JP7766810B2 - 磁気センサ - Google Patents

磁気センサ

Info

Publication number
JP7766810B2
JP7766810B2 JP2024540249A JP2024540249A JP7766810B2 JP 7766810 B2 JP7766810 B2 JP 7766810B2 JP 2024540249 A JP2024540249 A JP 2024540249A JP 2024540249 A JP2024540249 A JP 2024540249A JP 7766810 B2 JP7766810 B2 JP 7766810B2
Authority
JP
Japan
Prior art keywords
magnetic
wiring
permeable portion
magnetic field
magnetoresistive element
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
JP2024540249A
Other languages
English (en)
Japanese (ja)
Other versions
JPWO2024034168A1 (https=
Inventor
冠汰 菊地
英治 梅津
俊宏 小林
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Alps Alpine Co Ltd
Original Assignee
Alps Electric Co Ltd
Alps Alpine Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Alps Electric Co Ltd, Alps Alpine Co Ltd filed Critical Alps Electric Co Ltd
Publication of JPWO2024034168A1 publication Critical patent/JPWO2024034168A1/ja
Application granted granted Critical
Publication of JP7766810B2 publication Critical patent/JP7766810B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/0011—Arrangements or instruments for measuring magnetic variables comprising means, e.g. flux concentrators, flux guides, for guiding or concentrating the magnetic flux, e.g. to the magnetic sensor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
    • G01R33/06—Measuring direction or magnitude of magnetic fields or magnetic flux using galvano-magnetic devices
    • G01R33/09—Magnetoresistive devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
    • G01R33/06—Measuring direction or magnitude of magnetic fields or magnetic flux using galvano-magnetic devices
    • G01R33/09—Magnetoresistive devices
    • G01R33/093—Magnetoresistive devices using multilayer structures, e.g. giant magnetoresistance sensors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
    • G01R33/06—Measuring direction or magnitude of magnetic fields or magnetic flux using galvano-magnetic devices
    • G01R33/09—Magnetoresistive devices
    • G01R33/098—Magnetoresistive devices comprising tunnel junctions, e.g. tunnel magnetoresistance sensors
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N50/00—Galvanomagnetic devices
    • H10N50/10—Magnetoresistive devices

Landscapes

  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Hall/Mr Elements (AREA)
  • Measuring Magnetic Variables (AREA)
JP2024540249A 2022-08-12 2023-03-03 磁気センサ Active JP7766810B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2022128866 2022-08-12
JP2022128866 2022-08-12
PCT/JP2023/008061 WO2024034168A1 (ja) 2022-08-12 2023-03-03 磁気センサ

Publications (2)

Publication Number Publication Date
JPWO2024034168A1 JPWO2024034168A1 (https=) 2024-02-15
JP7766810B2 true JP7766810B2 (ja) 2025-11-10

Family

ID=89851443

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2024540249A Active JP7766810B2 (ja) 2022-08-12 2023-03-03 磁気センサ

Country Status (5)

Country Link
US (1) US20250172640A1 (https=)
JP (1) JP7766810B2 (https=)
CN (1) CN119404110A (https=)
DE (1) DE112023003456T5 (https=)
WO (1) WO2024034168A1 (https=)

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002250759A (ja) 2001-02-26 2002-09-06 Systec:Kk 磁気センサのバイアス構造
US20110215800A1 (en) 2010-03-05 2011-09-08 Headway Technologies, Inc. MR sensor with flux guide enhanced hard bias structure
JP2012132889A (ja) 2010-12-21 2012-07-12 Kohshin Electric Corp 磁気検出装置および電流検出装置
JP2015179042A (ja) 2014-03-19 2015-10-08 株式会社デンソー 電流センサ
JP2016223825A (ja) 2015-05-28 2016-12-28 アルプス電気株式会社 磁界検出装置

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5244374U (https=) * 1975-09-25 1977-03-29
JPH08233865A (ja) * 1995-02-28 1996-09-13 Victor Co Of Japan Ltd 電流検知ユニット
JP4573736B2 (ja) * 2005-08-31 2010-11-04 三菱電機株式会社 磁界検出装置
JP2008020402A (ja) * 2006-07-14 2008-01-31 Asahi Kasei Electronics Co Ltd 電流検出機構

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002250759A (ja) 2001-02-26 2002-09-06 Systec:Kk 磁気センサのバイアス構造
US20110215800A1 (en) 2010-03-05 2011-09-08 Headway Technologies, Inc. MR sensor with flux guide enhanced hard bias structure
JP2012132889A (ja) 2010-12-21 2012-07-12 Kohshin Electric Corp 磁気検出装置および電流検出装置
JP2015179042A (ja) 2014-03-19 2015-10-08 株式会社デンソー 電流センサ
JP2016223825A (ja) 2015-05-28 2016-12-28 アルプス電気株式会社 磁界検出装置

Also Published As

Publication number Publication date
CN119404110A (zh) 2025-02-07
WO2024034168A1 (ja) 2024-02-15
US20250172640A1 (en) 2025-05-29
JPWO2024034168A1 (https=) 2024-02-15
DE112023003456T5 (de) 2025-05-28

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