サイクルにより、第1割合の第1金属と第2割合の第2金属とを含む層が得られている、請求項6に記載の方法。 - 希土類金属含有酸化物コーティングを共堆積させる工程は、
少なくとも1回のM2-M1共堆積サイクルを実行する工程であって、
表面を第2金属含有前駆体と接触させて、第2部分的金属吸着層を形成する工程と、
続いて、第2部分的金属吸着層を第1金属含有前駆体と接触させて、M2-M1共吸着層を形成する工程と、
M2-M1共吸着層を反応物質と接触させる工程とを含む工程をさらに含み、
少なくとも1回のM2-M1共堆積サイクルにより、第3割合の第1金属と第4割合の第2金属とを含む追加層が得られ、第3割合は第1割合よりも低く、第4割合は第2割合よりも高くなっている、請求項7に記載の方法。 - M1-M2共堆積サイクルの第1回数とM2-M1共堆積サイクルの第2回数の比を選択する工程であって、選択の結果として、第1金属の第1目標mol%及び第2金属の第2目標mol%が得られる工程と、
複数の堆積スーパーサイクルを実行する工程であって、各堆積スーパーサイクルは、第1回数のM1-M2共堆積サイクルを実行する工程と、第2回数のM2-M1共堆積サイクルを実行する工程とを含んでいる工程とをさらに含む、請求項8に記載の方法。 - 少なくとも1回のM1-M2共堆積サイクルを実行する工程は、
表面を第1金属含有前駆体と50ミリ秒から60秒の間、接触させる工程と、
部分的金属吸着層を第2金属含有前駆体と50ミリ秒から60秒の間、接触させる工程と、
M1-M2共吸着層を反応物質と50ミリ秒から60秒の間、接触させる工程とを含み、
少なくとも1回のM2-M1共堆積サイクルを実行する工程は、
表面を第2金属含有前駆体と50ミリ秒から60秒の間、接触させる工程と、
追加の部分的金属吸着層を第1金属含有前駆体と50ミリ秒から60秒の間、接触させる工程と、
M2-M1共吸着層を反応物質と50ミリ秒から60秒の間、接触させる工程とを含んでいる、請求項8に記載の方法。 - 第1金属含有前駆体及び第2金属含有前駆体は独立に、シクロペンタジエニル系前駆体、トリス(メチルシクロペンタジエニル)イットリウム((CH3Cp)3Y)、トリス(ブチルシクロペンタジエニル)イットリウム、トリス(シクロペンタジエニル)イットリウム、トリス(エチルシクロペンタジエニル)イットリウム、トリス-メチルシクロペンタジエニルエルビウム(III)(Er(MeCp)3)、トリス(ブチルシクロペンタジエニル)エルビウム(III)、アミジナート系前駆体、トリス(N,N‘-ジイソプロピルホルムアミジナート)イットリウム、トリス(2,2,6,6-テトラメチル-ヘプタン-3,5-ジオナート)イットリウム、トリス(ビス(トリメチルシリル)アミド)ランタン)、アミド系前駆体、エルビウムボランアミド(Er(BA)3)、β-ジケトナート系前駆体、エルビウム(III)、トリス(2,2,6,6-テトラメチル-3,5-ヘプタンジオナート)、トリス(ジメチルアミノ)(シクロペンタジエニル)ジルコニウム、テトラキス(ジメチルアミド)ジルコニウム、テトラキス(ジエチルアミド)ジルコニウム、テトラキス(N,N‘-ジメチルホルムアミジナート)ジルコニウム、テトラ(エチルメチルアミド)ハフニウム、及びペンタキス(ジメチルアミド)タンタルからなる群から選択される、請求項6に記載の方法。
- 共吸着層を第3前駆体と接触させて、第3金属を吸着した後に、共吸着層を反応物質と接触させる工程であって、第3前駆体は、イットリウム前駆体、エルビウム前駆体、ジルコニウム前駆体、ハフニウム前駆体、シリコン前駆体、タンタル前駆体、ランタン前駆体、ルテチウム前駆体、スカンジウム前駆体、ガドリニウム前駆体、サマリウム前駆体、ジスプロシウム前駆体からなる群から選択されている工程をさらに含む、請求項6に記載の方法。
- 物品の表面に原子層堆積法によってバッファ層を堆積する工程と、希土類金属含有コーティングをバッファ層上に共堆積する工程とをさらに含み、バッファ層は、酸化アルミニウム、酸化シリコン、又は窒化アルミニウムのうちの少なくとも1つを含んでいる、請求項6に記載の方法。
- 原子層堆積法を用いて、物品の表面に希土類金属含有酸化物コーティングを共堆積させる工程を含む方法であって、
希土類金属含有酸化物コーティングを共堆積させる工程は、
少なくとも1回の共注入サイクルを実行する工程であって、
第1期間の間に表面を、第1前駆体及び第2前駆体の混合物と接触させて、共吸着層を形成する工程であって、第1前駆体は希土類金属前駆体であり、第2前駆体は、ハフニウム含有前駆体、及びタンタル含有前駆体からなる群から選択されている工程と、
共吸着層を酸素含有反応物質と接触させて、希土類金属含有酸化物コーティングを形成する工程とを含む工程を含み、
希土類金属含有酸化物コーティングは、10mol%から40mol%の第1金属と、10mol%から40mol%の第2金属とを含み、第1金属は希土類金属であり、第2金属はハフニウム、及びタンタルからなる群から選択され、
希土類金属含有酸化物コーティングは、第1金属と第2金属の均質混合物を含んでいる方法。 - 原子層堆積法を用いて、物品の表面に希土類金属含有酸化物コーティングを堆積させる工程を含む方法であって、
希土類金属含有酸化物コーティングを堆積する工程は、
第1期間の間に表面を第1前駆体と接触させて、第1金属吸着層を形成する工程と、
第1金属吸着層を反応物質と接触させて、第1金属酸化物層を形成する工程と、
第2期間の間に第1金属層を第2前駆体と接触させて、第2金属吸着層を形成する工程と、
第2金属吸着層を反応物質と接触させて、第2金属酸化物層を形成する工程と、
第1金属酸化物層及び第2金属酸化物層から希土類金属含有酸化物コーティングを形成する工程とを含み、
希土類金属含有酸化物コーティングは、10mol%から40mol%の第1金属と、10mol%から40mol%の第2金属とを含み、第1金属は希土類金属であり、第2金属は、ハフニウム及びタンタルからなる群から選択される方法。
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Also Published As
| Publication number | Publication date |
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| US11667575B2 (en) | 2023-06-06 |
| CN110735129A (zh) | 2020-01-31 |
| KR20200010114A (ko) | 2020-01-30 |
| JP2024113062A (ja) | 2024-08-21 |
| JP2020012198A (ja) | 2020-01-23 |
| JP3224064U (ja) | 2019-11-21 |
| US20200024194A1 (en) | 2020-01-23 |
| TWI875703B (zh) | 2025-03-11 |
| TWM598234U (zh) | 2020-07-11 |
| CN213295503U (zh) | 2021-05-28 |
| KR102811633B1 (ko) | 2025-05-21 |
| KR20200000245U (ko) | 2020-01-30 |
| TW202012168A (zh) | 2020-04-01 |
| US20230286867A1 (en) | 2023-09-14 |
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