JP7845151B2 - 設備状態監視システム - Google Patents

設備状態監視システム

Info

Publication number
JP7845151B2
JP7845151B2 JP2022184237A JP2022184237A JP7845151B2 JP 7845151 B2 JP7845151 B2 JP 7845151B2 JP 2022184237 A JP2022184237 A JP 2022184237A JP 2022184237 A JP2022184237 A JP 2022184237A JP 7845151 B2 JP7845151 B2 JP 7845151B2
Authority
JP
Japan
Prior art keywords
equipment
unit
signal
threshold range
monitoring system
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
JP2022184237A
Other languages
English (en)
Japanese (ja)
Other versions
JP2024073168A (ja
JP2024073168A5 (enExample
Inventor
和明 馬渡
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Denso Corp
Original Assignee
Denso Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Denso Corp filed Critical Denso Corp
Priority to JP2022184237A priority Critical patent/JP7845151B2/ja
Priority to TW112138664A priority patent/TWI871042B/zh
Priority to PCT/JP2023/041090 priority patent/WO2024106465A1/ja
Priority to CN202380079379.7A priority patent/CN120303539A/zh
Priority to EP23891612.6A priority patent/EP4621366A4/en
Publication of JP2024073168A publication Critical patent/JP2024073168A/ja
Publication of JP2024073168A5 publication Critical patent/JP2024073168A5/ja
Priority to US19/209,341 priority patent/US20250269482A1/en
Application granted granted Critical
Publication of JP7845151B2 publication Critical patent/JP7845151B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01H—MEASUREMENT OF MECHANICAL VIBRATIONS OR ULTRASONIC, SONIC OR INFRASONIC WAVES
    • G01H11/00—Measuring mechanical vibrations or ultrasonic, sonic or infrasonic waves by detecting changes in electric or magnetic properties
    • G01H11/06—Measuring mechanical vibrations or ultrasonic, sonic or infrasonic waves by detecting changes in electric or magnetic properties by electric means
    • G01H11/08—Measuring mechanical vibrations or ultrasonic, sonic or infrasonic waves by detecting changes in electric or magnetic properties by electric means using piezoelectric devices
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B19/00—Program-control systems
    • G05B19/02—Program-control systems electric
    • G05B19/04—Program control other than numerical control, i.e. in sequence controllers or logic controllers
    • G05B19/042—Program control other than numerical control, i.e. in sequence controllers or logic controllers using digital processors
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00—Testing or monitoring of control systems or parts thereof
    • G05B23/02—Electric testing or monitoring
    • G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0218—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults
    • G05B23/0224—Process history based detection method, e.g. whereby history implies the availability of large amounts of data
    • G05B23/0227—Qualitative history assessment, whereby the type of data acted upon, e.g. waveforms, images or patterns, is not relevant, e.g. rule based assessment; if-then decisions
    • G05B23/0235—Qualitative history assessment, whereby the type of data acted upon, e.g. waveforms, images or patterns, is not relevant, e.g. rule based assessment; if-then decisions based on a comparison with predetermined threshold or range, e.g. "classical methods", carried out during normal operation; threshold adaptation or choice; when or how to compare with the threshold
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00—Testing or monitoring of control systems or parts thereof
    • G05B23/02—Electric testing or monitoring
    • G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0218—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults
    • G05B23/0256—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults injecting test signals and analyzing monitored process response, e.g. injecting the test signal while interrupting the normal operation of the monitored system; superimposing the test signal onto a control signal during normal operation of the monitored system
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N30/00—Piezoelectric or electrostrictive devices
    • H10N30/01—Manufacture or treatment
    • H10N30/06—Forming electrodes or interconnections, e.g. leads or terminals
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N30/00—Piezoelectric or electrostrictive devices
    • H10N30/30—Piezoelectric or electrostrictive devices with mechanical input and electrical output, e.g. functioning as generators or sensors
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N30/00—Piezoelectric or electrostrictive devices
    • H10N30/30—Piezoelectric or electrostrictive devices with mechanical input and electrical output, e.g. functioning as generators or sensors
    • H10N30/302—Sensors
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N30/00—Piezoelectric or electrostrictive devices
    • H10N30/80—Constructional details
    • H10N30/87—Electrodes or interconnections, e.g. leads or terminals
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B2219/00—Program-control systems
    • G05B2219/20—Pc systems
    • G05B2219/25—Pc structure of the system
    • G05B2219/25428—Field device

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Automation & Control Theory (AREA)
  • Manufacturing & Machinery (AREA)
  • Measurement Of Mechanical Vibrations Or Ultrasonic Waves (AREA)
  • Testing Of Devices, Machine Parts, Or Other Structures Thereof (AREA)
  • Mechanical Engineering (AREA)
  • Testing Or Calibration Of Command Recording Devices (AREA)
JP2022184237A 2022-11-17 2022-11-17 設備状態監視システム Active JP7845151B2 (ja)

Priority Applications (6)

