JP7752690B2 - 自動分析システム - Google Patents

自動分析システム

Info

Publication number
JP7752690B2
JP7752690B2 JP2023548428A JP2023548428A JP7752690B2 JP 7752690 B2 JP7752690 B2 JP 7752690B2 JP 2023548428 A JP2023548428 A JP 2023548428A JP 2023548428 A JP2023548428 A JP 2023548428A JP 7752690 B2 JP7752690 B2 JP 7752690B2
Authority
JP
Japan
Prior art keywords
unit
analysis system
automatic
sample
automated
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
JP2023548428A
Other languages
English (en)
Japanese (ja)
Other versions
JPWO2023042721A5 (https=
JPWO2023042721A1 (https=
Inventor
美和 竹内
健太 今井
遊人 板垣
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi High Tech Corp
Original Assignee
Hitachi High Tech Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi High Tech Corp filed Critical Hitachi High Tech Corp
Publication of JPWO2023042721A1 publication Critical patent/JPWO2023042721A1/ja
Publication of JPWO2023042721A5 publication Critical patent/JPWO2023042721A5/ja
Application granted granted Critical
Publication of JP7752690B2 publication Critical patent/JP7752690B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584—Control arrangements for automatic analysers
    • G01N35/00594—Quality control, including calibration or testing of components of the analyser
    • G01N35/00613—Quality control
    • G01N35/00623—Quality control of instruments
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584—Control arrangements for automatic analysers
    • G01N35/00594—Quality control, including calibration or testing of components of the analyser
    • G01N35/00613—Quality control
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584—Control arrangements for automatic analysers
    • G01N35/00594—Quality control, including calibration or testing of components of the analyser
    • G01N35/00693—Calibration
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/0099—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor comprising robots or similar manipulators
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N2035/00178—Special arrangements of analysers
    • G01N2035/00326—Analysers with modular structure
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584—Control arrangements for automatic analysers
    • G01N35/00722—Communications; Identification
    • G01N2035/00891—Displaying information to the operator
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/02—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
    • G01N35/04—Details of the conveyor system
    • G01N2035/046—General conveyor features
    • G01N2035/0465—Loading or unloading the conveyor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/02—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
    • G01N35/04—Details of the conveyor system
    • G01N2035/0474—Details of actuating means for conveyors or pipettes
    • G01N2035/0489—Self-propelled units
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584—Control arrangements for automatic analysers
    • G01N35/00722—Communications; Identification

Landscapes

  • Engineering & Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Analytical Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Robotics (AREA)
  • Automatic Analysis And Handling Materials Therefor (AREA)
JP2023548428A 2021-09-15 2022-09-07 自動分析システム Active JP7752690B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2021150085 2021-09-15
JP2021150085 2021-09-15
PCT/JP2022/033515 WO2023042721A1 (ja) 2021-09-15 2022-09-07 自動分析装置および自動分析システム

Publications (3)

Publication Number Publication Date
JPWO2023042721A1 JPWO2023042721A1 (https=) 2023-03-23
JPWO2023042721A5 JPWO2023042721A5 (https=) 2024-06-28
JP7752690B2 true JP7752690B2 (ja) 2025-10-10

Family

ID=85602187

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2023548428A Active JP7752690B2 (ja) 2021-09-15 2022-09-07 自動分析システム

Country Status (5)

Country Link
US (1) US20240345109A1 (https=)
EP (1) EP4403919A4 (https=)
JP (1) JP7752690B2 (https=)
CN (1) CN117795345A (https=)
WO (1) WO2023042721A1 (https=)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7068463B2 (ja) * 2018-07-27 2022-05-16 株式会社日立ハイテク 自動分析システム

Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005300357A (ja) 2004-04-12 2005-10-27 Ids:Kk 自走車を使用した検体搬送システム
JP2008076267A (ja) 2006-09-22 2008-04-03 Sysmex Corp 精度管理システム、分析装置および精度管理方法
JP2009008558A (ja) 2007-06-28 2009-01-15 A & T Corp 分注装置、検体検査システム、分注方法、検体検査方法、分注プログラム、検体検査プログラム
JP2013185975A (ja) 2012-03-08 2013-09-19 Hitachi High-Technologies Corp 自動分析装置
JP2015135282A (ja) 2014-01-17 2015-07-27 株式会社日立ハイテクノロジーズ 自動分析装置
JP2019521359A (ja) 2016-07-21 2019-07-25 シーメンス・ヘルスケア・ダイアグノスティックス・インコーポレーテッドＳｉｅｍｅｎｓ Ｈｅａｌｔｈｃａｒｅ Ｄｉａｇｎｏｓｔｉｃｓ Ｉｎｃ． 自動臨床分析器システム及び方法
WO2020021837A1 (ja) 2018-07-27 2020-01-30 株式会社日立ハイテクノロジーズ 自動分析システム
WO2021153028A1 (ja) 2020-01-30 2021-08-05 株式会社日立ハイテク 自動分析システム

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02163660A (ja) * 1988-12-19 1990-06-22 Olympus Optical Co Ltd 自動分析装置
DE60226385D1 (de) * 2001-09-12 2008-06-19 Olympus Co Automatische Analysevorrichtung
JP5912320B2 (ja) 2011-07-20 2016-04-27 株式会社日立ハイテクノロジーズ 自動分析装置

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005300357A (ja) 2004-04-12 2005-10-27 Ids:Kk 自走車を使用した検体搬送システム
JP2008076267A (ja) 2006-09-22 2008-04-03 Sysmex Corp 精度管理システム、分析装置および精度管理方法
JP2009008558A (ja) 2007-06-28 2009-01-15 A & T Corp 分注装置、検体検査システム、分注方法、検体検査方法、分注プログラム、検体検査プログラム
JP2013185975A (ja) 2012-03-08 2013-09-19 Hitachi High-Technologies Corp 自動分析装置
JP2015135282A (ja) 2014-01-17 2015-07-27 株式会社日立ハイテクノロジーズ 自動分析装置
JP2019521359A (ja) 2016-07-21 2019-07-25 シーメンス・ヘルスケア・ダイアグノスティックス・インコーポレーテッドＳｉｅｍｅｎｓ Ｈｅａｌｔｈｃａｒｅ Ｄｉａｇｎｏｓｔｉｃｓ Ｉｎｃ． 自動臨床分析器システム及び方法
WO2020021837A1 (ja) 2018-07-27 2020-01-30 株式会社日立ハイテクノロジーズ 自動分析システム
WO2021153028A1 (ja) 2020-01-30 2021-08-05 株式会社日立ハイテク 自動分析システム

Also Published As

Publication number Publication date
EP4403919A4 (en) 2025-09-03
US20240345109A1 (en) 2024-10-17
WO2023042721A1 (ja) 2023-03-23
CN117795345A (zh) 2024-03-29
JPWO2023042721A1 (https=) 2023-03-23
EP4403919A1 (en) 2024-07-24

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