Application Number Priority Date Filing Date Title
JP2022184237A JP7845151B2 (ja) 2022-11-17 2022-11-17 設備状態監視システム
TW112138664A TWI871042B (zh) 2022-11-17 2023-10-11 設備狀態監視系統
CN202380079379.7A CN120303539A (zh) 2022-11-17 2023-11-15 设备状态监视系统
EP23891612.6A EP4621366A4 (en) 2022-11-17 2023-11-15 EQUIPMENT CONDITION MONITORING SYSTEM
PCT/JP2023/041090 WO2024106465A1 (ja) 2022-11-17 2023-11-15 設備状態監視システム
US19/209,341 US20250269482A1 (en) 2022-11-17 2025-05-15 Equipment state monitoring system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2022184237A JP7845151B2 (ja) 2022-11-17 2022-11-17 設備状態監視システム

Publications (3)

Publication Number Publication Date
JP2024073168A JP2024073168A (ja) 2024-05-29
JP2024073168A5 JP2024073168A5 (enExample) 2024-11-13
JP7845151B2 true JP7845151B2 (ja) 2026-04-14

Family

ID=91084506

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2022184237A Active JP7845151B2 (ja) 2022-11-17 2022-11-17 設備状態監視システム

Country Status (6)

Country Link
US (1) US20250269482A1 (enExample)
EP (1) EP4621366A4 (enExample)
JP (1) JP7845151B2 (enExample)
CN (1) CN120303539A (enExample)
TW (1) TWI871042B (enExample)
WO (1) WO2024106465A1 (enExample)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2026081788A (ja) * 2024-11-05 2026-05-19 国立大学法人東北大学 電界センサ

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005172685A (ja) 2003-12-12 2005-06-30 Nsk Ltd 機械設備の監視システム
JP2009236596A (ja) 2008-03-26 2009-10-15 Jfe Steel Corp 振動センサ及び振動センサの状態判別方法
JP4366781B2 (ja) 1999-09-30 2009-11-18 株式会社デンソー 車両用空調装置
JP5832814B2 (ja) 2011-08-11 2015-12-16 株式会社エヌ・ティ・ティ・データ 異常検出装置、異常検出方法、異常検出プログラム
JP6081867B2 (ja) 2013-06-07 2017-02-15 能美防災株式会社 構造物劣化診断システム

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59128414A (ja) * 1983-01-14 1984-07-24 Sumitomo Heavy Ind Ltd 舶用機器センサの故障診断装置
US6510397B1 (en) * 1999-03-13 2003-01-21 Textron Systems Corporation Method and apparatus for self-diagnosis of a sensor
EP2037251A4 (en) * 2006-07-04 2012-10-24 Ngk Insulators Ltd PIEZOELECTRIC / ELECTROSTRICTIVE FILM-TYPE SENSOR
GB0813014D0 (en) * 2008-07-16 2008-08-20 Groveley Detection Ltd Detector and methods of detecting
JP2011038673A (ja) * 2009-08-07 2011-02-24 Shimizu Corp 脱臭空調システム
JP5489968B2 (ja) * 2010-12-09 2014-05-14 日本発條株式会社 圧電素子のクラック検出方法及びその装置
GB2515718B (en) * 2013-02-14 2015-09-09 Roger Thomas Hurrey Piezoelectric Sensor Compression Assembly, Self-Test and Background Sensitivity
JP6031577B2 (ja) * 2015-10-28 2016-11-24 株式会社エヌ・ティ・ティ・データ 異常検出装置、異常検出方法、異常検出プログラム
JP6587941B2 (ja) * 2016-01-14 2019-10-09 株式会社デンソーテン 入力装置、表示装置、および、入力装置の振動状態検出方法
CN107491374B (zh) * 2017-08-11 2020-06-05 安徽容知日新科技股份有限公司 一种设备停机状态的判断方法及计算设备
JP2021012129A (ja) * 2019-07-08 2021-02-04 三菱重工業株式会社 軸振動監視システム、回転機械
CN114746360B (zh) 2019-12-25 2026-07-21 株式会社电装 压电元件、压电装置以及压电元件的制造方法
CN111522804A (zh) * 2020-04-15 2020-08-11 国网江苏省电力有限公司 一种变压器设备状态监测异常数据清洗方法

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4366781B2 (ja) 1999-09-30 2009-11-18 株式会社デンソー 車両用空調装置
JP2005172685A (ja) 2003-12-12 2005-06-30 Nsk Ltd 機械設備の監視システム
JP2009236596A (ja) 2008-03-26 2009-10-15 Jfe Steel Corp 振動センサ及び振動センサの状態判別方法
JP5832814B2 (ja) 2011-08-11 2015-12-16 株式会社エヌ・ティ・ティ・データ 異常検出装置、異常検出方法、異常検出プログラム
JP6081867B2 (ja) 2013-06-07 2017-02-15 能美防災株式会社 構造物劣化診断システム

Also Published As

Publication number Publication date
TW202434867A (zh) 2024-09-01
CN120303539A (zh) 2025-07-11
US20250269482A1 (en) 2025-08-28
WO2024106465A1 (ja) 2024-05-23
EP4621366A1 (en) 2025-09-24
JP2024073168A (ja) 2024-05-29
TWI871042B (zh) 2025-01-21
EP4621366A4 (en) 2026-04-01

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